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S-8261ABJMD-G3JT2G

P1-P3P4-P6P7-P9P10-P12P13-P15P16-P18P19-P21P22-P24P25-P27P28-P30P31-P33
BATTERY PROTECTION IC FOR 1-CELL PACK
S-8261 Series
Rev.5.3_00
Seiko Instruments Inc.
10
3. Detection Delay Time
(1) S-8261AAG, S-8261AAH, S-8261AAJ, S-8261AAL, S-8261AAM, S-8261AAN, S-8261AAO, S-8261AAP,
S-8261AAR, S-8261AAZ, S-8261ABB, S-8261ABC, S-8261ABJ, S-8261ABK, S-8261ABM, S-8261ABN,
S-8261ABP, S-8261ABR, S-8261ABS, S-8261ACB, S-8261ACE, S-8261ACI, S-8261ACK, S-8261ACM,
S-8261ACJ, S-8261ACN
Table 8
Item Symbol Condition Min. Typ. Max. Unit
Test
Condition
Test
Circuit
DELAY TIME (Ta = 25°C)
Overcharge detection delay time t
CU
⎯
0.96 1.2 1.4 s 9 5
Overdischarge detection delay time t
DL
⎯
115 144 173 ms 9 5
Overcurrent 1 detection delay time t
lOV1
⎯
7.2 9 11 ms 10 5
Overcurrent 2 detection delay time t
lOV2
⎯
1.8 2.24 2.7 ms 10 5
Load short-circuiting detection delay time t
SHORT
⎯
220 320 380
μ
s 10 5
DELAY TIME (Ta =
−
40°C to
+
85°C)
*1
Overcharge detection delay time t
CU
⎯
0.7 1.2 2.0 s 9 5
Overdischarge detection delay time t
DL
⎯
80 144 245 ms 9 5
Overcurrent 1 detection delay time t
lOV1
⎯
5 9 15 ms 10 5
Overcurrent 2 detection delay time t
lOV2
⎯
1.2 2.24 3.8 ms 10 5
Load short-circuiting detection delay time t
SHORT
⎯
150 320 540
μ
s 10 5
*1.
Since products are not screened at high and low temperatures, the specification for this temperature range is guaranteed by design,
not tested in production.
(2) S-8261AAS
Table 9
Item Symbol Condition Min. Typ. Max. Unit
Test
Condition
Test
Circuit
DELAY TIME (Ta = 25°C)
Overcharge detection delay time t
CU
⎯
0.96 1.2 1.4 s 9 5
Overdischarge detection delay time t
DL
⎯
115 144 173 ms 9 5
Overcurrent 1 detection delay time t
lOV1
⎯
3.6 4.5 5.4 ms 10 5
Overcurrent 2 detection delay time t
lOV2
⎯
1.8 2.24 2.7 ms 10 5
Load short-circuiting detection delay time t
SHORT
⎯
220 320 380
μ
s 10 5
DELAY TIME (Ta =
−
40°C to
+
85°C)
*1
Overcharge detection delay time t
CU
⎯
0.7 1.2 2.0 s 9 5
Overdischarge detection delay time t
DL
⎯
80 144 245 ms 9 5
Overcurrent 1 detection delay time t
lOV1
⎯
2.5 4.5 7.7 ms 10 5
Overcurrent 2 detection delay time t
lOV2
⎯
1.2 2.24 3.8 ms 10 5
Load short-circuiting detection delay time t
SHORT
⎯
150 320 540
μ
s 10 5
*1.
Since products are not screened at high and low temperatures, the specification for this temperature range is guaranteed by design,
not tested in production.
BATTERY PROTECTION IC FOR 1-CELL PACK
Rev.5.3_00
S-8261 Series
Seiko Instruments Inc.
11
(3) S-8261AAT
Table 10
Item Symbol Condition Min. Typ. Max. Unit
Test
Condition
Test
Circuit
DELAY TIME (Ta = 25°C)
Overcharge detection delay time t
CU
⎯
3.7 4.6 5.5 s 9 5
Overdischarge detection delay time t
DL
⎯
29 36 43 ms 9 5
Overcurrent 1 detection delay time t
lOV1
⎯
14 18 22 ms 10 5
Overcurrent 2 detection delay time t
lOV2
⎯
7.2 9 11 ms 10 5
Load short-circuiting detection delay time t
SHORT
⎯
220 320 380
μ
s 10 5
DELAY TIME (Ta =
−
40°C to
+
85°C)
*1
Overcharge detection delay time t
CU
⎯
2.5 4.6 7.8 s 9 5
Overdischarge detection delay time t
DL
⎯
20 36 61 ms 9 5
Overcurrent 1 detection delay time t
lOV1
⎯
10 18 31 ms 10 5
Overcurrent 2 detection delay time t
lOV2
⎯
5 9 15 ms 10 5
Load short-circuiting detection delay time t
SHORT
⎯
150 320 540
μ
s 10 5
*1.
Since products are not screened at high and low temperatures, the specification for this temperature range is guaranteed by design,
not tested in production.
(4) S-8261AAU, S-8261AAX, S-8261ABA
Table 11
Item Symbol Condition Min. Typ. Max. Unit
Test
Condition
Test
Circuit
DELAY TIME (Ta = 25°C)
Overcharge detection delay time t
CU
⎯
3.7 4.6 5.5 s 9 5
Overdischarge detection delay time t
DL
⎯
115 144 173 ms 9 5
Overcurrent 1 detection delay time t
lOV1
⎯
7.2 9 11 ms 10 5
Overcurrent 2 detection delay time t
lOV2
⎯
1.8 2.24 2.7 ms 10 5
Load short-circuiting detection delay time t
SHORT
⎯
220 320 380
μ
s 10 5
DELAY TIME (Ta =
−
40°C to
+
85°C)
*1
Overcharge detection delay time t
CU
⎯
2.5 4.6 7.8 s 9 5
Overdischarge detection delay time t
DL
⎯
80 144 245 ms 9 5
Overcurrent 1 detection delay time t
lOV1
⎯
5 9 15 ms 10 5
Overcurrent 2 detection delay time t
lOV2
⎯
1.2 2.24 3.8 ms 10 5
Load short-circuiting detection delay time t
SHORT
⎯
150 320 540
μ
s 10 5
*1.
Since products are not screened at high and low temperatures, the specification for this temperature range is guaranteed by design,
not tested in production.
BATTERY PROTECTION IC FOR 1-CELL PACK
S-8261 Series
Rev.5.3_00
Seiko Instruments Inc.
12
(5) S-8261ABI, S-8261ABL, S-8261ABT
Table 12
Item Symbol Condition Min. Typ. Max. Unit
Test
condition
Test
circuit
DELAY TIME (Ta = 25°C)
Overcharge detection delay time t
CU
⎯
0.96 1.2 1.4 s 9 5
Overdischarge detection delay time t
DL
⎯
29 36 43 ms 9 5
Overcurrent 1 detection delay time t
lOV1
⎯
7.2 9 11 ms 10 5
Overcurrent 2 detection delay time t
lOV2
⎯
1.8 2.24 2.7 ms 10 5
Load short-circuiting detection delay time t
SHORT
⎯
220 320 380
μ
s 10 5
DELAY TIME (Ta =
−
40°C to
+
85°C)
*1
Overcharge detection delay time t
CU
⎯
0.7 1.2 2.0 s 9 5
Overdischarge detection delay time t
DL
⎯
20 36 61 ms 9 5
Overcurrent 1 detection delay time t
lOV1
⎯
5 9 15 ms 10 5
Overcurrent 2 detection delay time t
lOV2
⎯
1.2 2.24 3.8 ms 10 5
Load short-circuiting detection delay time t
SHORT
⎯
150 320 540
μ
s 10 5
*1.
Since products are not screened at high and low temperatures, the specification for this temperature range is guaranteed by design,
not tested in production.
(6) S-8261ABY, S-8261ABZ, S-8261ACA, S-8261ACS
Table 13
Item Symbol Condition Min. Typ. Max. Unit
Test
Condition
Test
Circuit
DELAY TIME (Ta = 25°C)
Overcharge detection delay time t
CU
⎯
0.96 1.2 1.4 s 9 5
Overdischarge detection delay time t
DL
⎯
115 144 173 ms 9 5
Overcurrent 1 detection delay time t
lOV1
⎯
7.2 9 11 ms 10 5
Overcurrent 2 detection delay time t
lOV2
⎯
0.89 1.12 1.35 ms 10 5
Load short-circuiting detection delay time t
SHORT
⎯
220 320 380
μ
s 10 5
DELAY TIME (Ta =
−
40°C to
+
85°C)
*1
Overcharge detection delay time t
CU
⎯
0.7 1.2 2.0 s 9 5
Overdischarge detection delay time t
DL
⎯
80 144 245 ms 9 5
Overcurrent 1 detection delay time t
lOV1
⎯
5 9 15 ms 10 5
Overcurrent 2 detection delay time t
lOV2
⎯
0.61 1.12 1.91 ms 10 5
Load short-circuiting detection delay time t
SHORT
⎯
150 320 540
μ
s 10 5
*1.
Since products are not screened at high and low temperatures, the specification for this temperature range is guaranteed by design,
not tested in production.
P1-P3P4-P6P7-P9P10-P12P13-P15P16-P18P19-P21P22-P24P25-P27P28-P30P31-P33

S-8261ABJMD-G3JT2G

Mfr. #:
Buy S-8261ABJMD-G3JT2G
Manufacturer:
ABLIC
Description:
Battery Management Lithium-Ion battery protection (1 cell)
Lifecycle:
New from this manufacturer.
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