2009 - 2015 Microchip Technology Inc. DS00002005A-page 34
USB2250/50i/51/51i
9.0 DC PARAMETERS
9.1 Maximum Ratings
Note 9-1 Stresses above the specified parameters may cause permanent damage to the device. This is a
stress rating only and functional operation of the device at any condition above those indicated in the
operation sections of this specification is not implied.
Note 9-2 When powering this device from laboratory or system power supplies, it is important that the absolute
maximum ratings not be exceeded or device failure can result. Some power supplies exhibit voltage
spikes on their outputs when the AC power is switched on or off. In addition, voltage transients on
the AC power line may appear on the DC output. When this possibility exists, it is suggested that a
clamp circuit be used.
Parameter Symbol MIN MAX Units Comments
Storage
Temperature
T
A
-55 150 °C
Lead
Temperature
°C Please refer to JEDEC
specification J-STD-020D.
3.3 V supply
voltage
V
DD33
-0.5 4.0 V
Voltage on
USB+ and USB-
pins
-0.5 (3.3 V supply voltage + 2) 6V
Voltage on
CRD_PWR0,
CRD_PWR1,
CRD_PWR2 and
CRD_PWR3
-0.5 V
DD33
+ 0.3 V When internal power FET
operation of these pins are
enabled, these pins may be
simultaneously shorted to
ground or any voltage up to 3.63
V indefinitely, without damage to
the device as long as V
DD33
is
less than 3.63 V and T
A
is less
than 70
o
C.
Voltage on any
signal pin
-0.5 V
DD33
+ 0.3 V
Voltage on
XTAL1
-0.5 3.6 V
Voltage on
XTAL2
-0.5 V
DD18
+ 0.3 V
FIGURE 9-1: SUPPLY RISE TIME MODEL
t
10%
10%
90%
Voltage
t
RT
t
90%
Time
100%
3.3 V
VSS
VDD33
