ADN2811 Data Sheet
Rev. C | Page 12 of 20
FUNCTIONAL DESCRIPTION
CLOCK AND DATA RECOVERY
The ADN2811 recovers clock and data from serial bit streams at
OC-48 as well as the 15/14 FEC rates. The data rate is selected
by the RATE input (see Table 4).
Table 4. Data Rate Selection
RATE
Data Rate
Frequency (MHz)
0 OC-48 2488.32
1 OC-48 FEC 2666.06
LIMITING AMPLIFIER
The limiting amplifier has differential inputs (PIN/NIN) that
are internally terminated with 50 Ω to an on-chip voltage ref-
erence (VREF = 0.6 V typically). These inputs are normally
ac-coupled, although dc coupling is possible as long as the input
common-mode voltage remains above 0.4 V (see Figure 22,
Figure 23, and Figure 24). Input offset is factory trimmed to
achieve better than 4 mV typical sensitivity with minimal drift.
The limiting amplifier can be driven differentially or single-
ended.
SLICE ADJUST
The quantizer slicing level can be offset by ±100 mV to mitigate
the effect of amplified spontaneous emission (ASE) noise by
applying a differential voltage input of ±0.8 V to SLICEP/N
inputs. If no adjustment of the slice level is needed, SLICEP/N
must be tied to VCC.
LOSS OF SIGNAL (LOS) DETECTOR
The receiver front end level signal detect circuit indicates when
the input signal level has fallen below a user adjustable threshold.
The threshold is set with a single external resistor from Pin 1,
THRADJ, to GND. The LOS comparator trip point versus the
resistor value is illustrated in Figure 4 (this is only valid for
SLICEP = SLICEN = VCC). If the input level to the ADN2811
drops below the programmed LOS threshold, SDOUT (Pin 45)
indicates the loss of signal condition with a Logic 1. The LOS
response time is ~300 ns by design, but is dominated by the RC
time constant in ac-coupled applications.
If using the LOS detector, the quantizer slice adjust pins must
both be tied to VCC. This is to avoid interaction with the LOS
threshold level.
Note that it is not expected to use both LOS and slice adjust at
the same time; systems with optical amplifiers need the slice
adjust to evade ASE. However, a loss of signal in an optical link
that uses optical amplifiers causes the optical amplifier output
to be full-scale noise. Under this condition, the LOS does not
detect the failure. In this case, the loss of lock signal indicates
the failure because the CDR circuitry is unable to lock onto a
signal that is full-scale noise.
REFERENCE CLOCK
There are three options for providing the reference frequency to
the ADN2811: differential clock, single-ended clock, or crystal
oscillator. See Figure 14, Figure 15, and Figure 16 for example
configurations.
100k
100k
B
UFFER
ADN2811
VCC/2
REFCLK
N
REFCLK
P
CRYSTAL
OSCILLATO
R
XO1
XO2
VCC
VCC
VC
C
REFSEL
03019-B-014
Figure 14. Differential REFCLK Configuration
OUT
100k 100k
BUFFER
ADN2811
VCC/2
REFCLKN
REFCLKP
CRYSTAL
OSCILLATOR
XO
1
XO2
VCC
VC
C
VCC
REFSEL
CLK
OSC
VCC
NC
03019-B-015
Figure 15. Single-Ended REFCLK Configuration
100k 100k
BUFFER
ADN2811
VCC/2
REFCLKN
REFCLK
P
CRYSTAL
OSCILLATOR
XO1
XO2
REFSEL
NC
19.44MHz
VCC
003019-B-016
Figure 16. Crystal Oscillator Configuration
Data Sheet ADN2811
Rev. C | Page 13 of 20
The ADN2811 can accept any of the following reference clock
frequencies: 19.44 MHz, 38.88 MHz, 77.76 MHz at LVTTL/
LVCMOS/LVPECL/LVDS levels, or 155.52 MHz at LVPECL/
LVDS levels via the REFCLKN/P inputs, independent of data
rate. The input buffer accepts any differential signal with a peak-to-
peak differential amplitude of greater than 100 mV (for example,
LVPECL or LVDS) or a standard single-ended low voltage TTL
input, providing maximum system flexibility. The appropriate
division ratio can be selected using the REFSEL0/1 pins, according
to Table 5. Phase noise and duty cycle of the reference clock are
not critical, and 100 ppm accuracy is sufficient.
Table 5. Reference Frequency Selection
REFSEL
REFSEL[1..0]
Applied Reference Frequency (MHz)
1 00 19.44
1
01
38.88
1 10 77.76
1 11 155.52
0 XX REFCLKP/N Inactive. Use 19.44 MHz
XTAL oscillator on Pins XO1, XO2 (Pull
REFCLKP to VCC).
An on-chip oscillator to be used with an external crystal is also
provided as an alternative to using the REFCLKN/P inputs.
Details of the recommended crystal are given in Table 6.
Table 6. Required Crystal Specifications
Parameter Value
Mode Series Resonant
Frequency/Overall Stability 19.44 MHz ±100 ppm
Frequency Accuracy ±100 ppm
Temperature Stability ±100 ppm
Aging ±100 ppm
ESR 50 max
REFSEL must be tied to VCC when the REFCLKN/P inputs are
active, or tied to VEE when the oscillator is used. No connection
between the XO pin and REFCLK input is necessary (see Figure 14,
Figure 15, and Figure 16). Note that the crystal must operate in
series resonant mode, which renders it insensitive to external
parasitics. No trimming capacitors are required.
LOCK DETECTOR OPERATION
The lock detector monitors the frequency difference between
the VCO and the reference clock and deasserts the loss of lock
signal when the VCO is within 500 ppm of center frequency
(see Figure 17). This enables the phase loop, which pulls the
VCO frequency in the remaining amount and also acquires
phase lock. Once locked, if the input frequency error exceeds
1000 ppm (0.1%), the loss of lock signal is reasserted and control
returns to the frequency loop, which reacquires and maintains
a stable clock signal at the output.
The frequency loop requires a single external capacitor between
CF1 and CF2. The capacitor specification is given in Table 7.
Table 7. Recommended C
F
Capacitor Specification
Parameter Value
Temperature Range −40°C to +85°C
Capacitance >3.0 µF
Leakage <80 nA
Rating >6.3 V
1000 500 0 500
1000 f
VCO
ERROR
(
ppm)
LOL
1
03019-B-017
Figure 17. Transfer Function of LOL
ADN2811 Data Sheet
Rev. C | Page 14 of 20
50
50
Q
UANTIZER
+
ADN2811
VREF
NIN
PI
N
50 50
VCC
TDINP/N
LOOPEN BY
P
ASS
CDR
RETIMED
DA
T
A CL
K
0
1
1 0
DATAOUTP/N CLKOUTP/N SQUELCH
FROM
Q
U
ANTIZER
OUTPU
T
03019-B-018
Figure 18. Test Modes
SQUELCH MODE
When the squelch input is driven to a TTL high state, both the
clock and data outputs are set to the zero state to suppress
downstream processing. If desired, this pin can be directly
driven by the LOS detector output, SDOUT. If the squelch
function is not required, the pin must be tied to VEE.
TEST MODES: BYPASS AND LOOPBACK
When the bypass input is driven to a TTL high state, the
quantizer output is connected directly to the buffers driving the
data out pins, thus bypassing the clock recovery circuit (see
Figure 18). This feature can help the system deal with
nonstandard bit rates.
The loopback mode can be invoked by driving the LOOPEN pin
to a TTL high state, which facilitates system diagnostic testing.
This connects the test inputs (TDINP/N) to the clock and data
recovery circuit (per Figure 18). The test inputs have internal
50terminations and can be left floating when not in use.
TDINP/N are CML inputs and can only be dc-coupled when
being driven by CML outputs. The TDINP/N inputs must be
ac-coupled if being driven by anything other than CML outputs.
Bypass and loopback modes are mutually exclusive. Only one of
these modes can be used at any given time. The ADN2811 is put
into an indeterminate state if the BYPASS and LOOPEN pins are
set to Logic 1 at the same time.

ADN2811ACPZ-CML-RL

Mfr. #:
Manufacturer:
Analog Devices Inc.
Description:
IC CLK DATA REC SDH 2.66GHZ
Lifecycle:
New from this manufacturer.
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