AD7303
–3–
REV. 0
TIMING CHARACTERISTICS
1, 2
Parameter Limit at T
MIN
, T
MAX
(B Version) Units Conditions/Comments
t
1
33 ns min SCLK Cycle Time
t
2
13 ns min SCLK High Time
t
3
13 ns min SCLK Low Time
t
4
5 ns min SYNC Setup Time
t
5
5 ns min Data Setup Time
t
6
4.5 ns min Data Hold Time
t
7
4.5 ns min SYNC Hold Time
t
8
33 ns min Minimum SYNC High Time
NOTES
1
Sample tested at +25°C to ensure compliance. All input signals are specified with tr = tf = 5 ns (10% to 90% of V
DD
) and timed from a voltage level of (V
IL
+ V
IH
)/2,
tr and tf should not exceed 1 µs on any input.
2
See Figures 1 and 2.
SCLK (I)
SYNC (I)
DIN (I)
DB15
DB0
t
5
t
6
t
2
t
3
t
4
t
7
t
4
t
8
t
1
Figure 1. Timing Diagram for Continuous 16-Bit Write
SCLK (I)
SYNC (I)
DIN (I)
DB15 DB8
t
5
t
6
t
2
t
3
t
4
t
7
DB7 DB0
t
5
t
6
t
8
t
1
Figure 2. Timing Diagram for 2
×
8-Bit Writes
(V
DD
= +2.7 V to +5.5 V; GND = 0 V; Reference = Internal V
DD
/2 Reference; all specifications
T
MIN
to T
MAX
unless otherwise noted)
AD7303
–4–
REV. 0
ABSOLUTE MAXIMUM RATINGS*
(T
A
= +25°C unless otherwise noted)
V
DD
to GND . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
Reference Input Voltage to GND . . . . –0.3 V to V
DD
+ 0.3 V
Digital Input Voltage to GND . . . . . . . –0.3 V to V
DD
+ 0.3 V
V
OUT
A, V
OUT
B to GND . . . . . . . . . . . –0.3 V to V
DD
+ 0.3 V
Operating Temperature Range
Commercial (B Version) . . . . . . . . . . . . . 40°C to +105°C
Storage Temperature Range . . . . . . . . . . . . –65°C to +150°C
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . +150°C
Plastic DIP Package, Power Dissipation . . . . . . . . . . 800 mW
θ
JA
Thermal Impedance . . . . . . . . . . . . . . . . . . . . . 117°C/W
Lead Temperature (Soldering, 10 sec) . . . . . . . . . . . +260°C
WARNING!
ESD SENSITIVE DEVICE
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the AD7303 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
PIN CONFIGURATIONS
(DIP, SOIC and microSOIC)
1
2
3
4
8
7
6
5
TOP VIEW
(Not to Scale)
AD7303
V
OUT
A
SCLK
DIN
SYNC
V
OUT
B
V
DD
GND
REF
PIN FUNCTION DESCRIPTIONS
Pin
No. Mnemonic Function
1V
OUT
A Analog Output Voltage from DAC A. The output amplifier swings rail to rail on its output.
2V
DD
Power Supply Input. These parts can be operated from +2.7 V to +5.5 V and should be decoupled to GND.
3 GND Ground reference point for all circuitry on the part.
4 REF External Reference Input. This can be used as the reference for both DACs, and is selected by setting the
INT/EXT bit in the control register to a logic one. The range on this reference input is 1 V to V
DD
/2. When
the internal reference is selected, this voltage will appear as an output for decoupling purposes at the REF Pin.
When using the internal reference, external voltages should not be connected to the REF Pin, see Figure 21.
5 SCLK Serial Clock. Logic Input. Data is clocked into the input shift register on the rising edge of the serial clock
input. Data can be transferred at rates up to 30 MHz.
6 DIN Serial Data Input. This device has a 16-bit shift register, 8 bits for data and 8 bits for control. Data is clocked
into the register on the rising edge of the clock input.
7
SYNC Level Triggered Control Input (active low). This is the frame synchronization signal for the input data. When
SYNC goes low, it enables the input shift register and data is transferred in on the rising edges of the following
clocks. The rising edge of the
SYNC causes the relevant registers to be updated.
8V
OUT
B Analog output voltage from DAC B. The output amplifier swings rail to rail on its output.
SOIC Package, Power Dissipation . . . . . . . . . . . . . . . 450 mW
θ
JA
Thermal Impedance . . . . . . . . . . . . . . . . . . . . . 157°C/W
Lead Temperature, Soldering
Vapor Phase (60 sec) . . . . . . . . . . . . . . . . . . . . . . +215°C
Infrared (15 sec) . . . . . . . . . . . . . . . . . . . . . . . . . . +220°C
MicroSOIC Package, Power Dissipation . . . . . . . . . . 450 mW
θ
JA
Thermal Impedance . . . . . . . . . . . . . . . . . . . . . 206°C/W
Lead Temperature, Soldering
Vapor Phase (60 sec) . . . . . . . . . . . . . . . . . . . . . . +215°C
Infrared (15 sec) . . . . . . . . . . . . . . . . . . . . . . . . . . +220°C
*Stresses above those listed under “Absolute Maximum Ratings” may cause
permanent damage to the device. This is a stress rating only; functional operation
of the device at these or any other conditions above those listed in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
AD7303
–5–
REV. 0
TERMINOLOGY
INTEGRAL NONLINEARITY
For the DACs, relative accuracy or endpoint nonlinearity is a
measure of the maximum deviation, in LSBs, from a straight
line passing through the endpoints of the DAC transfer func-
tion. A graphical representation of the transfer curve is shown
in Figure 15.
DIFFERENTIAL NONLINEARITY
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change of any two adjacent codes. A
specified differential nonlinearity of ±1 LSB maximum ensures
monotonicity.
ZERO CODE ERROR
Zero code error is the measured output voltage from V
OUT
of
either DAC when zero code (all zeros) is loaded to the DAC
latch. It is due to a combination of the offset errors in the DAC
and output amplifier. Zero-scale error is expressed in LSBs.
GAIN ERROR
This is a measure of the span error of the DAC. It is the devia-
tion in slope of the DAC transfer characteristic from ideal
expressed as a percent of the full-scale value. Gain error is calcu-
lated between Codes 15 and 245.
FULL-SCALE ERROR
Full-Scale Error is a measure of the output error when the DAC
latch is loaded with FF Hex. Full-scale error includes the offset
error.
DIGITAL-TO-ANALOG GLITCH IMPULSE
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the digital inputs change state with the
DAC selected and the software LDAC used to update the DAC.
It is normally specified as the area of the glitch in nV-s and is
measured when the digital input code is changed by 1 LSB at
the major carry transition.
DIGITAL FEEDTHROUGH
Digital feedthrough is a measure of the impulse injected into the
analog output of a DAC from the digital inputs of the same
DAC, but is measured when the DAC is not updated. It is
specified in nV-s and measured with a full-scale code change on
the data bus, i.e., from all 0s to all 1s and vice versa.
DIGITAL CROSSTALK
Digital crosstalk is the glitch impulse transferred to the output
of one converter due to a digital code change to another DAC.
It is specified in nV-s.
ANALOG CROSSTALK
Analog crosstalk is a change in output of any DAC in response
to a change in the output of the other DAC. It is measured in
LSBs.
POWER SUPPLY REJECTION RATIO (PSRR)
This specification indicates how the output of the DAC is
affected by changes in the power supply voltage. Power supply
rejection ratio is quoted in terms of % change in output per %
of change in V
DD
for full-scale output of the DAC. V
DD
is varied
± 10%. This specification applies to an external reference only
because the output voltage will track the V
DD
voltage when in-
ternal reference is selected.

AD7303BNZ

Mfr. #:
Manufacturer:
Analog Devices Inc.
Description:
Digital to Analog Converters - DAC 2.7-5.5V Serial Inpt Dual VOut 8B
Lifecycle:
New from this manufacturer.
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