©2003 Fairchild Semiconductor Corporation www.fairchildsemi.com
FOD3181 Rev. 1.0.8 4
FOD3181 — 0.5A Ouput Current, High Speed MOSFET Gate Driver Optocoupler
Notes:
1. Derate linearly above +70°C free air temperature at a rate of 0.3mA/°C.
2. The output currents I
OH
and I
OL
are specified with a capacitive current limited load = (3 x 0.01µF) + 0.5Ω,
frequency = 8kHz, 50% DF.
3. The output currents I
OH
and I
OL
are specified with a capacitive current limited load = (3 x 0.01µF) + 40Ω,
frequency = 8kHz, 50% DF.
4. No derating required across operating temperature range.
5. In this test, V
OH
is measured with a dc load current of 100mA. When driving capacitive load V
OH
will approach V
CC
as I
OH
approaches zero amps.
6. Maximum pulse width = 1ms, maximum duty cycle = 20%.
7. t
PHL
propagation delay is measured from the 50% level on the falling edge of the input pulse to the 50% level of the
falling edge of the V
O
signal. t
PLH
propagation delay is measured from the 50% level on the rising edge of the input
pulse to the 50% level of the rising edge of the V
O
signal.
8. Pin 1 and 4 need to be connected to LED common.
9. Common mode transient immunity in the high state is the maximum tolerable dV
CM
/dt of the common mode pulse
V
CM
to assure that the output will remain in the high state (i.e. V
O
> 10.0V).
10. Common mode transient immunity in a low state is the maximum tolerable dV
CM
/dt of the common mode pulse,
V
CM
, to assure that the output will remain in a low state (i.e. V
O
< 1.0V).
11. In accordance with UL 1577, each optocoupler is proof tested by applying an insulation test voltage > 6000Vrms,
60Hz for 1 second (leakage detection current limit I
I-O
< 5µA).
12. Device considered a two-terminal device: pins on input side shorted together and pins on output side shorted
together.
