VNS3NV04DP-E Electrical specifications
Doc ID 018529 Rev 2 7/21
2.2 Thermal data
2.3 Electrical characteristics
Values specified in this section are for -40 °C < T
j
< 150 °C, unless otherwise stated.
T
j
= 25 °C, unless otherwise specified
Table 3. Thermal data
Symbol Parameter Max value Unit
R
thj-lead
Thermal resistance junction-lead (per channel) 30 °C/W
R
thj-amb
Thermal resistance junction-ambient 80
(1)
1. When mounted on a standard single-sided FR4 board with 50mm
2
of Cu (at least 35 μm thick) connected
to all DRAIN pins of the relative channel
°C/W
Table 4. Off
Symbol Parameter Test conditions Min Typ Max Unit
V
CLAMP
Drain-source clamp
voltage
V
IN
=0V; I
D
= 1.5 A 40 45 55 V
V
CLTH
Drain-source clamp
threshold voltage
V
IN
=0V; I
D
=2mA 36 V
V
INTH
Input threshold
voltage
V
DS
=V
IN
; I
D
=1mA 0.5 2.5 V
I
ISS
Supply current from
input pin
V
DS
=0V; V
IN
= 5 V 100 150 µA
V
INCL
Input-source clamp
voltage
I
IN
=1mA 6 6.8 8 V
I
IN
=-1mA -1 -0.3 V
I
DSS
Zero input voltage
drain current
(V
IN
=0V)
V
DS
=13V; V
IN
=0V; T
j
=2C 30 µA
V
DS
=25V; V
IN
=0V 75 µA
Table 5. On
Symbol Parameter Test conditions Min Typ Max Unit
R
DS(on)
Static drain-source on
resistance
V
IN
=5V; I
D
= 1.5 A; T
j
= 25 °C 120 mΩ
V
IN
=5V; I
D
= 1.5 A 240 mΩ
Table 6. Dynamic
Symbol Parameter Test conditions Min Typ Max Unit
g
fs
(1)
Forward
transconductance
V
DD
=13V; I
D
=1.5A 5.0 S
C
OSS
Output capacitance V
DS
=13V; f=1MHz; V
IN
=0V 150 pF
Electrical specifications VNS3NV04DP-E
8/21 Doc ID 018529 Rev 2
-40 °C < T
j
< 150 °C, unless otherwise specified
Table 7. Switching
Symbol Parameter Test conditions Min Typ Max Unit
t
d(on)
Turn-on delay time
V
DD
=15V; I
D
=1.5A;
V
gen
=5V; R
gen
=R
IN
MIN
= 220 Ω (see Figure 4)
90 300 ns
t
r
Rise time 250 750 ns
t
d(off)
Turn-off delay time 450 1350 ns
t
f
Fall time 250 750 ns
t
d(on)
Turn-on delay time
V
DD
=15V; I
D
=1.5A;
V
gen
=5V; R
gen
=2.2KΩ
(see Figure 4)
0.45 1.35 µs
t
r
Rise time 2.5 7.5 µs
t
d(off)
Turn-off delay time 3.3 10.0 µs
t
f
Fall time 2.0 6.0 µs
(dI/dt)
on
Turn-on current slope
V
DD
=15V; I
D
=1.5A;
V
gen
=5V;
R
gen
=R
IN MIN
= 220 Ω
4.7 A/µs
Q
i
Total input charge
V
DD
=12V; I
D
= 1.5 A; V
IN
=5V;
I
gen
=2.13mA (see Figure 7)
8.5 nC
Table 8. Source drain diode
Symbol Parameter Test conditions Min Typ Max Unit
V
SD
(1)
1. Pulsed: Pulse duration = 300 µs, duty cycle 1.5%
Forward on voltage I
SD
=1.5A; V
IN
=0V 0.8 V
t
rr
Reverse recovery time
I
SD
= 1.5 A; dI/dt = 12 A/µs;
V
DD
=30V; L=20H
(see Figure 5)
107 ns
Q
rr
Reverse recovery
charge
37 µC
I
RRM
Reverse recovery
current
0.7 A
Table 9. Protections
Symbol Parameter Test conditions Min Typ Max Unit
I
lim
Drain current limit V
IN
=5V; V
DS
=13V 3.5 5 7 A
t
dlim
Step response current
limit
V
IN
=5V; V
DS
= 13 V 10 µs
T
jsh
Overtemperature
shutdown
150 175 200 °C
T
jrs
Overtemperature reset 135 °C
I
gf
Fault sink current V
IN
=5V; V
DS
=13V; T
j
=T
jsh
10 15 20 mA
E
as
Single pulse avalanche
energy
Starting T
j
=2C; V
DD
=24V;
V
IN
=5V; R
gen
=R
IN MIN
=220Ω;
L=24mH (see Figure 6
and Figure 8)
100 mJ
VNS3NV04DP-E Electrical specifications
Doc ID 018529 Rev 2 9/21
Figure 4.
Switching time test circuit for resistive load
Figure 5.
Test circuit for diode recovery times
t
I
D
90%
10%
t
V
gen
t
d(on)
t
d(off)
t
f
t
r
R
gen
V
gen
V
D
L=100uH
A
B
8.5
Ω
V
DD
R
gen
FAST
DIODE
OMNIFET
A
D
I
S
220
Ω
B
OMNIFET
D
S
I
V
gen

VNS3NV04DPTR-E

Mfr. #:
Manufacturer:
STMicroelectronics
Description:
Gate Drivers OMNIFET II VIPower 35mOhm 12A 40V
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
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