Electrical Specifications
MR2A16A Data Sheet, Rev. 6
Freescale Semiconductor
7
Figure 3. Output Load for ac Test
Table 8. ac Measurement Conditions
Parameter Value
Logic input timing measurement reference level 1.5 V
Logic output timing measurement reference level 1.5 V
Logic input pulse levels 0 or 3.0 V
Input rise/fall time 2 ns
Output load for low and high impedance parameters See Figure 3A
Output load for all other timing parameters See Figure 3B
AB
OUTPUT
R
L
= 50 Ω
V
L
= 1.5 V
Z
D
= 50 Ω
OUTPUT
600 Ω
725 Ω
5 pF
+3.3 V
MR2A16A Data Sheet, Rev. 6
8 Freescale Semiconductor
Timing Specifications
Timing Specifications
Read Mode
Table 9. Read Cycle Timing
1, 2
Parameter Symbol Min Max Unit
Read cycle time t
AVAV
35 ns
Address access time t
AVQV
—35ns
Enable access time
3
t
ELQV
—35ns
Output enable access time t
GLQV
—15ns
Byte enable access time t
BLQV
—15ns
Output hold from address change t
AXQX
3—ns
Enable low to output active
4, 5
t
ELQX
3—ns
Output enable low to output active
4, 5
t
GLQX
0—ns
Byte enable low to output active
4, 5
t
BLQX
0—ns
Enable high to output Hi-Z
4, 5
t
EHQZ
015ns
Output enable high to output Hi-Z
4, 5
t
GHQZ
010ns
Byte high to output Hi-Z
4, 5
t
BHQZ
010ns
NOTES:
1
W is high for read cycle.
2
Due to product sensitivities to noise, power supplies must be properly grounded and
decoupled, and bus contention conditions must be minimized or eliminated during read and
write cycles.
3
Addresses valid before or at the same time E goes low.
4
This parameter is sampled and not 100% tested.
5
Transition is measured ±200 mV from steady-state voltage.
Timing Specifications
MR2A16A Data Sheet, Rev. 6
Freescale Semiconductor
9
Figure 4. Read Cycle 1
Figure 5. Read Cycle 2
t
AVAV
t
AXQX
t
AVQV
DATA VALIDPREVIOUS DATA VALIDQ (DATA OUT)
A (ADDRESS)
NOTES:
Device is continuously selected (E
V
IL
, G V
IL
).

MR2A16ATS35C

Mfr. #:
Manufacturer:
NXP / Freescale
Description:
RAM Miscellaneous MRAM TECHNOLOGY
Lifecycle:
New from this manufacturer.
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