ICS9DB823B
EIGHT OUTPUT DIFFERENTIAL BUFFER FOR PCIE GEN1, GEN2 AND QPI
IDT®
EIGHT OUTPUT DIFFERENTIAL BUFFER FOR PCIE GEN1, GEN2 AND QPI 7
ICS9DB823B REV F 091812
Absolute Maximum Ratings
Stresses above the ratings listed below can cause permanent damage to the ICS9DB823B. These ratings, which are
standard values for IDT commercially rated parts, are stress ratings only. Functional operation of the device at these or any
other conditions above those indicated in the operational sections of the specifications is not implied. Exposure to absolute
maximum rating conditions for extended periods can affect product reliability. Electrical parameters are guaranteed only over
the recommended operating temperature range.
Electrical Characteristics–Clock Input Parameters
Symbol Parameter Min Max Units
VDDA/R 3.3V Core Supply Voltage 4.6 V
VDD 3.3V Logic Supply Voltage 4.6 V
V
IL
Input Low Voltage GND-0.5 V
V
IH
D
+0.5V V
Ts Storage Temperature -65 150
°
C
Tambient Ambient Operating Temp 0 70 °C
Tcase Case Temperature 115 °C
ESD prot
Input ESD protection
human body model 2000 V
T
A
= 0 - 70°C; Supply Voltage V
DD
= 3.3 V +/-5%
PARAMETER SYMBOL CONDITIONS MIN TYP MAX UNITS NOTES
Input High Voltage - DIF_IN V
IHDIF
Differential inputs
(sin
le-ended measurement)
600 800 1150 mV 1
Input Low Voltage - DIF_IN V
ILDIF
Differential inputs
(single-ended measurement)
V
SS
- 300 0 300 mV 1
Input Common Mode Voltage
DIF_IN
V
COM
Common Mode Input Voltage 300 1000 mV 1
Input Amplitude - DIF_IN V
SWING
Peak to Peak value 300 1450 mV 1
Input Slew Rate - DIF_IN dv/dt Measured differentially 0.4 8 V/ns 1,2
IN
IN
DD ,
IN
= GND -5 5 uA 1
Input Duty Cycle d
tin
Measurement from differential wavefrom 45 55 % 1
Input Jitter - Cycle to Cycle J
DI FI n
Differential Measurement 0 125 ps 1
1
Guaranteed by design and characterization, not 100% tested in production.
2
Slew rate measured throu
h Vswin
min centered around differential zero