MT9VDDT3272AY-335K1

PDF: 09005aef808f912d/Source: 09005aef808f8ccd Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD9C32_64x72A.fm - Rev. F 10/08 EN
10 ©2003 Micron Technology, Inc. All rights reserved.
256MB, 512MB (x72, ECC, SR) 184-Pin DDR SDRAM UDIMM
Electrical Specifications
Table 10: Idd Specifications and Conditions – 256MB (All other Die Revisions)
Values are for the MT46V32M8 DDR SDRAM only and are computed from values specified in the
256Mb (32 Meg x 8) component data sheet
Parameter/Condition Symbol -40B -335 -262
-26A/
-265
Units
Operating one bank active-precharge current:
t
RC =
t
RC (MIN);
t
CK =
t
CK (MIN); DQ, DM, and DQS inputs
changing once per clock cycle; Address and control inputs
changing once every 2 clock cycles
Idd0 1215 1125 1125 1080 mA
Operating one bank active-read-precharge current: BL = 4;
t
RC =
t
RC (MIN);
t
CK =
t
CK (MIN); Iout = 0mA; Address and
control inputs changing once per clock cycle
Idd1 1530 1530 1440 1305 mA
Precharge power-down standby current: All device banks
idle; Power-down mode;
t
CK =
t
CK (MIN); CKE = LOW
Idd2P36363636mA
Idle standby current: CS# = HIGH; All device banks idle;
t
CK =
t
CK (MIN); CKE = HIGH; Address and other control inputs
changing once per clock cycle;
Vin
=
Vref
for DQ, DM, and DQS
Idd2F 540 450 405 405 mA
Active power-down standby current: One device bank
active; Power-down mode;
t
CK =
t
CK (MIN); CKE = LOW
Idd3P 360 270 225 225/
270
mA
Active standby current: CS# = HIGH; CKE = HIGH; One device
bank active;
t
RC =
t
RAS (MAX);
t
CK =
t
CK (MIN); DQ, DM, and
DQS inputs changing twice per clock cycle; Address and other
control inputs changing once per clock cycle
Idd3N 630 540 450 450 mA
Operating burst read current: BL = 2; Continuous burst reads;
One device bank active; Address and control inputs changing
once per clock cycle;
t
CK =
t
CK (MIN); Iout = 0mA
Idd4R 1800 1575 1350 1350 mA
Operating burst write current: BL = 2; Continuous burst
writes; One device bank active; Address and control inputs
changing once per clock cycle;
t
CK =
t
CK (MIN); DQ, DM, and
DQS inputs changing twice per clock cycle
Idd4W 1755 1575 1350 1350 mA
Auto refresh current
t
RFC =
t
RFC (MIN)
Idd5 2340 2295 2115 2115/
2205
mA
t
RFC = 7.8125µs
Idd5A54545454mA
Self refresh current: CKE 0.2V
Idd6 36 36 36 36 mA
Operating bank interleave read current: Four device bank
interleaving reads (BL = 4) with auto precharge;
t
RC =
t
RC (MIN);
t
CK =
t
CK (MIN); Address and control inputs change only during
active READ or WRITE commands
Idd7 4230 3690 3150 3150/
3285
mA
PDF: 09005aef808f912d/Source: 09005aef808f8ccd Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD9C32_64x72A.fm - Rev. F 10/08 EN
11 ©2003 Micron Technology, Inc. All rights reserved.
256MB, 512MB (x72, ECC, SR) 184-Pin DDR SDRAM UDIMM
Electrical Specifications
Table 11: Idd Specifications and Conditions – 512MB
Values are for the MT46V64M8 DDR SDRAM only and are computed from values specified in the
512Mb (64 Meg x 8) component data sheet
Parameter/Condition Symbol -40B -335 -262
-26A/
-265
Units
Operating one bank active-precharge current:
t
RC =
t
RC (MIN);
t
CK =
t
CK (MIN); DQ, DM, and DQS inputs changing once per clock
cycle; Address and control inputs changing once every 2 clock cycles
Idd0 1395 1170 1170 1035 mA
Operating one bank active-read-precharge current:
BL = 4;
t
RC =
t
RC (MIN);
t
CK =
t
CK (MIN); Iout = 0mA; Address and control
inputs changing once per clock cycle
Idd1 1665 1440 1440 1305 mA
Precharge power-down standby current: All device banks idle;
Power-down mode;
t
CK =
t
CK (MIN); CKE = LOW
Idd2P45454545mA
Idle standby current: CS# = HIGH; All device banks idle;
t
CK =
t
CK (MIN); CKE = HIGH; Address and other control inputs
changing once per clock cycle;
Vin
=
Vref
for DQ, DM, and DQS
Idd2F 495 405 405 360 mA
Active power-down standby current: One device bank active;
Power-down mode;
t
CK =
t
CK (MIN); CKE = LOW
Idd3P 405 315 315 270 mA
Active standby current: CS# = HIGH; CKE = HIGH; One device bank
active;
t
RC =
t
RAS (MAX);
t
CK =
t
CK (MIN); DQ, DM, and DQS inputs
changing twice per clock cycle; Address and other control inputs
changing once per clock cycle
Idd3N 540 450 450 405 mA
Operating burst read current: BL = 2; Continuous burst reads;
One device bank active; Address and control inputs changing once
per clock cycle;
t
CK =
t
CK (MIN); Iout = 0mA
Idd4R 1710 1485 1485 1305 mA
Operating burst write current: BL = 2; Continuous burst writes;
One device bank active; Address and control inputs changing once
per clock cycle;
t
CK =
t
CK (MIN); DQ, DM, and DQS inputs changing
twice per clock cycle
Idd4W 1755 1575 1395 1215 mA
Auto refresh current
t
RFC =
t
RFC (MIN)
Idd5 3105 2610 2610 2520 mA
t
RFC = 7.8125µs
Idd5A99909090mA
Self refresh current: CKE 0.2V
Idd6 45 45 45 45 mA
Operating bank interleave read current: Four device bank
interleaving reads (BL = 4) with auto precharge;
t
RC =
t
RC (MIN);
t
CK =
t
CK (MIN); Address and control inputs change only during
active READ or WRITE commands
Idd7 4050 3645 3600 3150 mA
PDF: 09005aef808f912d/Source: 09005aef808f8ccd Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD9C32_64x72A.fm - Rev. F 10/08 EN
12 ©2003 Micron Technology, Inc. All rights reserved.
256MB, 512MB (x72, ECC, SR) 184-Pin DDR SDRAM UDIMM
Serial Presence-Detect
Serial Presence-Detect
Notes: 1. To avoid spurious start and stop conditions, a minimum delay is placed between SCL = 1 and
the falling or rising edge of SDA.
2. This parameter is sampled.
3. For a restart condition or following a WRITE cycle.
4. The SPD EEPROM WRITE cycle time (
t
WRC) is the time from a valid stop condition of a write
sequence to the end of the EEPROM internal ERASE/PROGRAM cycle. During the WRITE
cycle, the EEPROM bus interface circuit is disabled, SDA remains HIGH due to pull-up resis-
tance, and the EEPROM does not respond to its slave address.
Serial Presence-Detect Data
For the latest serial presence-detect data, refer to Microns SPD page:
www.micron.com/SPD.
Table 12: Serial Presence-Detect EEPROM DC Operating Conditions
Parameter/Condition Symbol Min Max Units
Supply voltage
Vddspd 2.3 3.6 V
Input high voltage: Logic 1; All inputs
Vih Vddspd × 0.7 Vddspd + 0.5 V
Input low voltage: Logic 0; All inputs
Vil –1.0 Vddspd × 0.3 V
Output low voltage: Iout = 3mA
Vol 0.4 V
Input leakage current: Vin = GND to Vdd
Ili 10 µA
Output leakage current: Vout = GND to Vdd
Ilo 10 µA
Standby current: SCL = SDA = Vdd - 0.3V; All other inputs = Vss or Vdd
Isb 30 µA
Power supply current: SCL clock frequency = 100 kHz
Icc 2.0 mA
Table 13: Serial Presence-Detect EEPROM AC Operating Conditions
Parameter/Condition Symbol Min Max Units Notes
SCL LOW to SDA data-out valid
t
AA 0.2 0.9 µs 1
Time the bus must be free before a new transition can start
t
BUF 1.3 µs
Data-out hold time
t
HD:DAT 200 ns
SDA fall time
t
F–300ns2
SDA rise time
t
R–300ns2
Data-in hold time
t
HD:DI 0 µs
Start condition hold time
t
HD:STA 0.6 µs
Clock HIGH period
t
HIGH 0.6 µs
Clock LOW period
t
LOW 1.3 µs
SCL clock frequency
f
SCL 400 kHz
Data-in setup time
t
SU:DAT 100 ns
Start condition setup time
t
SU:STA 0.6 µs 3
Stop condition setup time
t
SU:STO 0.6 µs
WRITE cycle time
t
WRC 5 ms 4

MT9VDDT3272AY-335K1

Mfr. #:
Manufacturer:
Micron
Description:
MODULE DDR SDRAM 256MB 184UDIMM
Lifecycle:
New from this manufacturer.
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