MTFDDAA064MAM-1J1 Datasheet MTFDDAA064MAM-1J1 | P7-P9

Performance

Measured performance can vary for a number of reasons. The major factors affecting

drive performance are the density of the drive and the interface of the host. Additional-

ly, overall system performance can affect the measured drive performance. When com-

paring drives, it is recommended that all system variables are the same, and only the

drive being tested varies.

Performance numbers will vary depending on the host system configuration.

Table 5: Drive Performance

Density 64GB

UnitInterface Speed 6 Gb/s

Sequential read (128k transfer) 500 MB/s

Sequential write (128k transfer) 95 MB/s

Random read (4k transfer) 45K IOPs

Random write (4k transfer) 20K IOPs

Read latency 55 µs

Write latency 55 µs

PCMark vantage 65K HDD score

Notes:

1. Typical I/O performance numbers as measured using IOMeter with a queue depth of 32

and write cache enabled.

2. IOMeter measurements are performed on an 8GB span.

3. 4k transfers used for READ/WRITE latency values.

4. System variations may affect measured results.

5. Performance numbers are indicative of C400 firmware version 0009 and newer.

C400v 1.8-Inch NAND Flash SSD

Performance

PDF: 09005aef84559b26

realssd_c400v_1_8.pdf - Rev. D 09/11 EN

Micron Technology, Inc. reserves the right to change products or specifications without notice.

Reliability

Micron’s SSDs incorporate advanced technology for defect and error management.

They use various combinations of hardware-based error correction algorithms and

firmware-based static and dynamic wear-leveling algorithms.

Over the life of the SSD, uncorrectable errors may occur. An uncorrectable error is de-

fined as data that is reported as successfully programmed to the SSD but when it is read

out of the SSD, the data differs from what was programmed.

Table 6: Uncorrectable Bit Error Rate

Uncorrectable Bit Error Rate Operation

<1 sector per 10

bits read READ

Mean Time Between Failures

Mean time between failures (MTBFs) for the SSD can be predicted based on the compo-

nent reliability data using the methods referenced in the Telcordia SR-332 reliability

prediction procedures for electronic equipment.

Table 7: MTBFs

Density MTBF (Operating Hours)

64GB 1.2 million

Note:

1. The product achieves a mean time between failure (MTBF) of 1.2 million hours, based

on population statistics not relevant to individual units.

Endurance

Endurance for the SSD can be predicted based on the usage conditions applied to the

device, the internal NAND component cycles, the write amplification factor, and the

wear-leveling efficiency of the drive. The table below shows the drive lifetime for each

SSD density based on predefined usage conditions.

Table 8: Drive Lifetime

Density Drive Lifetime (Total Bytes Written)

64GB 36TB

Notes:

1. Total bytes written calculated with the drive 90% full.

2. Access patterns are 50% sequential and 50% random and consist of the following: 5%

are 4k; 5% are 8k; 10% are 16k; 10% are 32k; 35% are 64K; and 35% are 128k.

3. GB/day can be calculated by dividing the total bytes written value by (365 × number of

years). For example: 36TB/5 years/365 days = 20 GB/day for 5 years.

C400v 1.8-Inch NAND Flash SSD

Reliability

PDF: 09005aef84559b26

realssd_c400v_1_8.pdf - Rev. D 09/11 EN

Micron Technology, Inc. reserves the right to change products or specifications without notice.

Electrical Characteristics

Stresses greater than those listed may cause permanent damage to the device. This is a

stress rating only, and functional operation of the device at these or any other condi-

tions above those indicated in the operational sections of this specification is not im-

plied. Exposure to absolute maximum rating conditions for extended periods may affect

reliability.

Table 9: SATA Power Consumption

Density Idle Average Active Average

Sequential Write/Read Maximum

(128k transfer) Unit

64GB <65 150 2400 1700 mW

Notes:

1. Data taken at 25°C using a 6 Gb/s SATA interface.

2. Active average power measured while running MobileMark

2007 Productivity Suite.

3. DIPM (device-initiated power management) enabled.

4. Sequential power measured in IOMETER MAX with 128KB transfer size.

Table 10: Maximum Ratings

Parameter/Condition Symbol Min Max Unit

Voltage input V33 3.14 3.46 V

Operating temperature T

0 70 °C

Non-operating temperature –40 85 °C

Rate of temperature change – 20 °C/hour

Relative humidity (non-condensing) 5 95 %

Note:

1. Temperature is best measured with a thermocouple attached to the center point of the

exterior of the case on the side where the SATA connector is not visible. If necessary,

contact with the drive label is acceptable.

Table 11: Shock and Vibration

Parameter/Condition Specification

Operating shock 1500G at 1.0ms

Operating vibration 2–500Hz at 3.1G

C400v 1.8-Inch NAND Flash SSD

Electrical Characteristics

PDF: 09005aef84559b26

realssd_c400v_1_8.pdf - Rev. D 09/11 EN

Micron Technology, Inc. reserves the right to change products or specifications without notice.

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MTFDDAA064MAM-1J1

Mfr. #:

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Manufacturer:

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SSD 64GB 1.8" MLC SATA III 5V

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