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Figure 5. Configuration for OR/NOR Function
Table 4. OR/NOR TRUTH TABLE**
0
0
1
1
D0
1
1
1
1
D1
0
1
0
1
SEL
or
0
1
1
1
Q
Q
SEL
VTD0
Q
SEL
VTD0
50
50
VTD1
VTD1
50
50
50
50
VTSEL
V
CC
VT or V
BB
D0
D0
D1
D1
** D0, D1, SEL are inverse of D0, D1, SEL unless specified
otherwise.
Q
SEL
VTD0
Q
SEL
VTD0
50
50
VTD1
VTD1
50
50
50
50
VTSEL
D0
D0
D1
D1
Figure 6. Configuration for XOR/XNOR Function
1
0
0
D1
0
1
0
1
SEL
XOR
0
1
1
0
Q
Table 5. XOR/XNOR TRUTH TABLE**
0
0
1
1
D0
1
** D0, D1, SEL are inverse of D0, D1, SEL unless specified
otherwise.
D0
Q
SEL
VTD0
Q
SEL
VTD0
50
50
D0
D1
VTD1
VTD1
50
50
D1
50
50
VTSEL
Figure 7. Configuration for 2:1 MUX Function
D1
D0
Q
Table 6. 2:1 MUX TRUTH TABLE**
1
0
SEL
** D0, D1, SEL are inverse of D0, D1, SEL unless specified
otherwise.
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Table 7. Interfacing Options
INTERFACING OPTIONS CONNECTIONS
CML Connect VTD0, VTD1, VTSEL and VTD0, VTD1 to V
CC
LVDS Connect VTD0, VTD1, VTD0 and VTD1 together. Leave VTSEL open.
AC−COUPLED Bias VTD0, VTD1, VTSEL and VTD0, VTD1 Inputs within (VIHCMR) Common Mode Range
RSECL, PECL, NECL Standard ECL Termination Techniques
LVTTL, LVCMOS An external voltage should be applied to the unused complementary differential input.
Nominal voltage 1.5 V for LVTTL and V
CC
/2 for LVCMOS inputs.
Table 8. ATTRIBUTES
Characteristics Value
Internal Input Pulldown Resistors (R
1
) 75 k
Internal Input Pullup Resistor (R
2
) 37.5 k
ESD Protection Human Body Model
Machine Model
Charged Device Model
> 1 KV
> 50 V
> 4 KV
Moisture Sensitivity (Note 6) 16−FCBGA
16−QFN
Level 3
Level 1
Flammability Rating Oxygen Index: 28 to 34 UL 94 V−0 @ 0.125 in
Transistor Count 364
Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test
6. For additional information, see Application Note AND8003/D.
Table 9. MAXIMUM RATINGS (Note 7)
Symbol
Parameter Condition 1 Condition 2 Rating Units
V
CC
Positive Power Supply V
EE
= 0 V 3.6 V
V
EE
Negative Power Supply V
CC
= 0 V −3.6 V
V
I
Positive Input
Negative Input
V
EE
= 0 V
V
CC
= 0 V
V
I
V
CC
V
I
V
EE
3.6
−3.6
V
V
V
INPP
Differential Input Voltage |D
n
− D
n
| V
CC
− V
EE
2.8 V
V
CC
− V
EE
< 2.8 V
2.8
|V
CC
− V
EE
|
V
V
I
IN
Input Current Through R
T
(50 Resistor) Static
Surge
45
80
mA
mA
I
out
Output Current Continuous
Surge
25
50
mA
mA
TA Operating Temperature Range 16−FCBGA
16−QFN
−40 to +70
−40 to +85
°C
°C
T
stg
Storage Temperature Range −65 to +150 °C
JA
Thermal Resistance (Junction−to−Ambient)
(Note 8)
0 LFPM
500 LFPM
0 LFPM
500 LFPM
16 FCBGA
16 FCBGA
16 QFN
16 QFN
108
86
41.6
35.2
°C/W
°C/W
°C/W
°C/W
JC
Thermal Resistance (Junction−to−Case) 2S2P (Note 8)
2S2P (Note 9)
16 FCBGA
16 QFN
5.0
4.0
°C/W
°C/W
T
sol
Wave Solder 15 Sec. 225 °C
7. Maximum Ratings are those values beyond which device damage may occur.
8. JEDEC standard multilayer board − 2S2P (2 signal, 2 power).
9. JEDEC standard multilayer board − 2S2P (2 signal, 2 power) with 8 filled thermal vias under exposed pad.
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Table 10. DC CHARACTERISTICS, INPUT WITH PECL OUTPUT V
CC
= 2.5 V; V
EE
= 0 V (Note 10)
−40°C 25°C 70°C(BGA)/85°C(QFN)**
Symbol Characteristic
Min Typ Max Min Typ Max Min Typ Max
Unit
I
EE
Negative Power Supply Current 23 30 39 23 30 39 23 30 39 mA
V
OH
Output HIGH Voltage (Note 11) 1460 1510 1560 1490 1540 1590 1515 1565 1615 mV
V
OL
Output LOW Voltage (Note 11)
(OLS = V
CC
)
(OLS = V
CC
− 0.4 V)
(OLS = V
CC
− 0.8 V, OLS = FLOAT)
(OLS = V
CC
− 1.2 V)
(OLS = V
EE
)
555
1235
775
1455
1005
705
1295
895
1505
1095
855
1355
1015
1555
1185
595
1270
810
1490
1040
745
1330
930
1540
1130
895
1390
1050
1590
1220
625
1295
840
1510
1065
775
1355
960
1560
1155
925
1415
1080
1610
1245
mV
V
OUTPP
Output Voltage Amplitude
(OLS = V
CC
)
(OLS = V
CC
− 0.4 V)
(OLS = V
CC
− 0.8 V, OLS = FLOAT)
(OLS = V
CC
− 1.2 V)
(OLS = V
EE
)
715
125
525
0
325
805
215
615
5
415
705
120
520
0
320
795
210
610
0
410
700
120
515
0
320
790
210
605
5
410
mV
V
IH
Input HIGH Voltage (Single−Ended)
(Note 13) D, D
V
EE
+
1275
V
CC
1000*
V
CC
V
EE
+
1275
V
CC
1000*
V
CC
V
EE
+
1275
V
CC
1000*
V
CC
mV
V
IL
Input LOW Voltage (Single−Ended)
(Note 14) D, D
V
EE
V
CC
1400*
V
IH
150
V
EE
V
CC
1400*
V
IH
150
V
EE
V
CC
1400*
V
IH
150
mV
V
IHCMR
Input HIGH Voltage Common Mode
Range (Differential Configuration)
(Note 12)
1.2 2.5 1.2 2.5 1.2 2.5 V
R
TIN
Internal Input Termination Resistor 45 50 55 45 50 55 45 50 55
I
IH
Input HIGH Current (@V
IH
) D, D
SEL
30
5
100
50
30
5
100
50
30
5
100
50
A
I
IL
Input LOW Current (@V
IL
) D, D
SEL
20
5
100
50
20
5
100
50
20
5
100
50
A
NOTE: GigaComm circuits are designed to meet the DC specifications shown in the above table after thermal equilibrium has been established.
The circuit is in a test socket or mounted on a printed circuit board and transverse airflow greater than 500 lfpm is maintained.
10.Input and output parameters vary 1:1 with V
CC
. V
EE
can vary +0.125 V to −0.965 V.
11. All loading with 50 to V
CC
− 2.0 V.
12.V
IHCMR
min varies 1:1 with V
EE
, V
IHCMR
max varies 1:1 with V
CC
. The V
IHCMR
range is referenced to the most positive side of the differential
input signal.
13.V
IH
cannot exceed V
CC
.
14.V
IL
always V
EE
.
*Typicals used for testing purposes.
**The device packaged in FCBGA−16 have maximum ambient temperature specification of 70°C and devices packaged in QFN−16 have
maximum ambient temperature specification of 85°C.

NBSG86ABAEVB

Mfr. #:
Manufacturer:
ON Semiconductor
Description:
Clock & Timer Development Tools BBG NBSG86ABA EVAL BOARD
Lifecycle:
New from this manufacturer.
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