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M74HCT4052ADTR2G

P1-P3P4-P6P7-P9P10-P12P13-P15P16-P16
MC74HCT4051A, MC74HCT4052A, MC74HCT4053A
http://onsemi.com
7
Figure 7c. Typical On Resistance, V
CC
− V
EE
= 4.5 V Figure 7d. Typical On Resistance, V
CC
− V
EE
= 6.0 V
120
100
80
60
40
0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5
V
IS
, INPUT VOLTAGE (VOLTS), REFERENCED TO V
EE
R
on
, ON RESISTANCE (OHMS)
75
60
45
30
15
0 1.0 2.0 3.0 4.0 5.0 6.03.5 4.5 5.5
V
IS
, INPUT VOLTAGE (VOLTS), REFERENCED TO V
EE
R
on
, ON RESISTANCE (OHMS)
20
0
25°C
-55°C
125°C
25°C
-55°C
125°C
90
105
0
0.5 1.5 2.5
Figure 7e. Typical On Resistance, V
CC
− V
EE
= 9.0 V
01
70
60
50
40
30
V
IS
, INPUT VOLTAGE (VOLTS), REFERENCED TO V
EE
R
on
, ON RESISTANCE (OHMS)
20
10
234 56789
25°C
-55°C
125°C
80
0
Figure 7f. Typical On Resistance, V
CC
− V
EE
= 12.0 V
01
60
50
40
30
V
IS
, INPUT VOLTAGE (VOLTS), REFERENCED TO V
EE
R
on
, ON RESISTANCE (OHMS)
20
10
234 89101112
25°C
-55°C
125°C
0
5
76
Figure 8. On Resistance Test Set−Up
PLOTTER
MINI COMPUTER
PROGRAMMABLE
POWER
SUPPLY
DC ANALYZER
V
CC
DEVICE
UNDER TEST
+-
V
EE
ANALOG IN COMMON OUT
GND
MC74HCT4051A, MC74HCT4052A, MC74HCT4053A
http://onsemi.com
8
Figure 9. Maximum Off Channel Leakage Current,
Any One Channel, Test Set−Up
Figure 10. Maximum Off Channel Leakage Current,
Common Channel, Test Set−Up
Figure 11. Maximum On Channel Leakage Current,
Channel to Channel, Test Set−Up
Figure 12. Maximum On Channel Bandwidth,
Test Set−Up
Figure 13. Off Channel Feedthrough Isolation,
Test Set−Up
Figure 14. Feedthrough Noise, Channel Select to
Common Out, Test Set−Up
OFF
OFF
6
7
8
16
COMMON O/I
V
CC
V
EE
V
IH
NC
A
V
CC
V
EE
V
CC
OFF
OFF
6
7
8
16
COMMON O/I
V
CC
V
EE
V
IH
ANALOG I/O
V
CC
V
EE
V
CC
ON
OFF
6
7
8
16
COMMON O/I
V
CC
V
EE
V
IL
V
CC
V
EE
V
CC
N/C
A
ANALOG I/O
ON
6
7
8
16
V
CC
V
EE
0.1mF
C
L
*
f
in
R
L
dB
METER
*Includes all probe and jig capacitance
OFF
6
7
8
16
V
CC
V
EE
0.1mF
C
L
*
f
in
R
L
dB
METER
*Includes all probe and jig capacitance
V
OS
V
OS
R
L
V
IS
V
IL
or V
IH
CHANNEL SELECT
ON/OFF
6
7
8
16
V
CC
V
EE
C
L
*
R
L
*Includes all probe and jig capacitance
CHANNEL SELECT
TEST
POINT
COMMON O/I
11
V
CC
OFF/ON
ANALOG I/O
R
L
R
L
3.0 V
GND
V
in
≤ 1 MHz
t
r
= t
f
= 6 ns
MC74HCT4051A, MC74HCT4052A, MC74HCT4053A
http://onsemi.com
9
Figure 15a. Propagation Delays, Channel Select
to Analog Out
Figure 15b. Propagation Delay, Test Set−Up Channel
Select to Analog Out
Figure 16a. Propagation Delays, Analog In
to Analog Out
Figure 16b. Propagation Delay, Test Set−Up
Analog In to Analog Out
Figure 17a. Propagation Delays, Enable to
Analog Out
Figure 17b. Propagation Delay, Test Set−Up
Enable to Analog Out
V
CC
GND
CHANNEL
SELECT
ANALOG
OUT
50%
t
PLH
t
PHL
V
m
ON/OFF
6
7
8
16
V
CC
C
L
*
*Includes all probe and jig capacitance
CHANNEL SELECT
TEST
POINT
COMMON O/I
OFF/ON
ANALOG I/O
V
CC
V
CC
GND
ANALOG
IN
ANALOG
OUT
50%
t
PLH
t
PHL
50%
ON
6
7
8
16
V
CC
C
L
*
*Includes all probe and jig capacitance
TEST
POINT
COMMON O/I
ANALOG I/O
ON/OFF
6
7
8
ENABLE
V
CC
ENABLE
V
M
t
f
t
r
V
CC
GND
ANALOG
OUT
t
PZL
ANALOG
OUT
t
PZH
HIGH
IMPEDANCE
V
OL
V
OH
HIGH
IMPEDANCE
10%
90%
t
PLZ
t
PHZ
50%
50%
ANALOG I/O
C
L
*
TEST
POINT
16
V
CC
1kW
1
2
1
2
POSITION 1 WHEN TESTING t
PHZ
AND t
PZH
POSITION 2 WHEN TESTING t
PLZ
AND t
PZL
(V
I
)
V
I
= GND to 3.0 V
V
m
= 1.3 V
(V
I
)
V
I
= GND to 3.0 V
V
m
= 1.3 V
Figure 15.
Figure 16.
Figure 17.
90%
10%
V
M
P1-P3P4-P6P7-P9P10-P12P13-P15P16-P16

M74HCT4052ADTR2G

Mfr. #:
Buy M74HCT4052ADTR2G
Manufacturer:
ON Semiconductor
Description:
Encoders, Decoders, Multiplexers & Demultiplexers IC MUX/DEMUX DUAL 4X1
Lifecycle:
New from this manufacturer.
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