MRF6S23100HR3 MRF6S23100HSR3
7
RF Device Data
Freescale Semiconductor
TYPICAL CHARACTERISTICS
Figure 12. MTTF Factor versus Junction Temperature
210
10
8
90
10
7
10
6
10
5
190
MTTF FACTOR (HOURS x AMPS
2
)
170150130110 230 250
This above graph displays calculated MTTF in hours when the device
is operated at V
DD
= 28 Vdc, P
out
= 20 W Avg., and η
D
= 23.5%.
MTTF calculator available at http://www.freescale.com/rf. Select
Software & Tools/Development Tools/Calculators to access MTTF
calculators by product.
T
J
, JUNCTION TEMPERATURE (°C)
W-CDMA TEST SIGNAL
10
0.0001
100
0
PEAK-T O-AVERAGE (dB)
Figure 13. CCDF W-CDMA 3GPP, Test Model 1,
64 DPCH, 67% Clipping, Single-Carrier Test Signal
10
1
0.1
0.01
0.001
24 68
Figure 14. 2‐Carrier W‐CDMA Spectrum
f, FREQUENCY (MHz)
3.84 MHz
Channel BW
-IM3 in
3.84 MHz BW
+IM3 in
3.84 MHz BW
-ACPR in
3.84 MHz BW
+ACPR in
3.84 MHz BW
PROBABILITY (%)
(dB)
+20
+30
0
-10
-40
-50
-60
-70
-80
-20
20515100-5-10-15-2 0-25 2
-30
W-CDMA. ACPR Measured in 3.84 MHz Channel
Bandwidth @ ±5 MHz Offset. IM3 Measured in
3.84 MHz Bandwidth @ ±10 MHz Offset. PAR =
8.5 dB @ 0.01% Probability on CCDF
