TJA1028 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 4 — 25 July 2012 13 of 24
NXP Semiconductors
TJA1028
LIN transceiver with integrated voltage regulator
11. Dynamic characteristics
Fig 6. Graph of R
(VBAT-VCC)(typ)
as a function of junction temperature (T
vj
)
T
vj
(°C)
-50 0 50 100 150
001aan953
4
5
3
6
7
2
R
(VBAT-VCC)(typ)
(Ω)
Table 7. Dynamic characteristics
V
BAT
= 5.5 V to 18 V; T
vj
=
40
C to +150
C; R
L(LIN-VBAT)
= 500
; all voltages are defined with respect to ground; positive
currents flow into the IC; typical values are given at V
BAT
= 12 V; unless otherwise specified.
[1]
Symbol Parameter Conditions Min Typ Max Unit
Duty cycles
1 duty cycle 1 V
th(rec)(max)
= 0.744V
BAT
;
V
th(dom)(max)
= 0.581V
BAT
;
t
bit
=50s;
V
BAT
= 7 V to 18 V
[2][3]
[4][5]
0.396 - -
V
th(rec)(max)
= 0.76V
BAT
;
V
th(dom)(max)
= 0.593V
BAT
;
t
bit
=50s;
V
BAT
= 5.5 V to 7.0 V
[2][3]
[4][5]
0.396 - -
2 duty cycle 2 V
th(rec)(min)
= 0.422V
BAT
;
V
th(dom)(min)
= 0.284V
BAT
:
t
bit
=50s;
V
BAT
= 7.6 V to 18 V
[2][4]
[5][6]
- - 0.581
V
th(rec)(min)
= 0.41V
BAT
;
V
th(dom)(min)
= 0.275V
BAT
;
t
bit
=50s;
V
BAT
= 6.1 V to 7.6 V
[2][4]
[5][6]
- - 0.581
3 duty cycle 3 V
th(rec)(max)
= 0.778V
BAT
;
V
th(dom)(max)
= 0.616V
BAT
;
t
bit
=96s;
V
BAT
= 7 V to 18 V
[3][4]
[5]
0.417 - -
V
th(rec)(max)
= 0.797V
BAT
;
V
th(dom)(max)
= 0.630V
BAT
;
t
bit
=96s;
V
BAT
= 5.5 V to 7 V
[3][4]
[5]
0.417 - -
TJA1028 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 4 — 25 July 2012 14 of 24
NXP Semiconductors
TJA1028
LIN transceiver with integrated voltage regulator
[1] All parameters are guaranteed over the virtual junction temperature range by design. Factory testing uses correlated test conditions to
cover the specified temperature and power supply voltage ranges.
[2] Not applicable to the low slope versions (TJA1028T/xxx/10 and TJA1028TK/xxx/10) of the TJA1028.
[3] . Variable t
bus(rec)(min)
is illustrated in the LIN timing diagram in Figure 8.
[4] Bus load conditions are: C
BUS
= 1 nF and R
BUS
=1k; C
BUS
= 6.8 nF and R
BUS
=660; C
BUS
= 10 nF and R
BUS
= 500 .
[5] For V
BAT
> 18 V, the LIN transmitter might be suppressed. If TXD is HIGH then the LIN transmitter output is recessive.
[6] . Variable t
bus(rec)(max)
is illustrated in the LIN timing diagram in Figure 8.
[7] Not tested in production; guaranteed by design.
4 duty cycle 4 V
th(rec)(min)
= 0.389V
BAT
V
th(dom)(min)
= 0.251V
BAT
t
bit
=96s
V
BAT
= 7.6 V to 18 V
[4][5]
[6]
- - 0.590
V
th(rec)(min)
= 0.378V
BAT
;
V
th(dom)(min)
= 0.242V
BAT
;
t
bit
=96s;
V
BAT
= 6.1 V to 7.6 V
[4][5]
[6]
- - 0.590
Timing characteristics
t
rx_pd
receiver propagation delay rising and falling;
C
RXD
= 20 pF
-- 6s
t
rx_sym
receiver propagation delay symmetry C
RXD
=20pF 2- +2s
t
wake(dom)LIN
LIN dominant wake-up time Sleep mode 30 80 150 s
t
to(dom)TXD
TXD dominant time-out time V
TXD
=0V 6 - 20 ms
t
msel
mode select time 3 - 20 s
t
d(EN-TXD)
delay time from EN to TXD
[7]
0- 1s
t
det(uv)(VCC)
undervoltage detection time on pin V
CC
C
RSTN
= 20 pF 1 - 15 s
Reset output; pin RSTN
t
rst
reset time 2 - 8 ms
Table 7. Dynamic characteristics
…continued
V
BAT
= 5.5 V to 18 V; T
vj
=
40
C to +150
C; R
L(LIN-VBAT)
= 500
; all voltages are defined with respect to ground; positive
currents flow into the IC; typical values are given at V
BAT
= 12 V; unless otherwise specified.
[1]
Symbol Parameter Conditions Min Typ Max Unit
2 4
t
bus recmax
2t
bit
--------------------------------
=
Fig 7. Timing test circuit for LIN transceiver
TJA1028
V
BAT
TXD
R
LIN
C
LIN
RXD
C
RXD
LIN
GND
015aaa198
TJA1028 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 4 — 25 July 2012 15 of 24
NXP Semiconductors
TJA1028
LIN transceiver with integrated voltage regulator
12. Test information
12.1 Quality information
This product has been qualified in accordance with the Automotive Electronics Council
(AEC) standard Q100 - Failure mechanism based stress test qualification for integrated
circuits, and is suitable for use in automotive applications.
Fig 8. LIN transceiver timing diagram
015aaa199
V
TXD
V
BAT
t
bit
t
bus(rec)(min)
V
th(rec)(max)
thresholds of
receiving node A
V
th(dom)(max)
V
th(rec)(min)
V
th(dom)(min)
t
rx_pdr
t
rx_pdf
t
rx_pdr
t
rx_pdf
t
bus(rec)(max)
t
bit
t
bit
thresholds of
receiving node B
output of receiving
node A
V
RXD
output of receiving
node B
V
RXD
t
bus(dom)(max)
t
bus(dom)(min)
LIN bus
signal

TJA1028T/5V0/10,11

Mfr. #:
Manufacturer:
NXP Semiconductors
Description:
LIN Transceivers 5V 850uA 6us
Lifecycle:
New from this manufacturer.
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