Electrical characteristics
STP16N60M2, STU16N60M2
4/16
DocID027198 Rev 1
2 Electrical characteristics
(T
C
= 25 °C unless otherwise specified).
Table 5: Static
Symbol Parameter Test conditions Min. Typ. Max. Unit
V
(BR)DSS
Drain-source breakdown
voltage
V
GS
= 0 V, I
D
= 1 mA 600
V
I
DSS
Zero gate voltage drain
current
V
GS
= 0 V, V
DS
= 600 V
1 µA
V
GS
= 0 V, V
DS
= 600 V,
T
C
= 125 °C
100 µA
I
GSS
Gate-body leakage current
V
DS
= 0 V, V
GS
= ±25 V
±10 µA
V
GS(th)
Gate threshold voltage V
DS
= V
GS
, I
D
= 250 µA
2
3 4 V
R
DS(on)
Static drain-source on-
resistance
V
GS
= 10 V, I
D
= 6 A
0.28 0.32 Ω
Table 6: Dynamic
Symbol Parameter Test conditions Min. Typ. Max. Unit
C
iss
Input capacitance
V
DS
= 100 V, f = 1 MHz,
V
GS
= 0 V
- 700 - pF
C
oss
Output capacitance - 38 - pF
C
rss
Reverse transfer
capacitance
- 1.2 - pF
C
oss eq.
(1)
Equivalent output
capacitance
V
DS
= 0 V to 480 V, V
GS
= 0 V - 140 - pF
R
G
Intrinsic gate resistance f = 1 MHz open drain - 5.3 - Ω
Q
g
Total gate charge
V
DD
= 480 V, I
D
= 12 A,
V
GS
= 10 V (see Figure 17:
"Gate charge test circuit")
- 19 - nC
Q
gs
Gate-source charge - 3.3 - nC
Q
gd
Gate-drain charge - 9.5 - nC
Notes:
(1)
C
oss eq.
is defined as a constant equivalent capacitance giving the same charging time as C
oss
when V
DS
increases from 0 to 80% V
DSS
.
Table 7: Switching times
Symbol Parameter Test conditions Min. Typ. Max. Unit
t
d(on)
Turn-on delay time V
DD
= 300 V, I
D
= 6 A
R
G
= 4.7 Ω, V
GS
= 10 V (see
Figure 16: "Switching times
test circuit for resistive load"
and Figure 21: "Switching
time waveform")
- 10.5 - ns
t
r
Rise time - 9.5 - ns
t
d(off)
Turn-off-delay time - 58 - ns
t
f
Fall time - 18.5 - ns
STP16N60M2, STU16N60M2
Electrical characteristics
DocID027198 Rev 1
5/16
Table 8: Source-drain diode
Symbol Parameter Test conditions Min. Typ. Max. Unit
I
SD
Source-drain current
-
12 A
I
SDM
(1)
Source-drain current
(pulsed)
-
48 A
V
SD
(2)
Forward on voltage V
GS
= 0 V, I
SD
= 12 A -
1.6 V
t
rr
Reverse recovery time I
SD
= 12 A, di/dt = 100 A/µs,
V
DD
= 60 V (see Figure 18:
"Test circuit for inductive load
switching and diode recovery
times")
- 316
ns
Q
rr
Reverse recovery charge - 3.25
µC
I
RRM
Reverse recovery current - 20.5
A
t
rr
Reverse recovery time I
SD
= 12 A, di/dt = 100 A/µs,
V
DD
= 60 V, T
j
= 150 °C (see
Figure 18: "Test circuit for
inductive load switching and
diode recovery times")
- 454
ns
Q
rr
Reverse recovery charge - 4.8
µC
I
RRM
Reverse recovery current - 21
A
Notes:
(1)
Pulse width is limited by safe operating area.
(2)
Pulse test: pulse duration = 300 µs, duty cycle 1.5%.
Electrical characteristics
STP16N60M2, STU16N60M2
6/16
DocID027198 Rev 1
2.1 Electrical characteristics (curves)
Figure 2: TO-220 safe operating area
Figure 3: TO-220 thermal impedance
Figure 4: IPAK safe operating area
Figure 5: IPAK thermal impedance
Figure 6: Output characteristics
Figure 7: Transfer characteristics
CG20930
t
p
Z
th
= k R
thj-C
δ = t
p
/ Ƭ
10
-2
10
-1
K
Ƭ
δ = 0.5
δ = 0.2
δ = 0.1
δ = 0.01
δ = 0.02
δ = 0.05
SINGLE PULSE
Z
th
= k R
thj-C
δ = t
p
/ Ƭ
t
p
Ƭ
t
p
(s)
10
-1
10
-2
10
-3
10
-4
10
-5
GC20460
K
T
p
(s)
10
2
10
-3
10
-4
10
-5
10
1
10
-2
10
-1
10
0
δ = 0.5
δ = 0.2
δ = 0.1
δ = 0.01
SINGLE PULSE
δ = 0.02
δ = 0.05
t
p
Ƭ
Z
th
= KR
thj-c
δ = t
p
/ Ƭ

STU16N60M2

Mfr. #:
Manufacturer:
STMicroelectronics
Description:
MOSFET N-channel 600 V, 0.28 Ohm typ., 12 A MDmesh M2 Power MOSFET in IPAK package
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union

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