HEF4526B All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product data sheet Rev. 5 — 22 November 2011 10 of 19
NXP Semiconductors
HEF4526B
Programmable 4-bit binary down counter
[1] The typical values of the propagation delay and transition times are calculated from the extrapolation formulas shown (C
L
in pF).
[2] In the divide-by-n mode (PL connected to TC), the CP0 or CP
1 pulse width must be greater than the maximum HIGH to LOW
propagation delay for CP0 or CP
1 to TC.
t
W
pulse width CP0 input; LOW;
see Figure 6
5 V 8040- ns
10 V 40 20 - ns
15 V 30 15 - ns
CP
1 input; HIGH;
see Figure 6
5 V 8040- ns
10 V 40 20 - ns
15 V 30 15 - ns
PL input; HIGH;
see Figure 6
5 V 100 50 - ns
10 V 40 20 - ns
15 V 32 16 - ns
MR input; LOW 5 V 130 65 - ns
10 V 50 25 - ns
15 V 40 20 - ns
f
max
maximum frequency PL = LOW;
see Figure 6
5 V
[2]
612- MHz
10 V 1225- MHz
15 V 1632- MHz
Table 9. Dynamic characteristics
…continued
V
SS
= 0 V; T
amb
= 25
C; for test circuit see Figure 7; unless otherwise specified.
Symbol Parameter Conditions V
DD
Extrapolation formula Min Typ Max Unit
Table 10. Dynamic power dissipation P
D
P
D
can be calculated from the formulas shown. V
SS
= 0 V; t
r
= t
f
20 ns; T
amb
= 25
C.
Symbol Parameter V
DD
Typical formula for P
D
(W) where:
P
D
dynamic power
dissipation
5 V P
D
= 1000 f
i
+ (f
o
C
L
) V
DD
2
f
i
= input frequency in MHz,
f
o
= output frequency in MHz,
C
L
= output load capacitance in pF,
V
DD
= supply voltage in V,
(f
o
C
L
) = sum of the outputs.
10 V P
D
= 4000 f
i
+ (f
o
C
L
) V
DD
2
15 V P
D
= 10000 f
i
+ (f
o
C
L
) V
DD
2
HEF4526B All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product data sheet Rev. 5 — 22 November 2011 11 of 19
NXP Semiconductors
HEF4526B
Programmable 4-bit binary down counter
11. Waveforms
a. Propagation delays for CP0, CP1 to Qn, and TC, minimum CP0 and CP1 pulse widths and maximum frequency
b. Propagation delays for PL and An to Qn, setup and hold times for PL to An, Qn transition times and minimum PL
pulse width
Measurement points are given in Table 11.
The logic levels V
OH
and V
OL
are typical output voltage levels that occur with the output load.
Fig 6. Waveforms showing switching times
001aae724
t
W
CP0
input
CP1
input
Qn
output
TC
output
V
M
V
M
V
M
V
M
V
l
0 V
1/f
max
t
W
t
PLH
t
PHL
t
PHL
t
PLH
t
PLH
V
OH
V
OL
V
OH
V
OL
V
l
0 V
001aae723
PL input
V
l
0 V
An input
Qn output
V
M
V
M
90%
10%
t
PHL
t
PLH
t
t
t
t
t
W
t
h
t
su
V
l
0 V
V
OH
V
OL
HEF4526B All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product data sheet Rev. 5 — 22 November 2011 12 of 19
NXP Semiconductors
HEF4526B
Programmable 4-bit binary down counter
12. Application information
Some examples of HEF4526B applications are:
Divide-by-n counter
Programmable frequency divider
a. Input waveforms
b. Test circuit
Test data is given in Table 11;
Definitions for test circuit:
DUT = Device Under Test;
C
L
= Load capacitance, including jig and probe capacitance;
R
L
= Load resistance;
R
T
= Termination resistance, should be equal to the output impedance Z
o
of the pulse generator.
Fig 7. Test circuit for switching times
V
M
V
M
t
W
t
W
10 %
90 %
10 %
90 %
0 V
V
I
V
I
negative
pulse
positive
pulse
0 V
V
M
V
M
90 %
10 %
90 %
10 %
t
f
t
r
t
r
t
f
001aaj781
V
DD
V
I
V
O
001aag182
DUT
C
L
R
T
G
Table 11. Measurement points and test data
Supply voltage Input Load
V
I
V
M
t
r
, t
f
C
L
R
L
5Vto15V V
DD
0.5V
I
20 ns 50 pF 1 k

HEF4526BT,653

Mfr. #:
Manufacturer:
NXP Semiconductors
Description:
Counter ICs PROGRMMABL 4-BIT BCD
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
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