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comparator drives high when the FB pin rises above
1.235V, and drives low when FB falls below 1.215V. The
power good status for the input supply is reported via an
open-drain output, PWRGD. It is normally pulled high by
an external pull-up resistor or the internal 10µA pull-up.
The PWRGD pin pulls low when the FB power good com
-
parator is high and the HGATE drive exceeds 4.2V. The
PWRGD pin goes high when the HGATE is turned off by the
UV, OV or EN pins, or when the FB power good comparator
drives low, or when INTV
CC
enters undervoltage lockout.
CPO and DGATE Start-Up
In applications where a single ideal diode MOSFET is placed
on the supply side, CPO is initially pulled up to a diode
below the DSRC pin when first powered up (see Figure
13). In back-to-back MOSFETs applications, CPO starts
off at 0V, since DSRC is near ground (see Figure14). CPO
starts ramping ups after INTV
CC
clears its undervolt-
age lockout level. Another 40µs later, DGATE also starts
ramping
up with CPO. The CPO ramp rate is determined
by the CPO pull-up current into the combined
CPO and
DGA
TE pin capacitances. An internal clamp limits the
CPO pin voltage to 12V above the DSRC pin, while the
final DGATE pin voltage is determined by the gate drive
amplifier. An internal 12V clamp limits the DGATE pin
voltage above DSRC.
CPO Capacitor Selection
The recommended value of the capacitor between the CPO
and DSRC pins is approximately 10× the input capacitance
C
ISS
of the ideal diode MOSFET. A larger capacitor takes a
correspondingly longer time to charge up by the internal
charge pump. A smaller capacitor suffers more voltage
drop during a fast gate turn-on event as it shares charge
with the MOSFET gate capacitance.
MOSFET Selection
The LTC4229 drives N-channel MOSFETs to conduct the
load current. The important features of the MOSFETs are
on-resistance R
DS(ON)
, the maximum drain-source voltage
BV
DSS
and the threshold voltage.
The gate drive for the ideal diode and Hot Swap MOSFET is
guaranteed to be greater than 5V when the supply voltage
at IN is between 2.9V and 7V. When the supply voltage
at IN is greater than 7V, the gate drive is guaranteed to
be greater than 10V. The gate drive is limited to 14V
. An
external
Zener diode can be used to clamp the potential
from the MOSFET’s gate to source if the rated breakdown
voltage is less than 14V.
The maximum allowable drain-source voltage BV
DSS
must be higher than the supply voltage including supply
transients as the full supply voltage can appear across the
MOSFET. If an input or output is connected to ground, the
full supply voltage will appear across the MOSFET. The
R
DS(ON)
should be small enough to conduct the maximum
load current, and also stay within the MOSFET’s power
rating.
Supply Transient Protection
When the capacitances at the input and output are very
small, rapid changes in current during input or output
short-circuit events can cause transients that exceed the
24V absolute maximum ratings of the IN and OUT pins.
To minimize such spikes, use wider traces or heavier
trace plating to reduce the power trace inductance. Also,
bypass locally with a 10µF electrolytic and 0.1µF ceramic,
or alternatively clamp the input with a transient voltage
suppressor Z1. A 100Ω, 0.1µF snubber damps the response
and eliminates ringing (see Figure 13).
Design Example
As a design example for selecting components, consider
a 12V system with a
7.6A maximum
load current for the
input supply (see Figure 1).
First, select the appropriate value of the current sense
resistor R
S
for the 12V supply. Calculate the sense resistor
value based on the maximum load current I
LOAD(MAX)
and
the lower limit for the current limit sense voltage threshold
∆V
SENSE(TH)(MIN)
.
R
S
=
Δ
V
SENSE(TH)(MIN)
I
LOAD(MAX)
=
22.5mV
7.6A
= 2.9mΩ
Choose a 2.5mΩ sense resistor with a 1% tolerance.
Next, calculate the R
DS(ON)
of the ideal diode MOSFET
to achieve the desired forward drop at maximum load.
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Assuming a forward drop, ∆V
FWD
of 50mV across the
ideal diode MOSFET:
R
DS(ON)
Δ
V
FWD
I
LOAD(MAX)
=
50mV
7.6A
= 6.5mΩ
The SiR818DP offers a good choice with a maximum
R
DS(ON)
of 2.8at V
GS
= 10V. The input capacitance
C
ISS
of the SiR818DP is about 3660pF. Slightly exceeding
the 10× recommendation, a 0.1µF capacitor is selected
for C2 at the CPO pin.
Next, verify that the thermal ratings of the selected Hot
Swap MOSFET are not exceeded during power-up or an
overcurrent fault.
Assuming the MOSFET dissipates power due to inrush
current charging the load capacitor C
L
at power-up, the
energy dissipated in the MOSFET is the same as the energy
stored in the load capacitor, and is given by:
E
CL
=
1
2
C
L
V
IN
2
For C
L
= 680µF, the time it takes to charge up C
L
is cal-
culated as:
t
CHARGE
=
C
L
V
IN
I
INRUSH
=
680µF 12V
1A
= 8ms
The inrush current is set to 1A by adding capacitance C
HG
at the gate of the Hot Swap MOSFET.
C
HG
=
C
L
I
HGATE(UP)
I
INRUSH
=
680µF 10µA
1A
= 6.8nF
Choose a practical value of 10nF for C
HG
.
The average power dissipated in the MOSFET is calculated as:
P
AVG
=
E
CL
t
CHARGE
=
1
2
680µF 12V
( )
2
8ms
= 6W
The MOSFET selected must be able to tolerate 6W for 8ms
during power-up. The SOA curves of the SiR818DP provide
45W (1.5A at 30V) for 100ms. This is sufficient to satisfy
the requirement. The increase in junction temperature due
to the power dissipated in the MOSFET isT = P
AVG
Zth
JC
where Zth
JC
is the junction-to-case thermal impedance.
Under this condition, the SiR818DP data sheet indicates
that the junction temperature will increase byC using
Zth
JC
= 0.5°C/W (single pulse).
Next, the power dissipated in the MOSFET during an
overcurrent fault must be safely limited. The fault timer
capacitor (C
FT
) is used to prevent power dissipation in
the MOSFET from exceeding the SOA rating during active
current limit. A good way to determine a suitable value
for C
FT
is to superimpose the foldback current limit profile
shown in the Typical Performance Characteristics on the
MOSFET data sheet’s SOA curves.
For the SiR818DP MOSFET, this exercise yields the plot
in Figure 6.
V
DS
– DRAIN-TO-SOURCE VOLTAGE (V)
I
D
– DRAIN CURRENT (A)
4229 F06
100
10
1
0.1
0.01
0.01 10 10010.1
1ms
10ms
100ms
1s
10s
DC
BVDSS LIMITED
* V
GS
> MINIMUM V
GS
AT WHICH R
DS(ON)
IS SPECIFIED
I
D
LIMITED
I
DM
LIMITED
LIMITED BY R
DS(ON)
*
MOSFET POWER
DISSIPATION CURVE
RESULTING FROM
FOLDBACK ACTIVE
CURRENT LIMIT
Figure 6. SiR818DP SOA with Design Example
MOSFET Power Dissipation Superimposed
As can be seen, the LTC4229’s foldback current limit
profile roughly coincides with the 100ms SOA contour.
Since this SOA plot is for an ambient temperature of 25°C
only, a maximum fault filter time of much less than 100ms
should be considered, such as 10ms or less. Selecting a
0.1μF ± 10% value for C
FT
yields a maximum fault filter
time of 1.75ms which should be small enough to protect
the MOSFET during any overcurrent fault scenario.
Next, select the values for the resistive divider at the OV
and UV pins that define the overvoltage and undervoltage
threshold of 15.2V and 9.8V respectively for the 12V input
supply. Since the leakage currents for the OV and UV pins
can be as high as ±1μA each, the total resistance in the
divider should be low enough to minimize the resulting
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offset errors. Calculate the bottom resistor R1 based on
the following equation to obtain less than ±0.5% error
due to leakage current.
R1=
V
OV(TH)
2 I
IN(LEAK)
0.5% =
1.235V
2µA
0.5% = 3k
Choose R1 to be 2k to achieve less than ±0.5% error and
calculating R2/R3 yields:
R2 =
V
IN(OV)
V
IN(UV)
1
R1=
15.2V
9.8V
1
2k = 1.1k
R3 =
V
IN(UV)
V
UV(TH)
1
(R1+R2)
R3 =
9.8V
1.235V
1
(2k +1.1k) = 21.5k
The worst case OV and UV threshold offset voltage errors
resulting from the total UV and OV pin leakage current
(2 I
IN(LEAK)
) that flows into R3, are calculated as ±0.29%
and ±0.44% respectively.
It remains to select the values for the FB pin resistive
divider in order to set a power good threshold of 10.5V.
Keeping in mind the FB pin’s ±1μA leakage current, choose
a value of 2k for the bottom resistor R4. Calculating the
top resistor R5 value yields:
R5 =
V
OUT(PG)
V
FB(TH)
1
R4 =
10.5V
1.235V
1
2k = 15k
The subsequent offset error due to the FB pin leakage
current will be less than ±0.14%.
The final component to consider is a 0.1µF bypass (C1)
at the INTV
CC
pin.
PCB Layout Considerations
To achieve accurate current sensing, a Kelvin connection
for the sense resistor is recommended. The PCB layout
should be balanced and symmetrical to minimize wiring
errors. In addition, the PCB layout for the sense resistor
and the power MOSFET should include good thermal
management techniques for optimal device power dissipa
-
tion. A
recommended PCB layout is illustrated in Figure 7.
Connect
the IN and OUT pin traces as close as possible to
the MOSFET’s terminals. Keep the traces to the MOSFETs
wide and short to minimize resistive losses. The PCB traces
associated with the power path through the MOSFETs
should have low resistance. The suggested trace width for
Figure 7. Recommended PCB Layout for Power MOSFETs and Sense Resistor
C1
M
H
PowerPAK SO-8
D
D
D
D
S
S
S
G
OUT
CURRENT FLOW
TO LOAD
TRACK WIDTH W:
0.03" PER AMPERE
ON 1oz Cu FOIL
VIA TO GND PLANE
W
M
D
PowerPAK SO-8
G
S
S
S
D
D
D
D
IN
CURRENT FLOW
TO LOAD
W
R
H
C2
Z1
8 9 10 11 12
24 23 22
LTC4229UFD
21 20
6
5
4
3
2
1
7
14
15
16
17
18
19
13
R
S
4229 F07

LTC4229IUFD#PBF

Mfr. #:
Manufacturer:
Analog Devices Inc.
Description:
Hot Swap Voltage Controllers Ideal Diode & Hot Swap Cntr
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
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