83905-01 DATA SHEET
LOW SKEW, 1:6 CRYSTAL-TO-LVCMOS FANOUT BUFFER 4 REVISION 1 05/01/15
Table 4D. Power Supply DC Characteristics, V
DD
= 1.8V ±0.2V, V
DDO
= 1.5V ±0.1V, T
A
= 0°C to 70°C
NOTE 1: Measured with outputs unterminated, and XTAL_IN and XTAL_OUT floated.
Table 4E. Power Supply DC Characteristics, V
DD
= 1.8V ±0.2V, V
DDO
= 1.2V ±5%, T
A
= 0°C to 70°C
NOTE 1: Measured with outputs unterminated, and XTAL_IN and XTAL_OUT floated.
Table 4F. Power Supply DC Characteristics, V
DD
= 1.5V ±0.1V, V
DDO
= 1.2V ±5%, T
A
= 0°C to 70°C
NOTE 1: Measured with outputs unterminated, and XTAL_IN and XTAL_OUT floated.
Table 4G. LVCMOS/LVTTL DC Characteristics, T
A
= 0°C to 70°C
NOTE 1: Outputs terminated with 50 to V
DDO
/2. See Parameter Measurement Information, Output Load Test Circuit diagrams.
Symbol Parameter Test Conditions Minimum Typical Maximum Units
V
DD
Power Supply Voltage 1.6 1.8 2.0 V
V
DDO
Output Supply Voltage 1.4 1.5 1.6 V
I
DD
; NOTE 1 Power Supply Current ENABLE [1:2] = 00 4 10 mA
I
DDO
; NOTE 1 Output Supply Current ENABLE [1:2] = 00 1 mA
Symbol Parameter Test Conditions Minimum Typical Maximum Units
V
DD
Power Supply Voltage 1.6 1.8 2.0 V
V
DDO
Output Supply Voltage 1.14 1.2 1.26 V
I
DD
; NOTE 1 Power Supply Current ENABLE [1:2] = 00 4 10 mA
I
DDO
; NOTE 1 Output Supply Current ENABLE [1:2] = 00 1 mA
Symbol Parameter Test Conditions Minimum Typical Maximum Units
V
DD
Power Supply Voltage 1.4 1.5 1.6 V
V
DDO
Output Supply Voltage 1.14 1.2 1.26 V
I
DD
; NOTE 1 Power Supply Current ENABLE [1:2] = 00 3 7 mA
I
DDO
; NOTE 1 Output Supply Current ENABLE [1:2] = 00 1 mA
Symbol Parameter Test Conditions Minimum Typical Maximum Units
V
IH
Input High Voltage
V
DD
= 1.8V ± 0.2V 1.2 V
DD
+ 0.3 V
V
DD
= 1.5V ± 0.1V 1.0 V
DD
+ 0.3 V
V
DD
= 1.2V ± 5% 0.8 V
DD
+ 0.3 V
V
IL
Input Low Voltage
V
DD
= 1.8V ± 0.2V -0.3 0.4 V
V
DD
= 1.5V ± 0.1V -0.3 0.3 V
V
DD
= 1.2V ± 5% -0.3 0.2 V
V
OH
Output High Voltage;
NOTE 1
V
DDO
= 1.8V ± 0.2V 0.7 V
V
DDO
= 1.5V ± 0.1V 0.7 V
V
DDO
= 1.2V ± 5% 0.7 V
V
OL
Output Low Voltage;
NOTE 1
V
DDO
= 1.8V ± 0.2V 0.4 V
V
DDO
= 1.5V ± 0.1V 0.4 V
V
DDO
= 1.2V ± 5% 0.4 V
REVISION 1 05/01/15 5 LOW SKEW, 1:6 CRYSTAL-TO-LVCMOS FANOUT BUFFER
83905-01 DATA SHEET
Table 5. Crystal Characteristics
AC Electrical Characteristics
Table 6A. AC Characteristics, V
DD
= V
DDO
= 1.8V ±0.2V, T
A
= 0°C to 70°C
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is
mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium
has been reached under these conditions.
All parameters measured at ƒ 40MHz using a crystal input unless noted otherwise. Outputs terminated with 50 to V
DDO
/2.
NOTE 1: XTAL_IN can be overdriven by an external source.
NOTE 2: Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at V
DDO
/2.
NOTE 3: This parameter is defined in accordance with JEDEC Standard 65.
NOTE 4: See phase noise plot.
NOTE 5: These parameters are guaranteed by design. Not tested in production.
Parameter Test Conditions Minimum Typical Maximum Units
Mode of Oscillation Fundamental
Frequency 10 40 MHz
Equivalent Series Resistance (ESR) 50
Shunt Capacitance 7pF
Load Capacitance 12 18 pF
Symbol Parameter Test Conditions Minimum Typical Maximum Units
f
MAX
Output
Frequency
Using External Crystal 10 40 MHz
Using External Clock
Source NOTE 1
1100MHz
tsk(o) Output Skew; NOTE 2, 3 90 ps
tjit RMS Phase Jitter (Random); NOTE 4
25MHz, Integration Range:
100Hz – 1MHz
0.17 ps
t
R
/ t
F
Output Rise/Fall Time 20% to 80% 300 600 ps
odc Output Duty Cycle 42 50 58 %
t
EN
Output Enable
Time; NOTE 5
ENABLE1 4 cycles
ENABLE2 4 cycles
t
DIS
Output Disable
Time; NOTE 5
ENABLE1 4 cycles
ENABLE2 4 cycles
83905-01 DATA SHEET
LOW SKEW, 1:6 CRYSTAL-TO-LVCMOS FANOUT BUFFER 6 REVISION 1 05/01/15
Table 6B. AC Characteristics, V
DD
= V
DDO
= 1.5V ±0.1V, T
A
= 0°C to 70°C
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is
mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium
has been reached under these conditions.
All parameters measured at ƒ 40MHz using a crystal input unless noted otherwise. Outputs terminated with 50 to V
DDO
/2.
NOTE 1: XTAL_IN can be overdriven by an external source.
NOTE 2: Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at V
DDO
/2.
NOTE 3: This parameter is defined in accordance with JEDEC Standard 65.
NOTE 4: These parameters are guaranteed by design. Not tested in production.
Table 6C. AC Characteristics, V
DD
= V
DDO
= 1.2V ±5%, T
A
= 0°C to 70°C
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is
mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium
has been reached under these conditions.
All parameters measured at ƒ 40MHz using a crystal input unless noted otherwise. Outputs terminated with 50 to V
DDO
/2.
NOTE 1: XTAL_IN can be overdriven by an external source.
NOTE 2: Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at V
DDO
/2.
NOTE 3: This parameter is defined in accordance with JEDEC Standard 65.
NOTE 4: These parameters are guaranteed by design. Not tested in production.
Symbol Parameter Test Conditions Minimum Typical Maximum Units
f
MAX
Output
Frequency
Using External Crystal 10 40 MHz
Using External Clock
Source; NOTE 1
1100MHz
tsk(o) Output Skew; NOTE 2, 3 90 ps
tjit RMS Phase Jitter (Random)
25MHz, Integration Range:
100Hz – 1MHz
0.3 ps
t
R
/ t
F
Output Rise/Fall Time 20% to 80% 300 650 ps
odc Output Duty Cycle 44 50 56 %
t
EN
Output Enable
Time; NOTE 4
ENABLE1 4 cycles
ENABLE2 4 cycles
t
DIS
Output Disable
Time; NOTE 4
ENABLE1 4 cycles
ENABLE2 4 cycles
Symbol Parameter Test Conditions Minimum Typical Maximum Units
f
MAX
Output
Frequency
Using External Crystal 10 40 MHz
Using External Clock
Source; NOTE 1
1100MHz
tsk(o) Output Skew; NOTE 2, 3 90 ps
tjit RMS Phase Jitter (Random)
25MHz, Integration Range:
100Hz – 1MHz
0.7 ps
t
R
/ t
F
Output Rise/Fall Time 20% to 80% 350 800 ps
odc Output Duty Cycle 44 50 56 %
t
EN
Output Enable
Time; NOTE 4
ENABLE1 4 cycles
ENABLE2 4 cycles
t
DIS
Output Disable
Time; NOTE 4
ENABLE1 4 cycles
ENABLE2 4 cycles

83905AK-01LF

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IC CLOCK BUFFER 20-VFQFPN
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