IRLR2905TRPBF

IRLR/U2905PbF
HEXFET
®
Power MOSFET
S
D
G
Parameter Typ. Max. Units
R
θJC
Junction-to-Case ––– 1.4
R
θJA
Case-to-Ambient (PCB mount)** ––– 50 °C/W
R
θJA
Junction-to-Ambient ––– 110
Thermal Resistance
V
DSS
= 55V
R
DS(on)
= 0.027
I
D
= 42A
Description
12/7/04
www.irf.com 1
D-Pak
TO-252AA
I-Pak
TO-251AA
l Logic-Level Gate Drive
l Ultra Low On-Resistance
l Surface Mount (IRLR2905)
l Straight Lead (IRLU2905)
l Advanced Process Technology
l Fast Switching
l Fully Avalanche Rated
Fifth Generation HEXFETs from International Rectifier utilize advanced
processing techniques to achieve the lowest possible on-resistance per
silicon area. This benefit, combined with the fast switching speed and
ruggedized device design that HEXFET Power MOSFETs are well known for,
provides the designer with an extremely efficient device for use in a wide
variety of applications.
The D-PAK is designed for surface mounting using vapor phase, infrared, or
wave soldering techniques. The straight lead version (IRFU series) is for
through-hole mounting applications. Power dissipation levels up to 1.5 watts
are possible in typical surface mount applications.
** When mounted on 1" square PCB (FR-4 or G-10 Material ) .
For recommended footprint and soldering techniques refer to application note #AN-994
Parameter Max. Units
I
D
@ T
C
= 25°C Continuous Drain Current, V
GS
@ 10V 42
I
D
@ T
C
= 100°C Continuous Drain Current, V
GS
@ 10V 30 A
I
DM
Pulsed Drain Current 160
P
D
@T
C
= 25°C Power Dissipation 110 W
Linear Derating Factor 0.71 W/°C
V
GS
Gate-to-Source Voltage ± 16 V
E
AS
Single Pulse Avalanche Energy 210 mJ
I
AR
Avalanche Current 25 A
E
AR
Repetitive Avalanche Energy 11 mJ
dv/dt Peak Diode Recovery dv/dt 5.0 V/ns
T
J
Operating Junction and -55 to + 175
T
STG
Storage Temperature Range
Soldering Temperature, for 10 seconds 300 (1.6mm from case )
°C
Absolute Maximum Ratings
PD- 95084A
l Lead-Free
IRLR/U2905PbF
2 www.irf.com
S
D
G
Parameter Min. Typ. Max. Units Conditions
I
S
Continuous Source Current MOSFET symbol
(Body Diode)
––– –––
showing the
I
SM
Pulsed Source Current integral reverse
(Body Diode)
––– –––
p-n junction diode.
V
SD
Diode Forward Voltage –– –– 1.3 V T
J
= 25°C, I
S
= 25A, V
GS
= 0V
t
rr
Reverse Recovery Time –– 80 120 ns T
J
= 25°C, I
F
= 25A
Q
rr
Reverse RecoveryCharge ––– 210 320 nC di/dt = 100A/µs

t
on
Forward Turn-On Time Intrinsic turn-on time is negligible (turn-on is dominated by L
S
+L
D
)
Source-Drain Ratings and Characteristics
42
160
A
V
DD
= 25V, starting T
J
= 25°C, L =470µH
R
G
= 25, I
AS
= 25A. (See Figure 12)
Repetitive rating; pulse width limited by
max. junction temperature. ( See fig. 11 )
Pulse width 300µs; duty cycle 2%.
This is applied for I-PAK, L
S
of D-PAK is measured between
lead and center of die contact.
Uses IRLZ44N data and test conditions.
I
SD
25A, di/dt 270A/µs, V
DD
V
(BR)DSS
,
T
J
175°C
Notes:
Parameter Min. Typ. Max. Units Conditions
V
(BR)DSS
Drain-to-Source Breakdown Voltage 55 ––– ––– V V
GS
= 0V, I
D
= 250µA
V
(BR)DSS
/T
J
Breakdown Voltage Temp. Coefficient –– 0.070 V/°C Reference to 25°C, I
D
= 1mA
––– ––– 0.027 V
GS
= 10V, I
D
= 25A
––– ––– 0.030 W V
GS
= 5.0V, I
D
= 25A
––– ––– 0.040 V
GS
= 4.0V, I
D
= 21A
V
GS(th)
Gate Threshold Voltage 1.0 –– 2.0 V V
DS
= V
GS
, I
D
= 250µA
g
fs
Forward Transconductance 21 ––– –– S V
DS
= 25V, I
D
= 25A
––– ––– 25
µA
V
DS
= 55V, V
GS
= 0V
––– ––– 250 V
DS
= 44V, V
GS
= 0V, T
J
= 150°C
Gate-to-Source Forward Leakage –– –– 100
nA
V
GS
= 16V
Gate-to-Source Reverse Leakage –– –– -100 V
GS
= -16V
Q
g
Total Gate Charge ––– ––– 48 I
D
= 25A
Q
gs
Gate-to-Source Charge –– ––– 8.6 nC V
DS
= 44V
Q
gd
Gate-to-Drain ("Miller") Charge –– –– 25 V
GS
= 5.0V, See Fig. 6 and 13 
t
d(on)
Turn-On Delay Time ––– 11 –– V
DD
= 28V
t
r
Rise Time –– 84 ––
ns
I
D
= 25A
t
d(off)
Turn-Off Delay Time ––– 26 –– R
G
= 3.4Ω, V
GS
= 5.0V
t
f
Fall Time –– 15 –– R
D
= 1.1Ω, See Fig. 10 
Between lead,
6mm (0.25in.)
from package
and center of die contact
C
iss
Input Capacitance –– 1700 ––– V
GS
= 0V
C
oss
Output Capacitance –– 400 ––– pF V
DS
= 25V
C
rss
Reverse Transfer Capacitance –– 150 –– ƒ = 1.0MHz, See Fig. 5
Electrical Characteristics @ T
J
= 25°C (unless otherwise specified)
nH
I
GSS
S
D
G
L
S
Internal Source Inductance –– 7.5
R
DS(on)
Static Drain-to-Source On-Resistance
L
D
Internal Drain Inductance  4.5 
I
DSS
Drain-to-Source Leakage Current
Caculated continuous current based on maximum allowable
junction temperature; Package limitation current = 20A.
IRLR/U2905PbF
www.irf.com 3
Fig 4. Normalized On-Resistance
Vs. Temperature
Fig 2. Typical Output CharacteristicsFig 1. Typical Output Characteristics
Fig 3. Typical Transfer Characteristics
1
10
100
1000
0.1 1 10 100
I , Drain-to-Source Current (A)
D
V , Drain-to-Source Voltage (V)
DS
A
20µs PULSE WIDTH
T = 25°C
J
VGS
TOP 15V
12V
10V
8.0V
6.0V
4.0V
3.0V
BOTTOM 2.5V
2.5V
1
10
100
1000
0.1 1 10 100
I , Drain-to-Source Current (A)
D
V , Drain-to-Source Voltage (V)
DS
A
20µs PULSE WIDTH
T = 175°C
VGS
TOP 15V
12V
10V
8.0V
6.0V
4.0V
3.0V
BOTTOM 2.5V
2.5V
J
1
10
100
1000
2.0 3.0 4.0 5.0 6.0 7.0 8.0 9.0
T = 25°C
J
GS
V , Gate-to-Source Voltage (V)
D
I , Drain-to-Source Current (A)
T = 175°C
J
A
V = 25V
20µs PULSE WIDTH
DS
0.0
0.5
1.0
1.5
2.0
2.5
3.0
-60 -40 -20 0 20 40 60 80 100 120 140 160 180
J
T , Junction Temperature (°C)
R , Drain-to-Source On Resistance
DS(on)
(Normalized)
V = 10V
GS
A
I = 41A
D

IRLR2905TRPBF

Mfr. #:
Manufacturer:
Infineon / IR
Description:
MOSFET 55V 1 N-CH HEXFET 27mOhms 32nC
Lifecycle:
New from this manufacturer.
Delivery:
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