XC18V00 Series In-System Programmable Configuration PROMs
DS026 (v3.9) November 18, 2002 www.xilinx.com 7
Product Specification 1-800-255-7778
R
IEEE 1149.1 Boundary-Scan (JTAG)
The XC18V00 family is fully compliant with the IEEE Std.
1149.1 Boundary-Scan, also known as JTAG. A Test
Access Port (TAP) and registers are provided to support all
required boundary scan instructions, as well as many of the
optional instructions specified by IEEE Std. 1149.1. In addi-
tion, the JTAG interface is used to implement in-system pro-
gramming (ISP) to facilitate configuration, erasure, and
verification operations on the XC18V00 device.
Table 4 lists the required and optional boundary-scan
instructions supported in the XC18V00. Refer to the IEEE
Std. 1149.1 specification for a complete description of
boundary-scan architecture and the required and optional
instructions.
Instruction Register
The Instruction Register (IR) for the XC18V00 is eight bits
wide and is connected between TDI and TDO during an
instruction scan sequence. In preparation for an instruction
scan sequence, the instruction register is parallel loaded
with a fixed instruction capture pattern. This pattern is
shifted out onto TDO (LSB first), while an instruction is
shifted into the instruction register from TDI. The detailed
composition of the instruction capture pattern is illustrated
in Figure 3.
The ISP Status field, IR(4), contains logic 1 if the device is
currently in ISP mode; otherwise, it contains logic 0. The
Security field, IR(3), contains logic 1 if the device has been
programmed with the security option turned on; otherwise, it
contains logic 0.
Figure 2: In-System Programming Operation (a) Solder Device to PCB and (b) Program Using Download Cable
DS026_02_011100
GND
V
C
C
(a) (b)
Table 4 : Boundary Scan Instructions
Boundary-Scan
Command
Binary
Code [7:0] Description
Required Instructions
BYPASS 11111111 Enables BYPASS
SAMPLE/
PRELOAD
00000001 Enables boundary-scan
SAMPLE/PRELOAD operation
EXTEST 00000000 Enables boundary-scan
EXTEST operation
Optional Instructions
CLAMP 11111010 Enables boundary-scan
CLAMP operation
HIGHZ 11111100 all outputs in high-impedance
state simultaneously
IDCODE 11111110 Enables shifting out
32-bit IDCODE
USERCODE 11111101 Enables shifting out
32-bit USERCODE
XC18V00 Specific Instructions
CONFIG 11101110 Initiates FPGA configuration
by pulsing CF
pin Low
XC18V00 Series In-System Programmable Configuration PROMs
8 www.xilinx.com DS026 (v3.9) November 18, 2002
1-800-255-7778 Product Specification
R
Boundary Scan Register
The boundary-scan register is used to control and observe
the state of the device pins during the EXTEST, SAM-
PLE/PRELOAD, and CLAMP instructions. Each output pin
on the XC18V00 has two register stages that contribute to
the boundary-scan register, while each input pin only has
one register stage.
For each output pin, the register stage nearest to TDI con-
trols and observes the output state, and the second stage
closest to TDO controls and observes the High-Z enable
state of the pin.
For each input pin, the register stage controls and observes
the input state of the pin.
Identification Registers
The IDCODE is a fixed, vendor-assigned value that is used
to electrically identify the manufacturer and type of the
device being addressed. The IDCODE register is 32 bits
wide. The IDCODE register can be shifted out for examina-
tion by using the IDCODE instruction. The IDCODE is avail-
able to any other system component via JTAG.
The IDCODE register has the following binary format:
vvvv:ffff:ffff:aaaa:aaaa:cccc:cccc:ccc1
where
v = the die version number
f = the family code (50h for XC18V00 family)
a = the ISP PROM product ID (26h for the XC18V04)
c = the company code (49h for Xilinx)
Note: The LSB of the IDCODE register is always read as
logic 1 as defined by IEEE Std. 1149.1.
Table 5 lists the IDCODE register values for the XC18V00
devices.
The USERCODE instruction gives access to a 32-bit user
programmable scratch pad typically used to supply informa-
tion about the devices programmed contents. By using the
USERCODE instruction, a user-programmable identifica-
tion code can be shifted out for examination. This code is
loaded into the USERCODE register during programming of
the XC18V00 device. If the device is blank or was not
loaded during programming, the USERCODE register con-
tains FFFFFFFFh.
XC18V00 TAP Characteristics
The XC18V00 family performs both in-system programming
and IEEE 1149.1 boundary-scan (JTAG) testing via a single
4-wire Test Access Port (TAP). This simplifies system
designs and allows standard Automatic Test Equipment to
perform both functions. The AC characteristics of the
XC18V00 TAP are described as follows.
TAP Timing
Figure 4 shows the timing relationships of the TAP signals.
These TAP timing characteristics are identical for both
boundary-scan and ISP operations.
IR[7:5] IR[4] IR[3] IR[2] IR[1:0]
TDI-> 0 0 0 ISP
Status
Security 0 0 1
->TDO
Notes:
1. IR(1:0) = 01 is specified by IEEE Std. 1149.1
Figure 3: Instruction Register Values Loaded into IR as
Part of an Instruction Scan Sequence
Table 5 : IDCODES Assigned to XC18V00 Devices
ISP-PROM IDCODE
XC18V01 05024093h
XC18V02 05025093h
XC18V04 05026093h
XC18V256 05022093h
XC18V512 05023093h
XC18V00 Series In-System Programmable Configuration PROMs
DS026 (v3.9) November 18, 2002 www.xilinx.com 9
Product Specification 1-800-255-7778
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TAP AC Parameters
Table 6 shows the timing parameters for the TAP waveforms shown in Figure 4
Connecting Configuration PROMs
Connecting the FPGA device with the configuration PROM
(see Figure 5 and Figure 6).
The DATA output(s) of the PROM(s) drives the D
IN
input of the lead FPGA device.
The Master FPGA CCLK output drives the CLK input(s)
of the PROM(s) (in Master-Serial and
Master-SelectMAP modes only).
The CEO
output of a PROM drives the CE input of the
next PROM in a daisy chain (if any).
The OE/RESET
pins of all PROMs are connected to
the INIT
pins of all FPGA devices. This connection
assures that the PROM address counter is reset before
the start of any (re)configuration, even when a
reconfiguration is initiated by a V
CC
glitch.
The PROM CE
input can be driven from the DONE pin.
The CE
input of the first (or only) PROM can be driven
by the DONE output of all target FPGA devices,
provided that DONE is not permanently grounded. CE
can also be permanently tied Low, but this keeps the
DATA output active and causes an unnecessary supply
current of 10 mA maximum.
Slave-Parallel/SelectMap mode is similar to slave serial
mode. The DATA is clocked out of the PROM one byte
per CCLK instead of one bit per CCLK cycle. See FPGA
data sheets for special configuration requirements.
Initiating FPGA Configuration
The XC18V00 devices incorporate a pin named CF that is
controllable through the JTAG CONFIG instruction. Execut-
ing the CONFIG instruction through JTAG pulses the CF
low
for 300-500 ns, which resets the FPGA and initiates config-
uration.
The CF
pin must be connected to the PROGRAM pin on the
FPGA(s) to use this feature.
Figure 4: Test Access Port Timing
Table 6: Test Access Port Timing Parameters
Symbol Parameter Min Max Units
T
CKMIN1
TCK minimum clock period 100 - ns
T
CKMIN2
TCK minimum clock period, Bypass Mode 50 - ns
T
MSS
TMS setup time 10 - ns
T
MSH
TMS hold time 25 - ns
T
DIS
TDI setup time 10 - ns
T
DIH
TDI hold time 25 - ns
T
DOV
TDO valid delay - 25 ns
TCK
T
CKMIN
T
MSS
TMS
TDI
TDO
T
MSH
T
DIH
T
DOV
T
DIS
DS026_04_032702
1,2

XC18V256VQ44I

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