LPC2109_2119_2129 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product data sheet Rev. 7 — 14 June 2011 29 of 46
NXP Semiconductors
LPC2109/2119/2129
Single-chip 16/32-bit microcontrollers
[1] Conditions: V
SSA
=0V, V
DDA
=3.3V.
[2] The ADC is monotonic, there are no missing codes.
[3] The differential linearity error (E
D
) is the difference between the actual step width and the ideal step width. See Figure 4.
[4] The integral non-linearity (E
L(adj)
) is the peak difference between the center of the steps of the actual and the ideal transfer curve after
appropriate adjustment of gain and offset errors. See Figure 4
.
[5] The offset error (E
O
) is the absolute difference between the straight line which fits the actual curve and the straight line which fits the
ideal curve. See Figure 4
.
[6] The gain error (E
G
) is the relative difference in percent between the straight line fitting the actual transfer curve after removing offset
error, and the straight line which fits the ideal transfer curve. See Figure 4
.
[7] The absolute voltage error (E
T
) is the maximum difference between the center of the steps of the actual transfer curve of the
non-calibrated ADC and the ideal transfer curve. See Figure 4
.
Table 7. ADC static characteristics
V
DDA
= 2.5 V to 3.6 V unless otherwise specified; T
amb
=
40
C to +85
C unless otherwise specified. ADC frequency
4.5 MHz.
Symbol Parameter Conditions Min Typ Max Unit
V
IA
analog input voltage 0 - V
DDA
V
C
ia
analog input
capacitance
--1pF
E
D
differential linearity
error
[1][2][3]
--1LSB
E
L(adj)
integral non-linearity
[1][4]
--2LSB
E
O
offset error
[1][5]
--3LSB
E
G
gain error
[1][6]
--0.5 %
E
T
absolute error
[1][7]
--4LSB
