LTC1857/LTC1858/LTC1859
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MUX ADDRESS
The first four bits of the input word assign the MUX
configuration for the requested conversion. For a given
channel selection, the converter will measure the voltage
between the two channels indicated by the + and – signs in
the selected row of Table 1. Note that in differential mode
(SGL/DIFF = 0) measurements are limited to four adjacent
input pairs with either polarity. In single-ended mode, all
input channels are measured with respect to COM. Both
the “+” and “–” inputs are sampled simultaneously so
common mode noise is rejected.
INPUT RANGE (UNI, GAIN)
The fifth and sixth input bits (UNI, GAIN) determine the
input range for the conversion. When UNI is a logical one,
a unipolar conversion will be performed. When UNI is a
logical zero, a bipolar conversion will result. The GAIN
input bit determines the input span for the conversion.
When GAIN is a logical one, either 0V to 10V or ±10V input
spans will be selected depending on UNI. When GAIN is
a logical zero, either 0V to 5V or ±5V input spans will be
chosen. The input ranges for different UNI and GAIN inputs
are shown in Table 2.
Table 2. Input Range Selection
UNI GAIN INPUT RANGE
0 0 ±5V
1 0 0V to 5V
0 1 ±10V
1 1 0V to 10V
P
OWER DOWN SELECTION (NAP, SLEEP)
The last two bits of the input word (Nap and Sleep) deter-
mine the power shutdown mode of the LTC1857/LTC1858/
LTC1859. See Table 3. Nap mode is selected when Nap =
1 and Sleep = 0. The previous conversion result will be
clocked out and a conversion will occur before entering
the Nap mode. The Nap mode starts at the end of the
conversion which is indicated by the rising edge of the
BUSY signal. Nap mode lasts until the falling edge of the
2nd SCK (see Figure 9). Automatic nap will be achieved
if Nap = 1 is selected each time an input word is written
to the ADC.
Table 3. Power Down Selection
NAP SLEEP POWER DOWN MODE
0 0 Power On
1 0 Nap
X 1 Sleep
Sleep mode will occur when Sleep = 1 is selected,
regardless of the selection of the Nap input. The previ
-
ous conversion result can be clocked out and the Sleep
mode will start on the falling edge of the last (16th) SCK.
Notice that the CONVST should stay either high or low in
sleep mode (see Figure 10). To wake up from the sleep
mode, apply a rising edge on the CONVST signal and
then apply Sleep = 0 on the next SDI word and the part
will wake up on the falling edge of the last (16th) SCK
(see Figure 11).
In Sleep mode, all bias currents are shut down and only the
power on reset circuit and leakage currents (about 10µA)
remain. Sleep mode wake-up time is dependent on the value
of the capacitor connected to the REFCOMP (Pin 16). The
wake-up time is typically 40ms with the recommended
10µF capacitor connected on the REFCOMP pin.
DYNAMIC PERFORMANCE
FFT (Fast Fourier Transform) test techniques are used to
test the ADC’s frequency response, distortion and noise
at the rated throughput. By applying a low distortion
sine wave and analyzing the digital output using an FFT
algorithm, the ADC’s spectral content can be examined
for frequencies outside the fundamental. Figure 12 shows
a typical LTC1859 FFT plot which yields a SINAD of 87dB
and THD of –101dB.
APPLICATIONS INFORMATION
LTC1857/LTC1858/LTC1859
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APPLICATIONS INFORMATION
Figure 9. Nap Mode Operation for the LTC1859*
SGL/
DIFF
1
RD
SCK
SDI
Hi-Z
SDO
BUSY
CONVST
2 3 4 5 6 7 8 15 16
ODD/
SIGN
SELECT
1
SELECT
0
UNI GAIN NAP = 1 SLEEP = 0 DON’T CARE
DON’T
CARE
B14 B13 B12B15 (MSB)
B11 B10 B9 B8 B1 B0 (LSB)
t
CONV
Hi-Z
NAPt
ACQ
t
ACQ
SHIFT CONFIGURATION WORD IN
SGL/
DIFF
1 2 3 4 5 6 7 8 15 16
ODD/
SIGN
SELECT
1
SELECT
0
UNI GAIN NAP SLEEP DON’T CARE
B14 B13 B12B15 MSB
B11 B10 B9 B8 B1
1859 F09
B0 (LSB)
Hi-Z
SHIFT A/D RESULT OUT FROM PREVIOUS CONVERSION AND NEW CONFIGURATION WORD IN
Figure 11. Wake Up from Sleep Mode for the LTC1859*
Figure 10. Sleep Mode Operation for the LTC1859*
SGL/
DIFF
1
RD
SCK
SDI
SDO
BUSY
CONVST
2 3 4 5 6 7 8 15 16
ODD/
SIGN
SELECT
1
SELECT
0
UNI GAIN NAP
SLEEP = 0
DON’T CARE
DON’T
CARE
B14 B13 B12B15 (MSB)
B11 B10 B9 B8 B1 B0 (LSB)
WAKE-UP
TIME
READY
t
CONV
SLEEP
SHIFT WAKE-UP CONFIGURATION WORD IN
SGL/
DIFF
1 2 3 4 5 6 7 8 15 16
ODD/
SIGN
SELECT
1
SELECT
0
UNI GAIN NAP SLEEP DON’T CARE
B14 B13 B12B15 (MSB)
B11 B10 B9 B8 B1
1859 F11
B0 (LSB)
A/D RESULT NOT VALID
SHIFT A/D RESULT OUT AND NEW CONFIGURATION WORD IN
t
CONV
*For the 12-bit LTC1857 and 14-bit LTC1858, the last four and two bits of the SDO will output zeros respectively.
SGL/
DIFF
1
RD
SCK
SDI
SDO
BUSY
CONVST
2 3 4 5 6 7 8 15 16
ODD/
SIGN
SELECT
1
SELECT
0
UNI GAIN NAP
SLEEP = 1
DON’T CARE
DON’T
CARE
B14 B13 B12B15 (MSB)
B11 B10 B9 B8 B1 B0 (LSB)
SHIFT WAKE-UP CONFIGURATION WORD IN
1859 F10
A/D RESULT NOT VALID
CONVST SHOULD STAY EITHER HIGH OR LOW IN SLEEP MODE
t
CONV
SLEEP
LTC1857/LTC1858/LTC1859
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FREQUENCY (kHz)
0
MAGNITUDE (dB)
–60
–40
–20
0
40
1859 F12
–80
–100
–70
–50
–30
–10
–90
–110
–130
–120
10
20
30
5 45
15
25
35
50
f
SAMPLE
= 100kHz
f
IN
= 1kHz
SINAD = 86.95dB
THD = –101.42dB
APPLICATIONS INFORMATION
SIGNAL-TO-NOISE RATIO
The Signal-to-Noise and Distortion Ratio (SINAD) is the
ratio between the RMS amplitude of the fundamental input
frequency to the RMS amplitude of all other frequency
components at the A/D output. The output is band limited
to frequencies from above DC and below half the sampling
frequency. Figure 12 shows a typical SINAD of 87dB with
a 100kHz sampling rate and a 1kHz input.
TOTAL HARMONIC DISTORTION
Total Harmonic Distortion (THD) is the ratio of the RMS
sum of all harmonics of the input signal to the fundamental
itself. The out-of-band harmonics alias into the frequency
band between DC and half the sampling frequency. THD
is expressed as:
THD = 20log
V
2
2
3
2
4
22
1
++ +VV V
V
N
...
where V
1
is the RMS amplitude of the fundamental fre-
quency and V
2
through V
N
are the amplitudes of the second
through Nth harmonics.
BOARD LAYOUT, POWER SUPPLIES
AND DECOUPLING
Wire wrap boards are not recommended for high reso
-
lution or high speed A/D converters. To obtain the best
performance from the LTC1857/LTC1858/LTC1859, a
printed circuit board is required. Layout for the printed
circuit board should ensure the digital and analog signal
lines are separated as much as possible. In particular, care
should be taken not to run any digital track alongside an
analog signal track or underneath the ADC. The analog
input should be screened by AGND.
In applications where the MUX is connected to the ADC, it is
possible to get noise coupling into the ADC from the trace
connecting the MUXOUT to the ADC. Therefore, reducing
the length of the traces connecting the MUXOUT pins (Pins
10, 11) to the ADC pins (Pins 12, 13) can minimize the
problem. The unused MUX inputs should be grounded to
prevent noise coupling into the inputs.
Figure 13 shows the power supply grounding that will help
obtain the best performance from the 12-bit/14-bit/16-bit
ADCs. Pay particular attention to the design of the analog
and digital ground planes. The DGND pin of the LTC1857/
Figure 12. LTC1859 Nonaveraged 4096 Point FFT Plot

LTC1857IG#TRPBF

Mfr. #:
Manufacturer:
Analog Devices Inc.
Description:
Analog to Digital Converters - ADC 8-Ch, 12-B, 100ksps SoftSpan A/D Convs w
Lifecycle:
New from this manufacturer.
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