MTFDGAR350SAH-1N3AB Datasheet MTFDGAR350SAH-1N14AB, MTFDGAR350SAH-1N3AB, MTFDGAR700SAH-1N3AB | P13-P15

Reliability

Micron’s SSDs incorporate advanced technology for defect and error management.

They use various combinations of hardware-based error correction algorithms and

firmware-based static and dynamic wear-leveling algorithms.

Over the life of the SSD, uncorrectable errors may occur. An uncorrectable error is de-

fined as data that is reported as successfully programmed to the SSD but when it is read

out of the SSD, the data differs from what was programmed.

Table 8: Uncorrectable Bit Error Rate

Uncorrectable Bit Error Rate Operation

1 sector per 10

bits read READ

Mean Time to Failure

The mean time to failure (MTTF) for the device can be predicted based on the compo-

nent reliability data using the methods referenced in the Telcordia SR-322 reliability

prediction procedures for electronic equipment.

Table 9: MTTF

Capacity MTTF (Operating Hours)

350GB

2 million

700GB

Endurance

Endurance for the device can be predicted based on the usage conditions applied to the

device, the internal NAND component PROGRAM/ERASE cycles, the write amplifica-

tion factor, and the wear-leveling efficiency of the drive. The table below shows the

drive lifetime for each SSD density based on predefined usage conditions. The SSD im-

plements wear leveling in hardware to optimize performance and efficiency while

maintaining Flash endurance.

Table 10: Drive Lifetime

Capacity Workload Total Bytes Written Drive Fills Per Day Retention

350GB 4KB random writes 25PB 39 1 year

128KB sequential writes 50PB 78 1 year

700GB 4KB random writes 50PB 39 1 year

128KB sequential writes 100PB 78 1 year

P320h HHHL PCIe NAND SSD

Reliability

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realssd_p320h_hhhl_distribution.pdf - Rev. V 8/2014 EN

Micron Technology, Inc. reserves the right to change products or specifications without notice.

Electrical and Environmental Characteristics

Stresses greater than those listed may cause permanent damage to the device. This is a

stress rating only, and functional operation of the device at these or any other condi-

tions above those indicated in the operational sections of this specification is not im-

plied. Exposure to absolute maximum rating conditions for extended periods may affect

reliability.

Table 11: Operating Voltage and Power

Electrical Characteristic Value

Voltage requirement +12Vdc (±8%)

Active power 25W RMS

Standby power (idle) 10W

Table 12: Environmental Conditions

Temperature and Airflow Min Max Unit Notes

Operating temperature (as indicated by SMART temper-

ature)

0 85 °C 1

Operating ambient temperature 0 55 °C 2

Storage temperature (in system) 0 40 °C 3

Storage temperature (offline) –40 85 °C 4

Operating airflow 1.0 – m/s 5

Notes:

1. If SMART temperature exceeds 85°C, write performance is throttled.

2. Temperature of air impinging on the drive.

3. Assumes system is powered off and ready to be powered on.

4. Contact Micron for additional information.

5. Airflow must flow along the length of the drive, parallel to and through any cooling

fins; 1.5m/s operating airflow is recommended.

Table 13: Shock and Vibration

Parameter/Condition Specification

Shock 400g at 2ms

Vibration 3.1 grms 5–800Hz at 30 min/axis

P320h HHHL PCIe NAND SSD

Electrical and Environmental Characteristics

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realssd_p320h_hhhl_distribution.pdf - Rev. V 8/2014 EN

Micron Technology, Inc. reserves the right to change products or specifications without notice.

Compliance

The device complies with the following specifications:

• RoHS - Restriction of Hazardous Substances

• China RoHS

• WEEE Waste Electric and Electronic Equipment

• Halogen Free - meets IPC low-halogen requirements

• CE (Europe) EN55022/EN55024 (Class A)

• TUV (Germany) EN60950

• UL (US/Canada) EN60950

• FCC (US) 47CFR Part 15 Class A

• BSMI (Taiwan) CNS 13438 Class A

• VCCI (Japan) EN 55022/CISPR 22 Class A

• C-TICK (AUS/NZ) CISPR22

• ICES (Canada) CISPR22 Class A

• KC (Korea) - EN55022/EN55024 Class A, KCC-REM-MU2-P320hHHHL

FCC Rules

This equipment has been tested and found to comply with the limits for a Class A digital

device, pursuant to part 15 of the FCC Rules. These limits are designed to provide rea-

sonable protection against harmful interference when the equipment is operated in a

commercial environment. This equipment generates, uses, and can radiate radio fre-

quency energy and, if not installed and used in accordance with the instruction manual,

may cause harmful interference to radio communications. Operation of this equipment

in a residential area is likely to cause harmful interference in which case the user will be

required to correct the interference at his own expense.

References

• PCI Express Base Specification V2.1

• PCI Express CEM Specification V2.0

• ATA8-ACS2 Specification

• IDEMA Specification

• Telcordia SR-322 Procedures

• SNIA Performance Test Specification V1.0

P320h HHHL PCIe NAND SSD

Compliance

PDF: 09005aef848cbdf4

realssd_p320h_hhhl_distribution.pdf - Rev. V 8/2014 EN

Micron Technology, Inc. reserves the right to change products or specifications without notice.

P1-P3 P4-P6 P7-P9 P10-P12 P13-P15 P16-P18

MTFDGAR350SAH-1N3AB

Mfr. #:

Buy MTFDGAR350SAH-1N3AB

Manufacturer:

Micron

Description:

SSD 350GB PCIE 2.0 SLC 12V

Lifecycle:

New from this manufacturer.

Delivery:

DHL FedEx Ups TNT EMS

Payment:

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MTFDGAR350SAH-1N3AB

MTFDGAR350SAH-1N3AB

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