CY7C15632KV18
Document Number: 001-54932 Rev. *K Page 22 of 30
AC Test Loads and Waveforms
Figure 5. AC Test Loads and Waveforms
1.25 V
0.25 V
R = 50
5pF
INCLUDING
JIG AND
SCOPE
ALL INPUT PULSES
Device
R
L
= 50
Z
0
= 50
V
REF
= 0.75 V
V
REF
= 0.75V
[29]
0.75 V
Under
Test
0.75 V
Device
Under
Test
OUTPUT
0.75 V
V
REF
V
REF
OUTPUT
ZQ
ZQ
(a)
Slew Rate = 2 V/ns
RQ =
250
(b)
RQ =
250
Note
29. Unless otherwise noted, test conditions are based on signal transition time of 2 V/ns, timing reference levels of 0.75 V, V
REF
= 0.75 V, RQ = 250 , V
DDQ
= 1.5 V,
input pulse levels of 0.25 V to 1.25 V, and output loading of the specified I
OL
/I
OH
and load capacitance shown in (a) of Figure 5.
CY7C15632KV18
Document Number: 001-54932 Rev. *K Page 23 of 30
Switching Characteristics
Over the Operating Range
Parameters
[30, 31]
Description
500 MHz 450 MHz 400 MHz
Unit
Cypress
Parameter
Consortium
Parameter
Min Max Min Max Min Max
t
POWER
V
DD
(typical) to the First Access
[32]
1–1–1–ms
t
CYC
t
KHKH
K Clock Cycle Time 2.0 8.4 2.2 8.4 2.5 8.4 ns
t
KH
t
KHKL
Input Clock (K/K) HIGH
0.4–0.4–0.4–ns
t
KL
t
KLKH
Input Clock (K/K) LOW
0.4–0.4–0.4–ns
t
KHKH
t
KHKH
K Clock Rise to K Clock Rise (rising edge to rising
edge)
0.85 0.94 1.06 ns
Setup Times
t
SA
t
AVKH
Address Setup to K Clock Rise 0.25 0.275 0.4 ns
t
SC
t
IVKH
Control Setup to K Clock Rise (RPS, WPS)
0.25 0.275 0.4 ns
t
SCDDR
t
IVKH
Double Data Rate Control Setup to Clock (K/K) Rise
(BWS
0
, BWS
1
,
BWS
2
, BWS
3
)
0.20 0.22 0.28 ns
t
SD
t
DVKH
D
[X:0]
Setup to Clock (K/K) Rise
0.20 0.22 0.28 ns
Hold Times
t
HA
t
KHAX
Address Hold after K Clock Rise
0.25 0.275 0.4 ns
t
HC
t
KHIX
Control Hold after K Clock Rise (RPS, WPS) 0.25 0.275 0.4 ns
t
HCDDR
t
KHIX
Double Data Rate Control Hold after Clock (K/K) Rise
(BWS
0
, BWS
1
, BWS
2
, BWS
3
)
0.20 0.28 0.28 ns
t
HD
t
KHDX
D
[X:0]
Hold after Clock (K/K) Rise
0.20 0.28 0.28 ns
Output Times
t
CO
t
CHQV
K/K Clock Rise to Data Valid
–0.45–0.45–0.45ns
t
DOH
t
CHQX
Data Output Hold after Output K/K Clock Rise (Active
to Active)
–0.45 –0.45 –0.45 ns
t
CCQO
t
CHCQV
K/K Clock Rise to Echo Clock Valid
–0.45–0.45–0.45ns
t
CQOH
t
CHCQX
Echo Clock Hold after K/K Clock Rise
–0.45 –0.45 –0.45 ns
t
CQD
t
CQHQV
Echo Clock High to Data Valid 0.15 0.15 0.20 ns
t
CQDOH
t
CQHQX
Echo Clock High to Data Invalid –0.15 –0.15 –0.20 ns
t
CQH
t
CQHCQL
Output Clock (CQ/CQ) HIGH
[33]
0.75 0.85 1.0 ns
t
CQHCQH
t
CQHCQH
CQ Clock Rise to CQ Clock Rise
(rising edge to rising
edge)
[33]
0.75 0.85 1.0 ns
Notes
30. Unless otherwise noted, test conditions are based on signal transition time of 2 V/ns, timing reference levels of 0.75 V, V
REF
= 0.75 V, RQ = 250 , V
DDQ
= 1.5 V,
input pulse levels of 0.25 V to 1.25 V, and output loading of the specified I
OL
/I
OH
and load capacitance shown in (a) of Figure 5 on page 22.
31. When a part with a maximum frequency above 400 MHz is operating at a lower clock frequency, it requires the input timings of the frequency range in which it is being
operated and outputs data with the output timings of that frequency range.
32. This part has a voltage regulator internally; t
POWER
is the time that the power must be supplied above V
DD
minimum initially before a read or write operation can be
initiated.
33. These parameters are extrapolated from the input timing parameters (t
CYC
/2 – 250 ps, where 250 ps is the internal jitter). These parameters are only guaranteed by
design and are not tested in production.
CY7C15632KV18
Document Number: 001-54932 Rev. *K Page 24 of 30
t
CHZ
t
CHQZ
Clock (K/K) Rise to High Z (Active to High Z)
[34, 35]
–0.45–0.45–0.45ns
t
CLZ
t
CHQX1
Clock (K/K) Rise to Low Z
[34, 35]
–0.45 –0.45 –0.45 ns
t
QVLD
t
CQHQVLD
Echo Clock High to QVLD Valid
[36]
–0.15 0.15 –0.15 0.15 –0.20 0.20 ns
PLL Timing
t
KC Var
t
KC Var
Clock Phase Jitter 0.15 0.15 0.20 ns
t
KC lock
t
KC lock
PLL Lock Time (K) 20–20–20–s
t
KC Reset
t
KC Reset
K Static to PLL Reset
[37]
30–30–30–ns
Switching Characteristics (continued)
Over the Operating Range
Parameters
[30, 31]
Description
500 MHz 450 MHz 400 MHz
Unit
Cypress
Parameter
Consortium
Parameter
Min Max Min Max Min Max
Notes
34. t
CHZ
, t
CLZ
, are specified with a load capacitance of 5 pF as in (b) of Figure 5 on page 22. Transition is measured ±100 mV from steady-state voltage.
35. At any voltage and temperature t
CHZ
is less than t
CLZ
and t
CHZ
less than t
CO
.
36. t
QVLD
spec is applicable for both rising and falling edges of QVLD signal.
37. Hold to >V
IH
or <V
IL
.

CY7C15632KV18-450BZXC

Mfr. #:
Manufacturer:
Cypress Semiconductor
Description:
SRAM 72MB (4Mx18) 1.8v 450MHz QDR II SRAM
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union