LNJ424C46RA
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Reliability Test Result
1 1
Issued by
Reaffirmed
by
Product Name : LNJ424C46RA
Panasonic Semiconductor Opto Devices Co., Ltd.
Quality control group
◆Reliability Assurance Criterion（MIL-STD-19500H LTPD 15 %）
Test items Test conditions Test results
Judgment
criteria
Consecutive operating
life test
I
FDC
Max., Ta=25 ℃, t=1 000 h
0/15 B
High temperature
storage test
Tstg Max., t=1 000 h 0/15 A
Low temperature
storage test
Tstg Min., t=1 000 h 0/15 A
High temperature
humidity storage test
Ta=60 ℃, RH≧90 %, t=1 000 h
0/15 A
Soldering heat test
Temperature：Ta=250 ℃, t=10 s Max.,
Max. 260 ℃ Reflow soldering
Refer to attached paper product specification Sheet
No.13/7.
0/15 A
Temperature cycle test
(gaseous phase)
Temperature：
【Tstg M i n. ～25 ℃～Tstg Max.～25 ℃】
Time： (30 min 5 min 30 min 5 min)
× 20 cycles
0/15 A
Thermal shock test
(liquid phase)
Temperature：【Tstg M a x. ～ 0 ℃】
Time ： (5 min 5 min)
× 10 cycles
0/15 A
Fall test
Drop distance : 1 m
Drop the device 3 times on a maple board of 3 cm or
more in thickness.
0/15 A
◆Judgment Criteria A
Item Symbol Measurement condition Limit Unit
Forward Voltage V
F
Same as the Product Standards Upper Limit×1.2 V
Reverse Leakage
Current
I
R
Same as the Product Standards Upper Limit×2.0 μA
Luminous Intensity
⊿I
O
Same as the Product Standards Lower Limit×0.7 %
◆Judgment Criteria B
Item Symbol Measurement condition Limit Unit
Forward Voltage V
F
Same as the Product Standards Upper Limit×1.2 V
Reverse Leakage
Current
I
R
Same as the Product Standards Upper Limit×2.0 μA
Luminous Intensity
⊿I
O
Same as the Product Standards Lower Limit×0.5 %
(Notes)
If you have any special requirement, please inquire for us.
2011-04-05
Established Revised
Semiconductor Company, Panasonic Corporation
