ISL6627
7
FN6992.1
January 24, 2014
Power-On Reset (POR) Function
VCC voltage level is monitored at all times. Once the VCC voltage
exceeds 3.85V (typically), operation of the driver is enabled and
the PWM input signal takes control of the gate drivers. If VCC
drops below the falling threshold of 3.52V (typically), operation of
the driver is disabled.
Internal Bootstrap Device
ISL6627 features an internal bootstrap schottky diode. Simply
adding an external capacitor across the BOOT and PHASE pins
completes the bootstrap circuit. The bootstrap function is also
designed to prevent the bootstrap capacitor from overcharging
due to the large negative swing at the trailing-edge of the PHASE
node excursion. This reduces the potential for overstressing the
upper driver.
The bootstrap capacitor must have a voltage rating above the
maximum VCC voltage. Its capacitance value can be estimated
from Equation 1:
where Q
G1
is the amount of gate charge per upper MOSFET at
V
GS1
gate-source voltage and N
Q1
is the number of control
(upper) MOSFETs. The ΔV
BOOT_CAP
term is defined as the
allowable droop in the rail of the upper gate drive. Select results
are exemplified in Figure 4.
Power Dissipation
Package power dissipation is mainly a function of the switching
frequency (F
SW
), the output drive impedance, the layout
resistance, the selected MOSFET’s internal gate resistance and its
total gate charge (Q
G
). Calculating the power dissipation in the
driver for a desired application is critical to ensure safe operation.
Exceeding the maximum allowable power dissipation level may
push the IC beyond the maximum recommended operating
junction temperature. The DFN package is more suitable for high
frequency applications. See “Layout Considerations” on page 8 for
thermal impedance improvement suggestions. The total driver
power loss, essentially MOSFETs’ gate charge and driver internal
circuitry losses, can be estimated using Equations 2 and 3,
respectively.
where the gate charge (Q
G1
and Q
G2
) is defined at a particular
gate to source voltage (V
GS1
and V
GS2
) in the corresponding
MOSFET datasheet; I
Q
is the driver’s total quiescent current with
no load at both drive outputs; N
Q1
and N
Q2
are number of upper
and lower MOSFETs, respectively; UVCC and LVCC are the drive
voltages for both upper and lower FETs, respectively. The I
Q*
VCC
product is the bias power of the driver without a load.
TABLE 1. TYPICAL DELAY PROGRAMMING RESISTOR VALUE
RESISTOR FROM
TD TO VCC
(k)
RESISTOR FROM
TD TO GND
(k)
LG FALL TO
UG RISE DELAY
(ns)
UG FALL TO
LG RISE DELAY
(ns)
short - 27 23
100 - 27 18
330 - 27 15
910 - 27 7
-Short4018
- 100 25 18
- 360 17 18
Floating Floating Adaptive Adaptive
FIGURE 3. PROGRAMMABLE PROPAGATION DELAY
ILLUSTRATION
PWM
UG
LG
LG FALL TO UG RISE PROPAGATION DELAY UG FALL TO LG RISE PROPAGATION DELAY
C
BOOT_CAP
Q
GATE
ΔV
BOOT_CAP
---------------------------------
Q
GATE
Q
G1
VCC
V
GS1
---------------------------
N
Q1
=
(EQ. 1)
50nC
20nC
FIGURE 4. BOOTSTRAP CAPACITANCE vs BOOT RIPPLE
VOLTAGE
ΔV
BOOT_CAP
(V)
C
BOOT_CAP
(µF)
1.6
1.4
1.2
1.
0.8
0.6
0.4
0.2
0.0
0.30.0 0.1 0.2 0.4 0.5 0.6 0.90.7 0.8 1.0
Q
GATE
= 100nC
P
Qg_TOT
P
Qg_Q1
P
Qg_Q2
I
Q
VCC++=
(EQ. 2)
P
Qg_Q1
Q
G1
UVCC
2
V
GS1
-----------------------------------
F
SW
N
Q1
=
P
Qg_Q2
Q
G2
LVCC
2
V
GS2
----------------------------------
F
SW
N
Q2
=
I
DR
Q
G1
UVCC N
Q1
V
GS1
------------------------------------------------
Q
G2
LVCC N
Q2
V
GS2
------------------------------------------------
+
⎝⎠
⎜⎟
⎛⎞
F
SW
I
Q
+=
(EQ. 3)
ISL6627
8
FN6992.1
January 24, 2014
The total gate drive power losses are dissipated among the
resistive components along the transition path, as outlined in
Equation 4. The drive resistance dissipates a portion of the total
gate drive power losses, the rest will be dissipated by the external
gate resistors (R
G1
and R
G2
) and the internal gate resistors (R
GI1
and R
GI2
) of MOSFETs. Figures 5 and 6 show the typical upper and
lower gate drives turn-on current paths.
Application Information
MOSFET and Driver Selection
The parasitic inductances of the PCB and of the power devices’
packaging (both upper and lower MOSFETs) can cause serious
ringing, exceeding absolute maximum rating of the devices. The
negative ringing at the edges of the PHASE node could increase
the bootstrap capacitor voltage through the internal bootstrap
diode, and in some cases, it may overstress the upper MOSFET
driver. Careful layout, proper selection of MOSFETs and
packaging, as well as the driver can minimize such unwanted
stress.
Layout Considerations
A good layout helps reduce the ringing on the switching (PHASE)
node and significantly lower the stress applied to the MOSFETs as
well as the driver. The following advice is meant to lead to an
optimized layout:
Keep decoupling circuit loops (VCC-GND and BOOT-PHASE) as
short as possible.
Minimize trace inductance, especially on low-impedance lines.
All power traces (UGATE, PHASE, LGATE, GND, VCC) should be
short and wide, as much as possible.
Minimize the inductance of the PHASE node. Ideally, the
source of the upper and the drain of the lower MOSFET should
be as close as thermally allowable.
Minimize the current loop of the output and input power trains.
Short the source connection of the lower MOSFET to ground as
close to the transistor pin as feasible. Input capacitors
(especially ceramic decoupling) should be placed as close to
the drain of upper and source of lower MOSFETs as possible.
In addition, connecting the thermal pad of the DFN package to
the power ground through one or several vias is recommended
for high switching frequency, high current applications. This is to
improve heat dissipation and allow the part to achieve its full
thermal potential.
Upper MOSFET Self Turn-On Effects at Startup
Should the driver have insufficient bias voltage applied, its
outputs are floating. If the input bus is energized at a high dV/dt
rate while the driver outputs are floating, due to self-coupling via
the internal C
GD
of the MOSFET, the gate of the upper MOSFET
could momentarily rise up to a level greater than the threshold
voltage of the device, potentially turning on the upper switch.
Therefore, if such a situation could conceivably be encountered,
it is a common practice to place a resistor (R
UGPH
) across the
gate and source of the upper MOSFET to suppress the Miller
coupling effect. The value of the resistor depends mainly on the
input voltage’s rate of rise, the C
GD
/C
GS
ratio, as well as the
gate-source threshold of the upper MOSFET. A higher dV/dt, a
lower C
GD
/C
GS
ratio, and a lower gate-source threshold upper
FET will require a smaller resistor to diminish the effect of the
internal capacitive coupling. For most applications, the
integrated 20kΩ resistor is sufficient, not measurably affecting
normal performance and efficiency.
The coupling effect can be roughly estimated with Equation 5,
which assumes a fixed linear input ramp and neglects the
clamping effect of the body diode of the upper drive and the
bootstrap capacitor. Other parasitic components, such as lead
inductances and PCB capacitances are also not taken into
account. Figure 7 provides a visual reference for this
phenomenon and its potential solution.
FIGURE 5. TYPICAL UPPER-GATE DRIVE TURN-ON PATH
FIGURE 6. TYPICAL LOWER-GATE DRIVE TURN-ON PATH
P
DR
P
DR_UP
P
DR_LOW
I
Q
VCC++=
(EQ. 4)
P
DR_UP
R
HI1
R
HI1
R
EXT1
+
-----------------------------------
R
LO1
R
LO1
R
EXT1
+
------------------------------------ -
+
⎝⎠
⎜⎟
⎛⎞
P
Qg_Q1
2
-------------------
=
P
DR_LOW
R
HI2
R
HI2
R
EXT2
+
-----------------------------------
R
LO2
R
LO2
R
EXT2
+
-------------------------------------
+
⎝⎠
⎜⎟
⎛⎞
P
Qg_Q2
2
-------------------
=
R
EXT1
R
G1
R
GI1
N
Q1
------------
+=
R
EXT2
R
G2
R
GI2
N
Q2
------------
+=
Q1
D
S
G
R
GI1
R
G1
BOOT
R
HI1
C
DS
C
GS
C
GD
R
LO1
PHASE
VCC
VCC
Q2
D
S
G
R
GI2
R
G2
R
HI2
C
DS
C
GS
C
GD
R
LO2
V
GS_MILLER
dV
dt
------
RC
rss
1e
V
DS
dV
dt
------
RC
iss
-------------------------------
⎝⎠
⎜⎟
⎜⎟
⎜⎟
⎜⎟
⎛⎞
⋅⋅=
RR
UGPH
R
GI
+=
C
rss
C
GD
=
C
iss
C
GD
C
GS
+=
(EQ. 5)
ISL6627
9
FN6992.1
January 24, 2014
General PowerPAD Design Considerations
Figure 8 shows the recommended use of vias on the thermal pad
to remove heat from the IC. This typical array populates the
thermal pad footprint with vias spaced three times the radius
distance from the center of each via. Small via size is advisable,
but not to the extent that solder reflow becomes difficult.
All vias should be connected to the pad potential, with low
thermal resistance for efficient heat transfer. Complete
connection of the plated-through hole to each plane is important.
It is not recommended to use “thermal relief” patterns to connect
the vias.
FIGURE 7. GATE TO SOURCE RESISTOR TO REDUCE UPPER
MOSFET MILLER COUPLING
VIN
Q
UPPER
D
S
G
R
GI
R
UGPH
BOOT
DU
C
DS
C
GS
C
GD
DL
PHASE
VCC
ISL6627
C
BOOT
UGATE
FIGURE 8. PCB VIA PATTERN

ISL6627IRZ

Mfr. #:
Manufacturer:
Renesas / Intersil
Description:
Gate Drivers SYNCH BUCK MSFT 5V DRVR VR12 3X3
Lifecycle:
New from this manufacturer.
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