2014 Microchip Technology Inc. DS20005134B-page 19
SST25PF040B
TABLE 5-5: RELIABILITY CHARACTERISTICS
Symbol Parameter Minimum Specification Units Test Method
N
END
1
Endurance 10,000 Cycles JEDEC Standard A117
T
DR
1
Data Retention 100 Years JEDEC Standard A103
I
LTH
1
Latch Up 100+I
DD
mA JEDEC Standard 78
1. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
TABLE 5-6: AC OPERATING CHARACTERISTICS 2.3-2.7V
Symbol
25 MHz 50 MHz
Parameter Min Max Min Max Units
F
CLK
1
1. Maximum clock frequency for Read instruction, 03H, is 25 MHz
Serial Clock Frequency 25 50 MHz
T
SCKH
Serial Clock High Time 18 9 ns
T
SCKL
Serial Clock Low Time 18 9 ns
T
SCKR
Serial Clock Rise Time (Slew Rate) 0.1 0.1 V/ns
T
SCKF
Serial Clock Fall Time (Slew Rate) 0.1 0.1 V/ns
T
CES
2
2. Relative to SCK
CE# Active Setup Time 55ns
T
CEH
2
CE# Active Hold Time 55ns
T
CHS
2
CE# Not Active Setup Time 55ns
T
CHH
2
CE# Not Active Hold Time 55ns
T
CPH
CE# High Time 50 50 ns
T
CHZ
CE# High to High-Z Output 77ns
T
CLZ
SCK Low to Low-Z Output 00ns
T
DS
Data In Setup Time 22ns
T
DH
Data In Hold Time 44ns
T
HLS
HOLD# Low Setup Time 55ns
T
HHS
HOLD# High Setup Time 55ns
T
HLH
HOLD# Low Hold Time 55ns
T
HHH
HOLD# High Hold Time 55ns
T
HZ
HOLD# Low to High-Z Output 77ns
T
LZ
HOLD# High to Low-Z Output 77ns
T
OH
Output Hold from SCK Change 00ns
T
V
Output Valid from SCK 12 8 ns
T
SE
Sector-Erase 25 25 ms
T
BE
Block-Erase 25 25 ms
T
SCE
Chip-Erase 50 50 ms
T
BP
Byte-Program 10 10 µs
