NTHL040N65S3F

NTHL040N65S3F
www.onsemi.com
7
Figure 13. Gate Charge Test Circuit & Waveform
Figure 14. Resistive Switching Test Circuit & Waveforms
Figure 15. Unclamped Inductive Switching Test Circuit & Waveforms
R
L
V
DS
V
GS
V
GS
R
G
DUT
V
DD
V
DS
V
GS
10%
90%
10%
90% 90%
t
on
t
off
t
r
t
f
t
d(on)
t
d(off)
Q
g
Q
gd
Q
gs
V
GS
Charge
V
DS
V
GS
R
L
DUT
I
G
= Const.
V
DD
V
DS
R
G
DUT
V
GS
L
I
D
t
p
V
DD
t
p
Time
I
AS
BV
DSS
I
D
(t)
V
DS
(t)
E
AS
+
1
2
@ LI
AS
2
NTHL040N65S3F
www.onsemi.com
8
Figure 16. Peak Diode Recovery dv/dt Test Circuit & Waveforms
DUT
L
V
DD
R
G
I
SD
V
SD
+
V
GS
Same Type
as DUT
dv/dt controlled by R
G
I
SD
controlled by pulse period
Driver
V
GS
(Driver)
I
SD
(DUT)
V
DS
(DUT)
V
SD
I
RM
10 V
di/dt
V
DD
I
FM
, Body Diode Forward Current
Body Diode Reverse Current
Body Diode Recovery dv/dt
Body Diode
Forward Voltage Drop
D +
Gate Pulse Width
Gate Pulse Period
SUPERFET is a registered trademark of Semiconductor Components Industries, LLC (SCILLC) or its subsidiaries in the United States and/or
other countries.
FRFET is a registered trademark of Semiconductor Components Industries, LLC (SCILLC) or its subsidiaries in the United States and/or other
countries.
TO−247−3LD
CASE 340CH
ISSUE O
DATE 31 OCT 201
6
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
http://onsemi.com
1
© Semiconductor Components Industries, LLC, 2002
October, 2002 − Rev. 0
Case Outline Number:
XXX
DOCUMENT NUMBER:
STATUS:
NEW STANDARD:
DESCRIPTION:
98AON13853G
ON SEMICONDUCTOR STANDARD
TO−247−3LD
Electronic versions are uncontrolled except when
accessed directly from the Document Repository. Printed
versions are uncontrolled except when stamped
“CONTROLLED COPY” in red.
PAGE 1 OF 2

NTHL040N65S3F

Mfr. #:
Manufacturer:
ON Semiconductor
Description:
MOSFET SUPERFET3 650V TO247
Lifecycle:
New from this manufacturer.
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