74HC_HCT20 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2015. All rights reserved.
Product data sheet Rev. 4 — 18 November 2015 6 of 15
NXP Semiconductors
74HC20; 74HCT20
Dual 4-input NAND gate
10. Dynamic characteristics
[1] t
pd
is the same as t
PHL
and t
PLH
.
[2] t
t
is the same as t
THL
and t
TLH
.
[3] C
PD
is used to determine the dynamic power dissipation (P
D
in W):
P
D
=C
PD
V
CC
2
f
i
N+ (C
L
V
CC
2
f
o
) where:
f
i
= input frequency in MHz;
f
o
= output frequency in MHz;
C
L
= output load capacitance in pF;
V
CC
= supply voltage in V;
N = number of inputs switching;
(C
L
V
CC
2
f
o
) = sum of outputs.
Table 7. Dynamic characteristics
GND = 0 V; C
L
= 50 pF; for test circuit see Figure 8.
Symbol Parameter Conditions 25 C 40 C to +125 C Unit
Min Typ Max Max
(85 C)
Max
(125 C)
74HC20
t
pd
propagation delay nA, nB, nC or nD to nY;
see Figure 7
[1]
V
CC
= 2.0 V - 28 90 115 135 ns
V
CC
= 4.5 V - 10 18 23 27 ns
V
CC
= 6.0 V - 8 15 20 23 ns
V
CC
=5.0V; C
L
=15pF - 8 - - - ns
t
t
transition time see Figure 7
[2]
V
CC
= 2.0 V - 19 75 95 110 ns
V
CC
= 4.5 V - 7 15 19 22 ns
V
CC
= 6.0 V - 6 13 16 19 ns
C
PD
power dissipation
capacitance
per package; V
I
=GNDtoV
CC
[3]
-22- - -pF
74HCT20
t
pd
propagation delay nA, nB, nC or nD to nY;
see Figure 7
[1]
V
CC
= 4.5 V - 16 28 35 42 ns
V
CC
= 5.0 V; C
L
=15pF - 13 - - - ns
t
t
transition time V
CC
= 4.5 V; see Figure 7
[2]
- 7 15 19 22 ns
C
PD
power dissipation
capacitance
per package;
V
I
=GNDtoV
CC
1.5 V
[3]
-17- - -pF
74HC_HCT20 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2015. All rights reserved.
Product data sheet Rev. 4 — 18 November 2015 7 of 15
NXP Semiconductors
74HC20; 74HCT20
Dual 4-input NAND gate
11. Waveforms
Measurement points are given in Table 8.
V
OL
and V
OH
are typical voltage output levels that occur with the output load.
Fig 7. Waveforms showing the input (nA, nB, nC, nD) to output (nY) propagation delays and the output
transition times
Q$
Q%Q&
Q'
LQSXW
Q<
RXWSXW
9
0
9
;
9
,
W
7+/
W
7/+
9
2+
9
0
9
<
9
2/
*1'
DDD
W
3+/
W
3/+
Table 8. Measurement points
Type Input Output
V
M
V
M
V
X
V
Y
74HC20 0.5V
CC
0.5V
CC
0.1V
CC
0.9V
CC
74HCT20 1.3 V 1.3 V 0.1V
CC
0.9V
CC
74HC_HCT20 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2015. All rights reserved.
Product data sheet Rev. 4 — 18 November 2015 8 of 15
NXP Semiconductors
74HC20; 74HCT20
Dual 4-input NAND gate
Test data is given in Table 9.
Definitions test circuit:
R
T
= termination resistance should be equal to output impedance Z
o
of the pulse generator.
C
L
= load capacitance including jig and probe capacitance.
Fig 8. Test circuit for measuring switching times
DDK
W
:
W
:
W
U
W
U
W
I
9
0
9
,
QHJDWLYH
SXOVH
*1'
9
,
SRVLWLYH
SXOVH
*1'




9
0
9
0
9
0
W
I
9
&&
'87
5
7
9
,
9
2
&
/
*
Table 9. Test data
Type Input Load Test
V
I
t
r
, t
f
C
L
74HC20 V
CC
6.0 ns 15 pF, 50 pF t
PLH
, t
PHL
74HCT20 3.0 V 6.0 ns 15 pF, 50 pF t
PLH
, t
PHL

74HCT20DB,112

Mfr. #:
Manufacturer:
Nexperia
Description:
Logic Gates DUAL 4-INPUT NAND
Lifecycle:
New from this manufacturer.
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