©2002 Fairchild Semiconductor Corporation Rev. B January 2002
ISL9N302AP3
Figure 5. Transfer Characteristics Figure 6. Saturation Characteristics
Figure 7. Drain to Source On Resistance vs Gate
Voltage and Drain Current
Figure 8. Normalized Drain to Source On
Resistance vs Junction Temperature
Figure 9. Normalized Gate Threshold Voltage vs
Junction Temperature
Figure 10. Normalized Drain to Source
Breakdown Voltage vs Junction Temperature
Typical Characteristic (Continued)
0
25
50
75
100
125
150
1.5 2.0 2.5 3.0 3.5
I
D
, DRAIN CURRENT (A)
V
GS
, GATE TO SOURCE VOLTAGE (V)
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
V
DD
= 15V
T
J
= -55
o
C
T
J
= 175
o
C
T
J
= 25
o
C
0
25
50
75
100
125
150
0.5 1.0 1.5 2.0
I
D
, DRAIN CURRENT (A)
V
DS
, DRAIN TO SOURCE VOLTAGE (V)
V
GS
= 4.5V
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
V
GS
= 3.5V
T
C
= 25
o
C
V
GS
= 10V
V
GS
= 3V
0
0
2
4
6
8
10
246810
V
GS
, GATE TO SOURCE VOLTAGE (V)
I
D
= 75A
r
DS(ON)
, DRAIN TO SOURCE
ON RESISTANCE (m)
I
D
= 10A
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
0.6
0.8
1.0
1.2
1.4
1.6
1.8
-80 -40 0 40 80 120 160 200
NORMALIZED DRAIN TO SOURCE
T
J
, JUNCTION TEMPERATURE (
o
C)
ON RESISTANCE
V
GS
= 10V, I
D
= 75A
PULSE DURATION = 80µs
DUTY CYCLE = 0.5% MAX
0.2
0.4
0.6
0.8
1.0
1.2
1.4
-80 -40 0 40 80 120 160 200
NORMALIZED GATE
T
J
, JUNCTION TEMPERATURE (
o
C)
V
GS
= V
DS
, I
D
= 250µA
THRESHOLD VOLTAGE
0.9
1.0
1.1
1.2
-80 -40 0 40 80 120 160 200
T
J
, JUNCTION TEMPERATURE (
o
C)
NORMALIZED DRAIN TO SOURCE
BREAKDOWN VOLTAGE
I
D
= 250µA
©2002 Fairchild Semiconductor Corporation Rev. B January 2002
ISL9N302AP3
Figure 11. Capacitance vs Drain to Source
Voltage
Figure 12. Gate Charge Waveforms for Constant
Gate Currents
Figure 13. Switching Time vs Gate Resistance Figure 14. Switching Time vs Gate Resistance
Typical Characteristic (Continued)
1000
10000
0.1 1 10
C, CAPACITANCE (pF)
V
DS
, DRAIN TO SOURCE VOLTAGE (V)
C
ISS
= C
GS
+ C
GD
C
OSS
C
DS
+ C
GD
C
RSS
= C
GD
V
GS
= 0V, f = 1MHz
20000
500
30
0
2
4
6
8
10
50 100 150 200 250
V
GS
, GATE TO SOURCE VOLTAGE (V)
Q
g
, GATE CHARGE (nC)
V
DD
= 15V
I
D
= 75A
I
D
= 28A
WAVEFORMS IN
DESCENDING ORDER:
0
0
200
400
600
800
1000
0 1020304050
SWITCHING TIME (ns)
R
GS
, GATE TO SOURCE RESISTANCE ()
V
GS
= 4.5V, V
DD
= 15V, I
D
= 28A
t
r
t
d(ON)
t
d(OFF)
t
f
0
200
400
600
800
1000
1200
1400
10 20 30 40 50
SWITCHING TIME (ns)
R
GS
, GATE TO SOURCE RESISTANCE ()
V
GS
= 10V, V
DD
= 15V, I
D
= 28A
t
d(ON)
t
f
t
r
0
t
d(OFF)
Test Circuits and Waveforms
Figure 15. Unclamped Energy Test Circuit Figure 16. Unclamped Energy Waveforms
t
P
V
GS
0.01
L
I
AS
+
-
V
DS
V
DD
R
G
DUT
VARY t
P
TO OBTAIN
REQUIRED PEAK I
AS
0V
V
DD
V
DS
BV
DSS
t
P
I
AS
t
AV
0
©2002 Fairchild Semiconductor Corporation Rev. B January 2002
ISL9N302AP3
Figure 17. Gate Charge Test Circuit Figure 18. Gate Charge Waveforms
Figure 19. Switching Time Test Circuit Figure 20. Switching Time Waveforms
Test Circuits and Waveforms (Continued)
R
L
V
GS
+
-
V
DS
V
DD
DUT
I
g(REF)
V
DD
Q
g(TH)
V
GS
= 1V
Q
g(5)
V
GS
= 5V
Q
g(TOT)
V
GS
= 10V
V
DS
V
GS
I
g(REF)
0
0
Q
gs
Q
gd
V
GS
R
L
R
GS
DUT
+
-
V
DD
V
DS
V
GS
t
ON
t
d(ON)
t
r
90%
10%
V
DS
90%
10%
t
f
t
d(OFF)
t
OFF
90%
50%
50%
10%
PULSE WIDTH
V
GS
0
0

ISL9N302AP3

Mfr. #:
Manufacturer:
ON Semiconductor / Fairchild
Description:
MOSFET N-Channel PWM Logic Level
Lifecycle:
New from this manufacturer.
Delivery:
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