IDT71V424L15PH

6.424
IDT71V424S, IDT71V424L, 3.3V CMOS Static RAM
4 Meg (512K x 8-bit) Commercial and Industrial Temperature Ranges
AC Test Loads
AC Test Conditions
Figure 1. AC Test Load
Figure 2. AC Test Load
(for tCLZ, tOLZ, tCHZ, tOHZ, tOW, and tWHZ)
Figure 3. Output Capacitive Derating
*Including jig and scope capacitance.
3622 drw 04
320Ω
350Ω5pF*
DATA
OUT
3.3V
1
2
3
4
5
6
7
20 40 60 80 100 120 140 160
180
200
Δt
AA,
t
ACS
(Typical, ns)
CAPACITANCE (pF)
8
3622 drw 05
+1.5V
50Ω
I/O
Z
0
=50Ω
3622 drw 03
30pF
Input Pulse Levels
Input Rise/Fall Times
Input Timing Reference Levels
Output Reference Levels
AC Test Load
GND to 3.0V
1.5ns
1.5V
1.5V
See Figure 1, 2 and 3
3622 tbl 09
6.42
5
IDT71V424S, IDT71V424L, 3.3V CMOS Static RAM
4 Meg (512K x 8-bit) Commercial and Industrial Temperature Ranges
71V424S/L10 71V424S/L12 71V424S/L15
Symbol Parameter Min.Max.Min.Max.Min.Max.Unit
READ CYCLE
t
RC
Read Cycle Time 10
____
12
____
15
____
ns
t
AA
Address Access Time
____
10
____
12
____
15 ns
t
ACS
Chip Select Access Time
____
10
____
12
____
15 ns
t
CLZ
(1)
Chip Select to Output in Low-Z 4
____
4
____
4
____
ns
t
CHZ
(1)
Chip Deselect to Output in High-Z
____
5
____
6
____
7ns
t
OE
Output Enable to Output Valid
____
5
____
6
____
7ns
t
OLZ
(1)
Output Enable to Output in Low-Z 0
____
0
____
0
____
ns
t
OHZ
(1)
Output Disable to Output in High-Z
____
5
____
6
____
7ns
t
OH
Output Hold from Address Change 4
____
4
____
4
____
ns
t
PU
(1)
Chip Select to Power Up Time 0
____
0
____
0
____
ns
t
PD
(1)
Chip Deselect to Power Down Time
____
10
____
12
____
15 ns
WRITE CYCLE
t
WC
Write Cycle Time 10
____
12
____
15
____
ns
t
AW
Address Valid to End of Write 8
____
8
____
10
____
ns
t
CW
Chip Select to End of Write 8
____
8
____
10
____
ns
t
AS
Address Set-up Time 0
____
0
____
0
____
ns
t
WP
Write Pulse Width 8
____
8
____
10
____
ns
t
WR
Write Recovery Time 0
____
0
____
0
____
ns
t
DW
Data Valid to End of Write 6
____
6
____
7
____
ns
t
DH
Data Hold Time 0
____
0
____
0
____
ns
t
OW
(1)
Output Active from End of Write 3
____
3
____
3
____
ns
t
WHZ
(1)
Write Enable to Output in High-Z
____
6
____
7
____
7ns
3622 tbl 10
NOTE:
1. This parameter guaranteed with the AC load (Figure 2) by device characterization, but is not production tested.
AC Electrical Characteristics
(VCC = 3.3V ± 10%, Commercial and Industrial Temperature Ranges)
6.426
IDT71V424S, IDT71V424L, 3.3V CMOS Static RAM
4 Meg (512K x 8-bit) Commercial and Industrial Temperature Ranges
Timing Waveform of Read Cycle No. 2
(1, 2, 4)
NOTES:
1. WE is HIGH for Read Cycle.
2. Device is continuously selected, CS is LOW.
3. Address must be valid prior to or coincident with the later of CS transition LOW; otherwise tAA is the limiting parameter.
4. OE is LOW.
5. Transition is measured ±200mV from steady state.
Timing Waveform of Read Cycle No. 1
(1)
ADDRESS
3622 drw 06
OE
CS
DATA
OUT
(5)
(5)
(5)
(5)
DATA
OUT
VALID
HIGH IMPEDANCE
t
AA
t
RC
t
OE
t
ACS
t
OLZ
t
CHZ
t
CLZ
(3)
t
OHZ
V
CC
SUPPLY
CURRENT
t
PU
t
PD
I
CC
I
SB
DATA
OUT
ADDRESS
3622 drw 07
t
RC
t
AA
t
OH
t
OH
DATA
OUT
VALIDPREVIOUS DATA
OUT
VALID

IDT71V424L15PH

Mfr. #:
Manufacturer:
Description:
IC SRAM 4M PARALLEL 44TSOP II
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union