NFZ32BW8R4HN11L

SpecNo.JENF243J-0003B-01 P1/9
MURATA MFG.CO., LTD
Reference
Only
CHIP NOISE FILTER NFZ32BW□□□HN11L REFERENCE SPECIFICATION
1.Scope
This reference specification applies to NFZ32BW_HN11L Series, Chip Noise Filter.
2.Part Numbering
(ex) NF Z 32 BW
3R3 H N 1 1 L
Product ID Structure Dimension Features Impedance Performance Category Numbers Other Packaging
(L×W) of Circuit
L:Taping
3.Rating
Operating Temperature Range.
(Ambient temperature; Self-temperature rise is not included) -40 to +105°C
(Product temperature; Self- temperature rise is included) -40 to +125°C
Storage Temperature Range. -40 to +125°C
Customer
Part Number
MURATA
Part Number
Impedance
at 1MHz
DC
Resistance
*1
Rated Current
(mA)
(Ω) Tolerance (Ω) Tolerance
*2
Ambient
temperature
85
*3
Ambient
temperature
105
NFZ32BW3R3HN11L
3.3
±30%
0.024
±20%
2900 1490
NFZ32BW6R8HN11L
6.8 0.036
2500 1380
NFZ32BW8R4HN11L
8.4 0.048
2400 1360
NFZ32BW9R8HN11L
9.8 0.053
2100 1110
NFZ32BW120HN11L
12 0.064
1850 910
NFZ32BW190HN11L
19 0.089
1800 900
NFZ32BW210HN11L
21 0.100
1550 800
NFZ32BW310HN11L
31 0.155
1200 610
NFZ32BW520HN11L
52 0.220
1100 550
NFZ32BW650HN11L
65 0.295
900 450
NFZ32BW101HN11L
100 0.475
900 330
NFZ32BW151HN11L
150 0.685
700 270
*1: As for the rated current, rated current derated as figure.1 depending on the operating temperature.
*2: When applied rated current to the Products, temperature rise caused by self heating will be 40°C or less.
*3: When applied rated current to the Products, temperature rise caused by self heating will be 20°C or less.
Fugure. 1
Rated
Current
at85
Rated
Current
at105
85
105
OperatingTemperature
(
Ambienttemperature
)[]
RatedCurrent [mA]
SpecNo.JENF243J-0003B-01 P2/9
MURATA MFG.CO., LTD
Reference
Only
4. Testing Conditions
Unless otherwise specified In case of doubt
Temperature : Ordinary Temperature (15 to 35°C) Temperature
: 20 ± 2°C
Humidity
: Ordinary Humidity (25 to 85 %(RH)) Humidity : 60 to 70 %(RH)
Atmospheric Pressure : 86 to 106 kPa
5.Appearance and Dimensions
6.Electrical Performance
No. Item Specification Test Method
6.1 Impedance Impedance shall meet item 3. Measuring Equipment : Agilent 4192A or equivalent
Measuring Frequency: 1MHz
6.2 DC Resistance DC Resistance shall meet item 3. Measuring Equipment: Digital multi meter
7.Mechanical Performance
No. Item Specification Test Method
7.1 Shear Test Chip Noise Filter shall not be
damaged.
Substrate: Glass-epoxy substrate
Force: 10N
Hold Duration: 5±1s
7.2 Bending Test Substrate: Glass-epoxy substrate
(100×40×1.0mm)
Speed of Applying Force: 0.5mm / s
Deflection: 2mm
Hold Duration: 5s
(in mm)
Unit MassTypical value
0.044g
45
R230
F
Deflection
45
Product
Pressure jig
2.5±0.2
2.7±0.2
2.5±0.2
1.55±0.15
3.2±0.3
0.9±0.3 1.3±0.2 0.9±0.3
※製品本体への表示はありません。
A:2.8以下
(
単位
mm)
No marking.
(in mm)
Chip Coil
Substrate
SpecNo.JENF243J-0003B-01 P3/9
MURATA MFG.CO., LTD
Reference
Only
No. Item Specification Test Method
7.3 Vibration Chip Noise Filter shall not be
damaged.
Oscillation Frequency : 10 to 2000 to 10Hz for 20 min
Total amplitude : 1.5 mm or Acceleration amplitude
98 m/s
2
whichever is smaller.
Testing Time: A period of 2 hours in each of
3 mutually perpendicular directions.
(Total 6 hours)
7.4 Solderability The wetting area of the electrode shall
be at least 90% covered with new
solder coating.
Flux: Ethanol solution of rosin,25(wt)%
(Immersed for 5s to 10s)
Solder : Sn-3.0Ag-0.5Cu
Pre-Heating: 150±10°C / 60 to 90s
Solder Temperature: 240±5°C
Immersion Time: 3±1 s
7.5 Resistance to
Soldering Heat
Appearance: No damage
Impedance Change: within ± 10%
Flux: Ethanol solution of rosin,25(wt)%
(Immersed for 5s to 10s)
Solder : Sn-3.0Ag-0.5Cu
Pre-Heating: 150±10°C / 60 to 90s
Solder Temperature: 270±5°C
Immersion Time: 10±1 s
Then measured after exposure in the room
condition for 24±2 hours.
8.Environmental Performance (It shall be soldered on the substrate.)
No. Item Specification Test Method
8.1 Heat Resistance Appearance: No damage
Impedance Change: within ± 10%
DC Resistance Change: within ± 10%
Temperature: 105±2°C
Time: 1000± hours
Then measured after exposure in the room condition
for 24±2 hours.
8.2 Cold Resistance Temperature: -40±2°C
Time: 1000± hours
Then measured after exposure in the room condition
for 24±2 hours.
8.3 Humidity Temperature: 40±2°C
Humidity: 90~95%(RH)
Time: 1000± hours
Then measured after exposure in the room condition
for 24±2 hours.
8.4 Temperature
Cycle
1 cycle:
1 step: -40±2°C / 30±3 min
2 step: Ordinary temp. / 10 to 15 min
3 step: +105±2°C / 30±3 min
4 step: Ordinary temp. / 10 to 15 min
Total of 10 cycles
Then measured after exposure in the room condition
for 24±2 hours.
48
0
48
0
48
0

NFZ32BW8R4HN11L

Mfr. #:
Manufacturer:
Murata Electronics
Description:
Ferrite Beads 1210 8.4ohm 30%
Lifecycle:
New from this manufacturer.
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