MT18VDDT12872AG-40BJ1

Draft 9/ 9/ 2008
PDF: 09005aef80814e61/Source: 09005aef807f8acb Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD18C64_128x72A.fm - Rev. D 9/08 EN
10 ©2004 Micron Technology, Inc. All rights reserved
512MB, 1GB (x72, ECC, DR) 184-Pin DDR SDRAM UDIMM
Electrical Specifications
Notes: 1. Value calculated as one module rank in this operating condition; all other module ranks are
in Idd2P (CKE LOW) mode.
2. Value calculated reflects all module ranks in this operating condition.
Table 10: Idd Specifications and Conditions – 512MB (All Other Die Revisions)
Values are for the MT46V32M8 DDR SDRAM only and are computed from values specified in the
256Mb (32 Meg x 8) component data sheet
Parameter/Condition Symbol -40B -335 -262
-26A/
-265 Units
Operating one bank active-precharge current:
t
RC =
t
RC (MIN);
t
CK =
t
CK (MIN); DQ, DM, and DQS inputs changing once per clock cycle;
Address and control inputs changing once every two clock cycles
Idd0
1
1,251 1,161 1,161 1,116 mA
Operating one bank active-read-precharge current: BL = 2;
t
RC =
t
RC (MIN);
t
CK =
t
CK (MIN); Iout = 0mA; Address and control inputs
changing once per clock cycle
Idd1
1
1,566 1,566 1,476 1,341 mA
Precharge power-down standby current: All device banks idle;
Power-down mode;
t
CK =
t
CK (MIN); CKE = LOW
Idd2P
2
72 72 72 72 mA
Idle standby current: CS# = HIGH; All device banks idle;
t
CK =
t
CK (MIN); CKE = HIGH; Address and other control inputs
changing
once per clock cycle; V
in
=
Vref
for DQ, DQS, and DM
Idd2F
2
1,080 900 810 810 mA
Active power-down standby current: One device bank active; Power-
down mode;
t
CK =
t
CK (MIN); CKE = LOW
Idd3P
2
720 540 450 450/
540
mA
Active standby current: CS# = HIGH; CKE = HIGH; One device bank
active;
t
RC =
t
RAS (MAX);
t
CK =
t
CK (MIN); DQ, DM, and DQS inputs
changing twice per clock cycle; Address and other control inputs
changing once per clock cycle
Idd3N
2
1,260 1,080 900 900 mA
Operating burst read current: BL = 2; Continuous burst reads; One
device bank active; Address and control inputs changing once per clock
cycle;
t
CK =
t
CK (MIN); Iout = 0mA
Idd4R
1
1,836 1,611 1,386 1,386 mA
Operating burst write current: BL = 2; Continuous burst writes; One
device bank active; Address and control inputs changing once per clock
cycle;
t
CK =
t
CK (MIN); DQ, DM, and DQS inputs changing twice per clock
cycle
Idd4W
1
1,791 1,611 1,386 1,386 mA
Auto refresh current
t
REFC =
t
RFC (MIN) Idd5
2
4,680 4,590 4,230 4,230/
4,410
mA
t
REFC = 7.8125µs Idd5A
2
108 108 108 108 mA
Self refresh current: CKE 0.2V Idd6
2
72 72 72 72 mA
Operating bank interleave read current: Four device bank
interleaving reads (BL = 4) with auto precharge;
t
RC =
t
RC (MIN);
t
CK =
t
CK (MIN); Address and control inputs change only during active
READ or WRITE commands
Idd7
1
4,266 3,726 3,186 3,186/
3,321
mA
Draft 9/ 9/ 2008
PDF: 09005aef80814e61/Source: 09005aef807f8acb Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD18C64_128x72A.fm - Rev. D 9/08 EN
11 ©2004 Micron Technology, Inc. All rights reserved
512MB, 1GB (x72, ECC, DR) 184-Pin DDR SDRAM UDIMM
Electrical Specifications
Notes: 1. Value calculated as one module rank in this operating condition; all other module ranks are
in Idd2P (CKE LOW) mode.
2. Value calculated reflects all module ranks in this operating condition.
Table 11: Idd Specifications and Conditions – 1GB
Values are for the MT46V64M8 DDR SDRAM only and are computed from values specified in the
512Mb (64 Meg x 8) component data sheet
Parameter/Condition Symbol -40B -335 -262
-26A/
-265 Units
Operating one bank active-precharge current:
t
RC =
t
RC (MIN);
t
CK =
t
CK (MIN); DQ, DM, and DQS inputs changing once per clock cycle;
Address and control inputs changing once every two clock cycles
Idd0
1
1,440 1,215 1,215 1,080 mA
Operating one bank active-read-precharge current: BL = 2;
t
RC =
t
RC (MIN);
t
CK =
t
CK (MIN); Iout = 0mA; Address and control
inputs changing once per clock cycle
Idd1
1
1,710 1,485 1,485 1,350 mA
Precharge power-down standby current: All device banks idle;
Power-down mode;
t
CK =
t
CK (MIN); CKE = LOW
Idd2P
2
90 90 90 90 mA
Idle standby current: CS# = HIGH; All device banks idle;
t
CK =
t
CK (MIN); CKE = HIGH; Address and other control inputs
changing once per clock cycle; V
in
=V
ref
for DQ, DQS, and DM
Idd2F
2
990 810 810 720 mA
Active power-down standby current: One device bank active;
Power-down mode;
t
CK =
t
CK (MIN); CKE = LOW
Idd3P
2
810 630 630 540 mA
Active standby current: CS# = HIGH; CKE = HIGH; One device bank
active;
t
RC =
t
RAS (MAX);
t
CK =
t
CK (MIN); DQ, DM, and DQS inputs
changing twice per clock cycle; Address and other control inputs
changing once per clock cycle
Idd3N
2
1,080 900 900 810 mA
Operating burst read current: BL = 2; Continuous burst reads; One
device bank active; Address and control inputs changing once per clock
cycle;
t
CK =
t
CK (MIN); IOUT =0mA
Idd4R
1
1,755 1,530 1,530 1,350 mA
Operating burst write current: BL = 2; Continuous burst writes; One
device bank active; Address and control inputs changing once per clock
cycle;
t
CK =
t
CK (MIN); DQ, DM, and DQS inputs changing twice per
clock cycle
Idd4W
1
1,800 1,620 1,440 1,260 mA
Auto refresh current
t
REFC =
t
RFC (MIN) Idd5
2
6,210 5,220 5,220 5,040 mA
t
REFC = 7.8125µs Idd5A
2
198 180 180 180 mA
Self refresh current: CKE 0.2V Idd6
2
90 90 90 90 mA
Operating bank interleave read current: Four device bank
interleaving reads (BL = 4) with auto precharge;
t
RC =
t
RC (MIN);
t
CK =
t
CK (MIN); Address and control inputs change only during active
READ or WRITE commands
Idd7
1
4,095 3,690 3,645 3,195 mA
Draft 9/ 9/ 2008
PDF: 09005aef80814e61/Source: 09005aef807f8acb Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD18C64_128x72A.fm - Rev. D 9/08 EN
12 ©2004 Micron Technology, Inc. All rights reserved
512MB, 1GB (x72, ECC, DR) 184-Pin DDR SDRAM UDIMM
Serial Presence-Detect
Serial Presence-Detect
Notes: 1. To avoid spurious start and stop conditions, a minimum delay is placed between SCL = 1 and
the falling or rising edge of SDA.
2. This parameter is sampled.
3. For a restart condition or following a WRITE cycle.
4. The SPD EEPROM WRITE cycle time (
t
WRC) is the time from a valid stop condition of a write
sequence to the end of the EEPROM internal ERASE/PROGRAM cycle. During the WRITE
cycle, the EEPROM bus interface circuit is disabled, SDA remains HIGH due to pull-up resis-
tance, and the EEPROM does not respond to its slave address.
Serial Presence-Detect Data
For the latest serial presence-detect data, refer to Microns SPD page:
www.micron.com/SPD.
Table 12: Serial Presence-Detect EEPROM DC Operating Conditions
Parameter/Condition Symbol Min Max Units
Supply voltage Vddspd 2.3 3.6 V
Input high voltage: Logic 1; All inputs Vih Vddspd × 0.7 Vddspd + 0.5 V
Input low voltage: Logic 0; All inputs Vil –1.0 Vddspd × 0.3 V
Output low voltage: Iout = 3mA Vol 0.4 V
Input leakage current: V
IN = GND to Vdd Ili 10 µA
Output leakage current: V
OUT = GND to Vdd Ilo 10 µA
Standby current: SCL = SDA = Vdd - 0.3V; All other inputs = Vss or Vdd Isb 30 µA
Power supply current: SCL clock frequency = 100 kHz Icc 2.0 mA
Table 13: Serial Presence-Detect EEPROM AC Operating Conditions
Parameter/Condition Symbol Min Max Units Notes
SCL LOW to SDA data-out valid
t
AA 0.2 0.9 µs 1
Time the bus must be free before a new transition can start
t
BUF 1.3 µs
Data-out hold time
t
HD:DAT 200 ns
SDA fall time
t
F 300 ns 2
SDA rise time
t
R 300 ns 2
Data-in hold time
t
HD:DI 0 µs
Start condition hold time
t
HD:STA 0.6 µs
Clock HIGH period
t
HIGH 0.6 µs
Clock LOW period
t
LOW 1.3 µs
SCL clock frequency
f
SCL 400 kHz
Data-in setup time
t
SU:DAT 100 ns
Start condition setup time
t
SU:STA 0.6 µs 3
Stop condition setup time
t
SU:STO 0.6 µs
WRITE cycle time
t
WRC 5 ms 4

MT18VDDT12872AG-40BJ1

Mfr. #:
Manufacturer:
Micron
Description:
MODULE DDR SDRAM 1GB 184UDIMM
Lifecycle:
New from this manufacturer.
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