10
Electrical Specications (continued)
Unless otherwise specied, all Minimum/Maximum specications are at recommended operating conditions, all volt-
ages at input IC are referenced to V
EE1
, all voltages at output IC referenced to V
EE2
. All typical values at T
A
= 25°C, V
CC1
=
12 V, V
CC2
–V
EE2
= 20 V, V
E
–V
EE2
= 0 V.
Parameter Symbol Min. Typ. Max. Units Test Conditions Fig. Note
Gate Driver
High Level Output Current I
OH
–2.0 –0.75 A V
O
= V
CC2
– 3 V 12 4
Low Level Output Current I
OL
1.0 2.2 A V
O
= V
EE2
+ 2.5V 13 4
High Level Output Voltage V
OH
V
CC2
– 0.5 V
CC2
– 0.2 V I
O
= –100 mA 6-8
Low Level Output Voltage V
OL
0.1 0.5 V I
O
= 100 mA
V
IN
to High Level Output
Propagation Delay Time
t
PLH
50 130 250 ns V
source
= 5V
R
f
= 260Ω
R
g
= 10Ω
C
load
= 10 nF
f = 10 kHz
Duty Cycle =
50%
14,19 9
V
IN
to Low Level Output
Propagation Delay Time
t
PHL
50 150 250 ns 14,19 10
Pulse Width Distortion PWD –100 +20 +100 ns 11,12
Dead Time Distortion (t
PLH
–t
PHL
) DTD –150 –40 +105 ns 12,13
10% to 90% Rise Time t
R
70 ns
90% to 10% Fall Time t
F
50 ns
Output High Level Common
Mode Transient Immunity
|CM
H
| 50 >70 kV/μs T
A
= 25°C,
I
F
= 10 mA
V
CM
= 1500V
21 14
Output Low Level Common Mode
Transient Immunity
|CM
L
| 50 >70 kV/μs T
A
= 25°C,
I
F
= 0 mA
V
CM
= 1500V
21 15
Active Miller Clamp and Soft Shutdown
Low Level Soft Shutdown Current
During Fault Condition
I
SSD
22 35 48 mA V
SSD
– V
EE2
= 14 V 15
Clamp Threshold Voltage V
TH_CLAMP
2.0 3.0 V
Clamp Low Level Sinking Current I
CLAMP
0.75 1.9 A V
CLAMP
=
V
EE2
+ 2.5 V
V
CC2
UVLO Protection (UVLO voltage V
UVLO
reference to V
E
)
V
CC2
UVLO Threshold Low to High V
UVLO+
11.0 12.4 13.7 V V
O
> 5 V 8,16
V
CC2
UVLO Threshold High to Low V
UVLO-
10.1 11.3 12.8 V V
O
< 5 V 8,17
V
CC2
UVLO Hysteresis V
UVLO_HYS
1.1 V 8
V
CC2
to UVLO High Delay t
PLH_UVLO
10 μs 18
V
CC2
to UVLO Low Delay t
PHL_UVLO
10 μs 19
V
CC2
UVLO to V
OUT
High Delay t
UVLO_ON
10 μs 20
V
CC2
UVLO to V
OUT
Low Delay t
UVLO_OFF
10 μs 21
11
Electrical Specications (continued)
Unless otherwise specied, all minimum/maximum specications are at recommended operating conditions, all
voltages at input IC are referenced to V
EE1
, all voltages at output IC referenced to V
EE2
. All typical values at T
A
= 25°C,
V
CC1
= 12V, V
CC2
– V
EE2
= 20V, V
E
– V
EE2
= 0V.
Parameter Symbol Min. Typ. Max. Units Test Conditions Fig. Note
Desaturation Protection (Desat voltage V
DESAT
reference to V
E
)
Desat Sensing Threshold V
DESAT
6.2 7.0 7.8 V 16 8
Desat Charging Current I
CHG
–1.2 –0.9 –0.6 mA V
DESAT
= 2 V 17
Desat Discharging Current I
DSCHG
20 53 mA V
DESAT
= 8 V 18
Internal Desat Blanking Time t
DESAT(BLANKING)
0.3 0.6 1.0 μs C
SSD
= 1 nF 22
Desat Sense to 90% SSD Delay t
DESAT(90%)
0.3 μs 23
Desat Sense to 10% SSD Delay t
DESAT(10%)
0.8 μs 24
Desat to Low Level /FAULT Signal Delay t
DESAT(/FAULT)
7.0 μs 25
Output Mute Time due to Desat t
DESAT(MUTE)
2.3 3.2 4.1 ms 26
Time for Input Kept Low Before Fault Reset to
High
t
DESAT(RESET)
2.3 3.2 4.1 ms 27
Package Characteristics
Parameter Symbol Min. Typ. Max. Units Test Conditions Notes
Input-Output Momentary Withstand Voltage V
ISO
5000 V
RMS
RH < 50%, t = 1 min.
T
A
= 25°C
28, 29, 30
Resistance (Input-Output) R
I-O
10
14
V
I-O
= 500 V
DC
30
Capacitance (Input-Output) C
I-O
1.3 pF f = 1 MHz
Thermal coecient between LED and input IC A
EI
35.4 °C/W
Thermal coecient between LED and output IC A
EO
33.1 °C/W
Thermal coecient between input IC and output IC A
IO
25.6 °C/W
Thermal coecient between LED and Ambient A
EA
176.1 °C/W
Thermal coecient between input IC and Ambient A
IA
92 °C/W
Thermal coecient between output IC and Ambient A
OA
76.7 °C/W
12
Notes:
1. Output IC power dissipation is derated linearly above 100°C from 580 mW to 260 mW at 125°C.
2. This supply is optional. Required only when negative gate drive is implemented.
3. Maximum pulse width = 1 μs, maximum duty cycle = 1%.
4. Maximum 500 ns pulse width if peak V
DESAT
> 10 V.
5. 15V is the recommended minimum operating positive supply voltage (V
CC2
– V
E
) to ensure adequate margin in excess of the maximum V
UVLO+
threshold of 13.5V.
6. For High-Level Output Voltage testing, V
OH
is measured with a DC-load current. When driving capacitive loads, V
OH
approaches V
CC
as I
OH
approaches zero.
7. Maximum pulse width = 1.0 ms, maximum duty cycle = 20%.
8. Once V
OUT
of the ACPL-344JT is allowed to go high (V
CC2
– V
E
> V
UVLO
), the DESAT detection feature of the ACPL-344JT will be the primary source
of IGBT protection. UVLO is required to ensure DESAT is functional. Once V
CC2
exceeds V
UVLO+
threshold, DESAT remains functional until V
CC2
is below the V
UVLO-
threshold. Thus, the DESAT detection and UVLO features of the ACPL-344JT work in conjunction to ensure constant IGBT
protection.
9. t
PLH
is dened as the propagation delay from 50% of LED input I
F
to 50% of High-level output.
10. t
PHL
is dened as the propagation delay from 50% of LED input I
F
to 50% of Low-level output.
11. Pulse Width Distortion (PWD) is dened as (t
PHL
– t
PLH
) of any given unit.
12. As measured from I
F
to V
O
.
13. Dead Time Distortion (DTD) is dened as (t
PLH
– t
PHL
) between any two ACPL-344JT parts under the same test conditions.
14. Common-mode transient immunity in the high state is the maximum tolerable dVCM/dt of the common-mode pulse, V
CM
, to assure that the
output remains in a high state (meaning V
O
> 15V).
15. Common-mode transient immunity in the low state is the maximum tolerable dV
CM
/dt of the common-mode pulse, V
CM
, to assure that the
output remains in a low state (meaning V
O
< 1.0V).
16. The “increasing” (meaning turn-on or “positive going” direction) of V
CC2
– V
E
.
17. The decreasing (meaning turn-o or “negative going direction) of V
CC2
– V
E
.
18. The delay time when V
CC2
exceeds UVLO+ threshold to UVLO High – 50% of UVLO positive-going edge.
19. The delay time when V
CC2
falls below UVLO– threshold to UVLO Low – 50% of UVLO negative-going edge.
20. The delay time when V
CC2
exceeds UVLO+ threshold to 50% of High-level output.
21. The delay time when V
CC2
falls below UVLO– threshold to 50% of Low-level output.
22. The delay time for ACPL-344JT to respond to a DESAT fault condition without any external DESAT capacitor.
23. The amount of time from when DESAT threshold is exceeded to 90% of V
GATE
at mentioned test conditions.
24. The amount of time from when DESAT threshold is exceeded to 10% of V
GATE
at mentioned test conditions.
25. The amount of time from when DESAT threshold is exceeded to FAULT output Low – 50% of V
CC1
voltage.
26. The amount of time when DESAT threshold is exceeded, Output is mute to LED input.
27. The amount of time when DESAT Mute time is expired, LED input must be kept LOW for Fault status to return to HIGH.
28. In accordance with UL1577, each optocoupler is proof tested by applying an insulation test voltage ≥6000V
RMS
for 1 second.
29. The Input-Output Momentary Withstand Voltage is a dielectric voltage rating that should not be interpreted as an input-output continuous-
voltage rating. For the continuous-voltage rating, refer to your equipment level safety specication or IEC/EN/DIN EN 60747-5-5 Insulation
Characteristics Table.
30. Device considered a two-terminal device: pins 1 through 8 are shorted together and pins 9 through 16 are shorted together.

ACPL-344JT-500E

Mfr. #:
Manufacturer:
Broadcom / Avago
Description:
High Speed Optocouplers Auto Optocoupler
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union

Products related to this Datasheet