LTC2461/LTC2463
13
24613fa
APPLICATIONS INFORMATION
conversion cycle. The master issues a START, followed
by the LTC2461/LTC2463 global address 1110111, and a
write request. The LTC2461/LTC2463 will be selected and
acknowledge the request. If desired, the master then sends
the write byte to program the 30Hz or 60Hz mode. After
the optional write byte, the master ends the write operation
with a STOP. This will update the configuration registers
(if a write byte was sent) and initiate a new conversion on
the LTC2461/LTC2463, as shown in Figure7c. In order to
synchronize the start of the conversion without affecting
the configuration registers, the write operation can be
aborted with a STOP. This initiates a new conversion on
the LTC2461/LTC2463 without changing the configura-
tion registers.
PRESERVING THE CONVERTER ACCURACY
The LTC2461/LTC2463 are designed to minimize the conver-
sion result’s sensitivity to device decoupling, PCB layout,
antialiasing circuits, line and frequency perturbations. Nev-
ertheless, in order to preserve the high accuracy capability
of this part, some simple precautions are desirable.
Digital Signal Levels
Due to the nature of CMOS logic, it is advisable to keep
input digital signals near GND or V
CC
. Voltages in the range
of 0.5V to V
CC
– 0.5V may result in additional current
leakage from the part. Undershoot and overshoot should
also be minimized, particularly while the chip is convert-
ing. Excessive noise on the digital lines could degrade the
ADC performance.
Driving V
CC
and GND
In relation to the V
CC
and GND pins, the LTC2461/LTC2463
combines internal high frequency decoupling with damping
elements, which reduce the ADC performance sensitivity
to PCB layout and external components. Nevertheless,
the very high accuracy of this converter is best pre-
served by careful low and high frequency power supply
decoupling.
A 0.1µF, high quality, ceramic capacitor in parallel with
a 10µF low ESR ceramic capacitor should be connected
between the V
CC
and GND pins, as close as possible to
the package. The 0.1µF capacitor should be placed closest
to the ADC package. It is also desirable to avoid any via
in the circuit path, starting from the converter V
CC
pin,
passing through these two decoupling capacitors, and
returning to the converter GND pin. The area encompassed
by this circuit path, as well as the path length, should be
minimized.
As shown in Figure 8, REF
is used as the negative refer-
ence voltage input to the ADC. This pin can be tied directly
to ground or Kelvined to sensor ground. In the case where
REF
is used as a sense input, it should be bypassed to
ground with a 0.1μF ceramic capacitor in parallel with a
10μF low ESR ceramic capacitor.
Very low impedance ground and power planes, and star
connections at both V
CC
and GND pins, are preferable.
The V
CC
pin should have two distinct connections: the
first to the decoupling capacitors described above, and
the second to the ground return for the power supply
voltage source.
Figure 8. LTC2461/LTC2463 Analog Input/Reference
Equivalent Circuit
R
SW
15k
(TYP)
I
LEAK
I
LEAK
V
CC
V
CC
V
CC
V
CC
C
EQ
0.35pF
(TYP)
IN
+
IN
REF
REFOUT
INTERNAL
REFERENCE
24613 F08
R
SW
15k
(TYP)
I
LEAK
I
LEAK
R
SW
15k
(TYP)
I
LEAK
I
LEAK
R
SW
15k
(TYP)
I
LEAK
I
LEAK
LTC2461/LTC2463
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APPLICATIONS INFORMATION
REFOUT and COMP
The on-chip 1.25V precision reference is internally tied
to the LTC2461/LTC2463 converters reference input and
its output to the REFOUT pin. A 0.1μF capacitor should
be placed on the REFOUT pin. It is possible to reduce
this capacitor, but the transition noise increases. A 0.1μF
capacitor should also be placed on the COMP pin. This
pin is tied to an internal point in the reference and is used
for stability. In order for the reference to remain stable the
capacitor placed on the COMP pin must be greater than or
equal to the capacitor tied to the REFOUT pin. The REFOUT
pin should not be overridden by an external voltage. If
a reference voltage greater than 1.25V is required, the
LTC2451/LTC2453 should be used.
The internal reference has a corresponding start up
time depending on the size of the capacitors tied to the
REFOUT and COMP pins. This start up time is typically
12ms when 0.1μF capacitors are used. At initial power up,
the first conversion result can be aborted or ignored. At
the completion of this first conversion, the reference has
settled and all subsequent conversions are valid.
If the reference is put to sleep (program SLP = 1) the refer-
ence is powered down after the next conversion. This last
conversion result is valid. On a valid address acknowledge,
the reference is powered back up. In order to ensure the
reference output has settled before the next conversion,
the power up time can be extended by delaying the data
read 12ms. Once all 16 bits are read from the device, the
next conversion automatically begins. In the default opera-
tion, the reference remains powered up at the conclusion
of the conversion cycle.
Driving V
IN
+
and V
IN
The input drive requirements can best be analyzed using
the equivalent circuit of Figure 9. The input signal V
SIG
is
connected to the ADC input pins (IN
+
and IN
) through an
equivalent source resistance R
S
. This resistor includes both
the actual generator source resistance and any additional
optional resistors connected to the input pins. Optional
input capacitors C
IN
are also connected to the ADC input
pins. This capacitor is placed in parallel with the input
parasitic capacitance C
PAR
. This parasitic capacitance
Figure 9. LTC2461/LTC2463 Input Drive Equivalent Circuit
I
LEAK
I
LEAK
R
SW
15k
(TYP)
I
CONV
C
IN
IN
+
(LTC2463)
IN
(LTC2461)
V
CC
V
SIG
+
V
SIG
R
S
C
EQ
0.35pF
(TYP)
C
PAR
+
24613 F09
I
LEAK
I
LEAK
R
SW
15k
(TYP)
I
CONV
C
IN
IN
(LTC2463)
V
CC
R
S
C
EQ
0.35pF
(TYP)
C
PAR
+
includes elements from the printed circuit board (PCB)
and the associated input pin of the ADC. Depending on the
PCB layout, C
PAR
has typical values between 2pF and 15pF.
In addition, the equivalent circuit of Figure 9 includes the
converter equivalent internal resistor R
SW
and sampling
capacitor C
EQ
.
There are some immediate trade-offs in R
S
and C
IN
without
needing a full circuit analysis. Increasing R
S
and C
IN
can
give the following benefits:
1) Due to the LTC2461/LTC2463’s input sampling algo-
rithm, the input current drawn by IN
+
, IN
or IN over
a conversion cycle is typically 50nA. A high R
S
C
IN
attenuates the high frequency components of the input
current, and R
S
values up to 1k result in <1LSB error.
2) The bandwidth from V
SIG
is reduced at the input pins
(IN
+
, IN
or IN). This bandwidth reduction isolates the
ADC from high frequency signals, and as such provides
simple antialiasing and input noise reduction.
3) Switching transients generated by the ADC are attenu-
ated before they go back to the signal source.
4) A large C
IN
gives a better AC ground at the input pins,
helping reduce reflections back to the signal source.
5) Increasing R
S
protects the ADC by limiting the current
during an outside-the-rails fault condition.
There is a limit to how large R
S
C
IN
should be for a given
application. Increasing R
S
beyond a given point increases
the voltage drop across R
S
due to the input current,
LTC2461/LTC2463
15
24613fa
APPLICATIONS INFORMATION
to the point that significant measurement errors exist.
Additionally, for some applications, increasing the R
S
C
IN
product too much may unacceptably attenuate the signal
at frequencies of interest.
For most applications, it is desirable to implement C
IN
as
a high-quality 0.1µF ceramic capacitor and to set R
S
≤ 1k.
This capacitor should be located as close as possible to
the actual IN
+
, IN
or IN package pin. Furthermore, the
area encompassed by this circuit path, as well as the path
length, should be minimized.
In the case of a 2-wire sensor that is not remotely
grounded, it is desirable to split R
S
and place series
resistors in the ADC input line as well as in the sensor
ground return line, which should be tied to the ADC GND
pin using a star connection topology.
Figure 10 shows the measured LTC2463 INL vs Input
Voltage as a function of R
S
value with an input capacitor
C
IN
= 0.1µF.
In some cases, R
S
can be increased above these guidelines.
The input current is zero when the ADC is either in sleep
or I/O modes. Thus, if the time constant of the input RC
circuit t = R
S
• C
IN
, is of the same order of magnitude or
longer than the time periods between actual conversions,
then one can consider the input current to be reduced
correspondingly.
These considerations need to be balanced out by the input
signal bandwidth. The 3dB bandwidth ≈ 1/(2pR
S
C
IN
).
Finally, if the recommended choice for C
IN
is unacceptable
for the users specific application, an alternate strategy is to
eliminate C
IN
and minimize C
PAR
and R
S
. In practical terms,
this configuration corresponds to a low impedance sensor
directly connected to the ADC through minimum length
traces. Actual applications include current measurements
through low value sense resistors, temperature measure-
ments, low impedance voltage source monitoring, and so
on. The resultant INL vs V
IN
is shown in Figure 11. The
measurements of Figure 11 include a capacitor C
PAR
cor-
responding to a minimum sized layout pad and a minimum
width input trace of about 1 inch length.
Signal Bandwidth, Transition Noise and Noise
Equivalent Input Bandwidth
The LTC2461/LTC2463 include a sinc
1
type digital filter
with the first notch located at f
0
= 60Hz. As such, the
3dB input signal bandwidth is 26.54Hz. The calculated
LTC2461/LTC2463 input signal attenuation vs frequency
over a wide frequency range is shown in Figure 12. The
calculated LTC2461/LTC2463 input signal attenuation vs
frequency at low frequencies is shown in Figure 13. The
converter noise level is about 2.2µV
RMS
and can be mod-
eled by a white noise source connected at the input of a
noise-free converter.
On a related note, the LTC2463 uses two separate A/D
converters to digitize the positive and negative inputs.
Each of these A/D converters has 2.2µV
RMS
transition
noise. If one of the input voltages is within this small
transition noise band, then the output will fluctuate one
bit, regardless of the value of the other input voltage. If
both of the input voltages are within their transition noise
bands, the output can fluctuate 2 bits.
For a simple system noise analysis, the V
IN
drive circuit can
be modeled as a single-pole equivalent circuit character-
ized by a pole location f
i
and a noise spectral density n
i
.
If the converter has an unlimited bandwidth, or at least a
bandwidth substantially larger than f
i
, then the total noise
contribution of the external drive circuit would be:
V
n
= n
i
p / 2 f
i
Then, the total system noise level can be estimated as
the square root of the sum of (V
n
2
) and the square of the
LTC2461/LTC2463 noise floor (~2.2µV
2
).

LTC2463CDD#PBF

Mfr. #:
Manufacturer:
Analog Devices Inc.
Description:
Analog to Digital Converters - ADC 16-Bit I2C 60Hz Differential Delta Sigma ADC with Internal Reference
Lifecycle:
New from this manufacturer.
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