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ADG731BSUZ

P1-P3P4-P6P7-P9P10-P12P13-P15P16-P17
–4–
ADG725/ADG731
DUAL-SUPPLY SPECIFICATIONS
1
(V
DD
= +2.5 V 10%, V
SS
= –2.5 V 10%, GND = 0 V,
unless otherwise noted.)
B Version
Parameter +25⬚C –40⬚C to +85⬚C Unit Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range V
SS
to V
DD
V
On Resistance (R
ON
)4 Ω typ V
S
= V
SS
to V
DD
, I
DS
= 10 mA;
5.56 Ω max Test Circuit 1
On Resistance Match Between 0.3 Ω typ V
S
= V
SS
to V
DD
, I
DS
= 10 mA
Channels (ΔR
ON
)0.8 Ω max
On Resistance Flatness (R
FLAT(ON)
)0.5 Ω typ V
S
= V
SS
to V
DD
, I
DS
= 10 mA
1 Ω max
LEAKAGE CURRENTS V
DD
= +2.75 V, V
SS
= –2.75 V
Source OFF Leakage I
S
(OFF) ± 0.01 nA typ
V
S
= +2.25 V/–1.25 V, V
D
= –1.25 V/+2.25 V;
± 0.25 ± 0.5 nA max Test Circuit 2
Drain OFF Leakage I
D
(OFF) ± 0.05 nA typ
V
S
= +2.25 V/–1.25 V, V
D
= –1.25 V/+2.25 V;
ADG725 ± 0.5 ± 2.5 nA max Test Circuit 3
ADG731 ± 1 ± 5 nA max
Channel ON Leakage I
D
, I
S
(ON) ±0.01 nA typ
V
S
= V
D
= +2.25 V/–1.25 V; Test Circuit 4
ADG725 ± 0.5 ± 2.5 nA max
ADG731 ± 1 ± 5 nA max
DIGITAL INPUTS
Input High Voltage, V
INH
1.7V min
Input Low Voltage, V
INL
0.7 V max
Input Current
I
INL
or I
INH
0.005 μA typ V
IN
= V
INL
or V
INH
± 0.5 μA max
C
IN
, Digital Input Capacitance 5 pF typ
DYNAMIC CHARACTERISTICS
2
t
TRANSITION
55 ns typ R
L
= 300 Ω, C
L
= 35 pF; Test Circuit 5
75 84 ns max V
S1
= 1.5 V/0 V, V
S32
= 0 V/1.5 V
Break-Before-Make Time Delay, t
D
15 ns typ R
L
= 300 Ω, C
L
= 35 pF
1 ns minV
S
= 1.5 V; Test Circuit 6
Charge Injection 1 pC typ V
S
= 0 V, R
S
= 0 Ω, C
L
= 1 nF; Test Circuit 7
Off Isolation –72 dB typ R
L
= 50 Ω, C
L
= 5 pF, f = 1 MHz;
Test Circuit 8
Channel-to-Channel Crosstalk –72 dB typ R
L
= 50 Ω, C
L
= 5 pF, f = 1 MHz;
Test Circuit 9
–3 dB Bandwidth
ADG725 34 MHz typ R
L
= 50 Ω, C
L
= 5 pF; Test Circuit 10
ADG731 18 MHz typ
C
S
(OFF) 13 pF typ
C
D
(OFF)
ADG725 130 pF typ f = 1 MHz
ADG731 260 pF typ f = 1 MHz
C
D
, C
S
(ON)
ADG725 150 pF typ f = 1 MHz
ADG731 300 pF typ f = 1 MHz
POWER REQUIREMENTS V
DD
= +2.75 V
I
DD
10 μA typ Digi tal Inputs = 0 V or 2.75 V
20 μA max
I
SS
10 μA typ V
SS
= –2.75 V
20 μA max Digital Inputs = 0 V or 2.75 V
NOTES
1
Temperature range is as follows: B Version: –40°C to +85°C.
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
REV. B
ADG725/ADG731
–5–
TIMING CHARACTERISTICS
1, 2
Parameter Limit at T
MIN
, T
MAX
Unit Conditions/Comments
f
SCLK
30 MHz max SCLK Cycle Frequency
t
1
33 ns min SCLK Cycle Time
t
2
13 ns min SCLK High Time
t
3
13 ns min SCLK Low Time
t
4
13 ns min SYNC to SCLK Falling Edge Setup Time
t
5
40 ns minMinimum SYNC Low Time
t
6
5 ns min Data Setup Time
t
7
4.5 ns min Data Hold Time
t
8
33 ns minMinimum SYNC High Time
NOTES
1
See Figure 1.
2
All input signals are specified with tr = tf = 5 ns (10% to 90% of V
DD
) and timed from a voltage level of (V
IL
+ V
IH
)/2.
Specifications subject to change without notice.
SCLK
SYNC
DIN
DB7
DB0
t
8
t
4
t
5
t
6
t
7
t
2
t
3
t
1
Figure 1. 3-Wire Serial Interface Timing Diagram
A3 A2 A1 A0
EN
CSA
X
DB0 (LSB)
DB7 (MSB)
DATA BITS
CSB
Figure 2. ADG725 Input Shift Register Contents
A3 A2 A1 A0
EN CS
X
DB0 (LSB)
DB7 (MSB)
DATA BITS
A4
Figure 3. ADG731 Input Shift Register Contents
REV. B
–6–
ADG725/ADG731
CAUTION
ESD (electrostati c discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equi pment and can discharge without detection. Although the
ADG725/ADG731 features propri etary ESD protection circuitry, permanent damage may occur on
devi ces subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are
recommended to avoi d performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE
ABSOLUTE MAXIMUM RATINGS
1
(T
A
= 25°C, unless otherwise noted.)
V
DD
to V
SS
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7 V
V
DD
to GND . . . . . . . . . . . . . . . . . . . . . . . . . . .–0.3 V to +7 V
V
SS
to GND . . . . . . . . . . . . . . . . . . . . . . . . . . . .+0.3 V to –7 V
Analog Inputs
2
. . . . . . . . . . . . . . V
SS
– 0.3 V to V
DD
+ 0.3 V or
30 mA, Whichever Occurs First
Digital Inputs
2
. . . . . . . . . . . . . . . . . . –0.3 V to V
DD
+ 0.3 V or
30 mA, Whichever Occurs First
Peak Current, S or D . . . . . . . . . . . . . . . . . . . . . . . . . . . 60 mA
(Pulsed at 1 ms, 10% Duty Cycle max)
Continuous Current, S or D . . . . . . . . . . . . . . . . . . . . . 30 mA
Operating Temperature Range
Industrial (B Version) . . . . . . . . . . . . . . . . –40°C to +85°C
Storage Temperature Range . . . . . . . . . . . . –65°C to +150°C
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . 150°C
Thermal Impedance (4-Layer Board)
48-lead LFCSP . . . . . . . . . . . . . . . . . . . . . . . . . . . 25°C/W
48-lead TQFP . . . . . . . . . . . . . . . . . . . . . . . . . . . 54.6°C/W
Lead Temperature, Soldering (10 seconds) . . . . . . . . . . 300°C
IR Reflow, Peak Temperature (<20 seconds) . . . . . . . . 235°C
NOTES
1
Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those listed in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability. Only one absolute
maximum rating may be applied at any one time.
2
Overvoltages at SCLK, SYNC, DIN, S, or D will be clamped by internal diodes.
Current should be limited to the maximum ratings given.
REV. B
P1-P3P4-P6P7-P9P10-P12P13-P15P16-P17

ADG731BSUZ

Mfr. #:
Buy ADG731BSUZ
Manufacturer:
Analog Devices Inc.
Description:
Multiplexer Switch ICs 32:1 18MHz 4 Ohm Serially Controlled
Lifecycle:
New from this manufacturer.
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