Functional Description
Mean Time to Failure
The mean time to failure (MTTF) for the device can be calculated based on the compo-
nent reliability data using the methods referenced in the Telcordia SR-322 reliability
prediction procedures for electronic equipment and measured during Reliability Dem-
onstration Test.
Table 4: MTTF
Capacity MTTF (Operating Hours)
All 2.0 million
Endurance
SSD endurance is dependent on many factors, including: usage conditions applied to
the drive, drive performance and capacity, formatted sector size, error correction codes
(ECCs) in use, internal NAND PROGRAM/ERASE cycles, write amplification factor,
wear-leveling efficiency of the drive, over-provisioning ratio, valid user data on the
drive, drive temperature, NAND process parameters, and data retention time.
The device is designed to operate under a wide variety of conditions, while delivering
the maximum performance possible and meeting enterprise market demands.
While actual endurance varies depending on conditions, the drive lifetime can be esti-
mated based on capacity, assumed fixed-use models, ECC, and formatted sector size.
Lifetime estimates for the device are shown in the following tables in total bytes written.
Table 5: Total Bytes Written
Model Capacity Sequential Writes Random Writes (4KB) Unit
9100 PRO
800GB 2.4 0.79
PB
1.6TB 4.8 1.75
3.2TB 9.6 3.28
9100 MAX
1.2TB 4.8 3.5
2.4TB 9.6 6.57
Note:
1. Values shown are based on system modeling.
9100 U.2 and HHHL NVMe PCIe SSDs
Functional Description
CCMTD-731836775-1
9100_hhhl_u2_nvme_pcie_ssd.pdf - Rev. I 03/17 EN
7
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2016 Micron Technology, Inc. All rights reserved.
Data Retention
Data retention refers to the capability of the SSD media (that is, NAND flash) to retain
programmed data. The three primary factors that affect data retention are:
Power-on/power-off state: Data retention generally improves when the SSD is in use
(that is, not shelved in a power-off state).
Temperature: Data retention decreases as the temperature increases.
Number of PROGRAM/ERASE cycles on the media: When the SSD ships from the fac-
tory, it is typically able to retain user data for up to 5 years in a powered-off state.
Data retention is guaranteed for three months at 40ºC (MAX), which assumes worst-
case power and media wear (the SSD remains in a powered-off state and has reached
end of life).
Wear Leveling
The device uses sophisticated wear-leveling algorithms to maximize endurance by dis-
tributing PROGRAM/ERASE cycles uniformly across all blocks in the array. Both static
and dynamic wear leveling are utilized to optimize the drive’s lifespan.
Both types of wear leveling aim to distribute “hot” data away from blocks that have ex-
perienced relatively heavy wear. Static wear leveling accomplishes this by moving data
that has not been modified for an extended period of time out of blocks which have
seen few P/E cycles and into more heavily worn blocks. This frees up fresher blocks for
new data while reducing expected wear on tired blocks. Dynamic wear leveling, by con-
trast, acts on in-flight data to ensure it is preferentially written to the least-worn free
blocks rather than those closer to the end of their rated life. These techniques are used
together within the controller to optimally balance the wear profile of the NAND array.
Firmware Update Capability
The SSD supports firmware updates as defined by the NVMe specification. Once a
download operation completes, an ACTIVATE command must be issued.
Power Loss Subsystem and Rebuild
The SSD supports an unexpected power loss with a power-backed write cache. No user
data is lost during an unexpected power loss. When power is subsequently restored, the
SSD returns to a ready state within a maximum of 120 seconds.
Boot
The 9100 is not intended to be a bootable device. Boot functionality is not validated by
Micron, and any use in this manner is done at the user's own risk. Please visit Mi-
cron.com to find other SSD products that are recommended for boot.
9100 U.2 and HHHL NVMe PCIe SSDs
Functional Description
CCMTD-731836775-1
9100_hhhl_u2_nvme_pcie_ssd.pdf - Rev. I 03/17 EN
8
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2016 Micron Technology, Inc. All rights reserved.
SMBus Sideband Management
If the system management bus (SMBus) is configured to be enabled, the SSD uses the
SMBus interface for presenting product data, monitoring drive health, checking drive
status before power-up, and error posting.
Two protocols are supported: NVMe Basic Management Command revision 1.0 and En-
terprise SSD Form Factor interface with its accompanying vital product data (VPD) defi-
nition.
Management data and vital product data may be accessed at fixed addresses with
+3.3V
AUX
prior to powering up the drive completely. This data continues to be available
at this fixed address when the drive is fully powered up.
Table 6: Out of Band Management Details
Out of Band Protocol SMBus Address
Alternate Address (due to
bit shift) Data
Enterprise SSD Form Factor 0x53 0xA6 Vital Product Data (VPD)
NVMe Management Inter-
face 1.0
0x6A 0xD4 Subsystem Management Da-
ta (SMD)
Notes:
1. SMBus addresses will appear at an alternate address in certain tools due to the inclusion
of a direction bit in the SMBus spec.
2. Out of band management is disabled by default.
9100 U.2 and HHHL NVMe PCIe SSDs
Functional Description
CCMTD-731836775-1
9100_hhhl_u2_nvme_pcie_ssd.pdf - Rev. I 03/17 EN
9
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2016 Micron Technology, Inc. All rights reserved.

MTFDHAL800MCE-1AN1ZABYY

Mfr. #:
Manufacturer:
Micron
Description:
SSD 800GB U.2 MLC NVME 12V
Lifecycle:
New from this manufacturer.
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