LC75836W
www.onsemi.com
2
Specifications
Absolute Maximum Ratings
at Ta = 25C, V
SS
= 0 V
Parameter Symbol Conditions Ratings Unit
Maximum supply voltage V
DD
max V
DD
0.3 to +7.0 V
Input voltage V
IN
1 CE, CL, DI,
INH
0.3 to +7.0
V
V
IN
2 OSC, V
DD
1, V
DD
2
0.3 to V
DD
+0.3
Output voltage V
OUT
S1 to S35, COM1 to COM4, P1 to P4, OSC
0.3 to V
DD
+0.3 V
Output current I
OUT
1 S1 to S35
300 A
I
OUT
2 COM1 to COM4
3
mA
I
OUT
3 P1 to P4
5
Allowable power dissipation Pdmax Ta = 85C
100 mW
Operating temperature Topr
40 to +85 C
Storage temperature Tstg
55 to +125 C
Allowable Operating Ranges at Ta = 40 to +85C, V
SS
= 0 V
Parameter Symbol Conditions
Ratings
Unit
min typ max
Supply voltage V
DD
V
DD
4.5 6.0 V
Input voltage V
DD
1 V
DD
1
2/3V
DD
V
DD
V
V
DD
2 V
DD
2
1/3V
DD
V
DD
Input high-level voltage V
IH
1 CE, CL, DI,
INH
0.4V
DD
6.0
V
V
IH
2 OSC external clock operating mode
0.4V
DD
V
DD
Input low-level voltage V
IL
1 CE, CL, DI,
INH
0 0.2V
DD
V
V
IL
2 OSC external clock operating mode
0 0.2V
DD
Recommended external
resistor
for RC oscillation
Rosc OSC RC oscillator operating mode
39 kΩ
Recommended external
capacitor
for RC oscillation
Cosc OSC RC oscillator operating mode
1000 pF
Guaranteed range of RC
oscillation
fosc OSC RC oscillator operating mode
19 38 76 kHz
External clock operating
frequency
f
CK
OSC external clock operating mode
[Figure 4]
19 38 76 kHz
External clock duty cycle D
CK
OSC external clock operating mode
[Figure 4]
30 50 70 %
Data setup time tds CL, DI [Figure 2] [Figure 3]
160 ns
Data hold time tdh CL, DI [Figure 2] [Figure 3]
160 ns
CE wait time tcp CE, CL [Figure 2] [Figure 3]
160 ns
CE setup time tcs CE, CL [Figure 2] [Figure 3]
160 ns
CE hold time tch CE, CL [Figure 2] [Figure 3]
160 ns
High-level clock pulse width
tH CL [Figure 2] [Figure 3]
160 ns
Low-level clock pulse width
tL CL [Figure 2] [Figure 3]
160 ns
Rise time tr CE, CL, DI [Figure 2] [Figure 3]
160 ns
Fall time tf CE, CL, DI [Figure 2] [Figure 3]
160 ns
INH
switching time tc
INH
, CE [Figure 5]
10 s
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed,
damage may occur and reliability may be affected.
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond the Recommended
Operating Ranges limits may affect device reliability.
