IKP04N60T
TRENCHSTOP
TM
Series q
IFAG IPC TD VLS
6 Rev. 2.8 17.02.2016
t, SWITCHING TIMES
0A 2A 4A 6A
1ns
10ns
t
r
t
d(on)
t
f
t
d(off)
t, SWITCHING TIMES
50Ω 100Ω 150Ω 200Ω 250Ω
10ns
100ns
t
r
t
d(on)
t
f
t
d(off)
I
C
, COLLECTOR CURRENT R
G
, GATE RESISTOR
Typical switching times as a
function of collector current
(inductive load, T
J
=175°C,
V
CE
= 400V, V
GE
= 0/15V, R
G
= 47Ω,
Dynamic test circuit in Figure E)
Typical switching times as a
function of gate resistor
(inductive load, T
J
= 175°C,
V
CE
= 400V, V
GE
= 0/15V, I
C
= 4A,
Dynamic test circuit in Figure E)
t, SWITCHING TIMES
25°C 50°C 75°C 100°C 125°C 150°C
10ns
t
r
t
d(on)
t
f
t
d(off)
V
GE(th),
GATE-EMITT TRSHOLD VOLTAGE
-50°C 0°C 50°C 100°C 150°C
0V
1V
2V
3V
4V
5V
6V
min.
typ.
max.
T
J
, JUNCTION TEMPERATURE T
J
, JUNCTION TEMPERATURE
Typical switching times as a
function of junction temperature
(inductive load, V
CE
= 400V,
V
GE
= 0/15V, I
C
= 4A, R
G
=47Ω,
Dynamic test circuit in Figure E)
emitter threshold voltage as
a function of junction temperature
(I
C
= 60µA)