–3–
REV. D
AD7891
Parameter A Version
1
B Version Y Version Unit Test Conditions/Comments
LOGIC OUTPUTS
Output High Voltage, V
OH
4.0 4.0 4.0 V min I
SOURCE
= 200 mA.
Output Low Voltage, V
OL
0.4 0.4 0.4 V max I
SINK
= 1.6 mA.
DB11to DB0
Floating-State Leakage Current ± 10 ± 10 ± 10 mA max
Floating-State Capacitance
5
15 15 15 pF max
Output Coding
Straight (Natural) Binary Data format bit of control register = 0.
Twos Complement Data format bit of control register = 1.
CONVERSION RATE
Conversion Time 1.6 1.6 1.6 ms max
Track/Hold Acquisition Time 0.6 0.6 0.6 ms max AD7891-1 hardware conversion.
0.7 0.7 0.7 ms max AD7891-1 software conversion.
0.4 0.4 0.4 ms max AD7891-2.
POWER REQUIREMENTS
V
DD
555V nom ± 5% for specified performance.
I
DD
Normal Mode 20 20 21 mA max
Standby Mode 80 80 80 mA max Logic inputs = 0 V or V
DD
.
Power Dissipation V
DD
= 5 V.
Normal Mode 100 100 105 mW max Typically 82 mW.
Standby Mode 400 400 400 mW max Typically 75 mW.
NOTES
1
Temperature ranges for the A and B Versions: 40C to +85C. Temperature range for the Y Version: 55C to +105C.
2
The AD7891-1s dynamic performance (THD and SNR) and the AD7891-2s THD are measured with an input frequency of 10 kHz. The AD7891-2s SNR is
evaluated with an input frequency of 100 kHz.
3
This throughput rate can only be achieved when the part is operated in the parallel interface mode. Maximum achievable throughput rate in the serial interface mode
is 357 kSPS.
4
See the Terminology section.
5
Sample tested during initial release and after any redesign or process change that may affect this parameter.
6
REF IN must be buffered before being applied to V
INXB
.
Specifications subject to change without notice.
ABSOLUTE MAXIMUM RATINGS*
(T
A
= 25C, unless otherwise noted)
V
DD
to AGND . . . . . . . . . . . . . . . . . . . . . . . . . 0.3 V to +7 V
V
DD
to DGND . . . . . . . . . . . . . . . . . . . . . . . . . 0.3 V to +7 V
Analog Input Voltage to AGND
AD7891-1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ± 17 V
AD7891-2 . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 V, +10 V
Reference Input Voltage to AGND . . . . 0.3 V to V
DD
+ 0.3 V
Digital Input Voltage to DGND . . . . . . 0.3 V to V
DD
+ 0.3 V
Digital Output Voltage to DGND . . . . . 0.3 V to V
DD
+ 0.3 V
Operating Temperature Range
Commercial (A, B Versions) . . . . . . . . . . . 40C to +85C
Automotive (Y Version) . . . . . . . . . . . . . . 55C to +105C
Storage Temperature Range . . . . . . . . . . . . 65C to +150C
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . 150C
MQFP Package, Power Dissipation . . . . . . . . . . . . . . 450 mW
q
JA
Thermal Impedance . . . . . . . . . . . . . . . . . . . . . . 95C/W
Lead Temperature, Soldering
Vapor Phase (60 sec) . . . . . . . . . . . . . . . . . . . . . . . . 215C
Infrared (15 sec) . . . . . . . . . . . . . . . . . . . . . . . . . . . 220C
PLCC Package, Power Dissipation . . . . . . . . . . . . . . 500 mW
q
JA
Thermal Impedance . . . . . . . . . . . . . . . . . . . . . . 55C/W
Lead Temperature, Soldering
Vapor Phase (60 sec) . . . . . . . . . . . . . . . . . . . . . . . . 215C
Infrared (15 sec) . . . . . . . . . . . . . . . . . . . . . . . . . . . 220C
*Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those listed in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the AD7891 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
AD7891
–4–
REV. D
TIMING CHARACTERISTICS
1, 2
Parameter A, B, Y Versions Unit Test Conditions/Comments
t
CONV
1.6 ms max Conversion Time
Parallel Interface
t
1
0 ns min CS to RD/WR Setup Time
t
2
35 ns min Write Pulse Width
t
3
25 ns min Data Valid to Write Setup Time
t
4
5 ns min Data Valid to Write Hold Time
t
5
0 ns min CS to RD/WR Hold Time
t
6
35 ns min CONVST Pulse Width
t
7
55 ns min EOC Pulse Width
t
8
35 ns min Read Pulse Width
t
9
3
25 ns min Data Access Time after Falling Edge of RD
t
10
4
5 ns min Bus Relinquish Time after Rising Edge of RD
30 ns max
Serial Interface
t
11
30 ns min RFS Low to SCLK Falling Edge Setup Time
t
12
3
20 ns max RFS Low to Data Valid Delay
t
13
25 ns min SCLK High Pulse Width
t
14
25 ns min SCLK Low Pulse Width
t
15
3
5 ns min SCLK Rising Edge to Data Valid Hold Time
t
16
3
15 ns max SCLK Rising Edge to Data Valid Delay
t
17
20 ns min RFS to SCLK Falling Edge Hold Time
t
18
4
0 ns min Bus Relinquish Time after Rising Edge of RFS
30 ns max
t
18A
4
0 ns min Bus Relinquish Time after Rising Edge of SCLK
30 ns max
t
19
20 ns min TFS Low to SCLK Falling Edge Setup Time
t
20
15 ns min Data Valid to SCLK Falling Edge Setup Time
t
21
10 ns min Data Valid to SCLK Falling Edge Hold Time
t
22
30 ns min TFS Low to SCLK Falling Edge Hold Time
NOTES
1
Sample tested during initial release and after any redesign or process change that may affect this parameter. All input signals are measured with tr = tf = 1 ns (10% to
90% of 5 V) and timed from a voltage level of 1.6 V.
2
See Figures 2, 3, and 4.
3
Measured with the load circuit of Figure 1 and defined as the time required for an output to cross 0.8 V or 2.4 V.
4
These times are derived from the measured time taken by the data outputs to change 0.5 V when loaded with the circuit of Figure 1. The measured number is then
extrapolated back to remove the effects of charging or discharging the 50 pF capacitor. This means that the times quoted in the timing characteristics are the true bus
relinquish times of the part and as such are independent of external bus loading capacitances.
Specifications subject to change without notice.
1.6mA
200A
1.6V
TO
OUTPUT
PIN
50pF
Figure 1. Load Circuit for Access Time and Bus Relinquish Time
AD7891
–5–
REV. D
PIN CONFIGURATIONS
PLCC
7
8
9
10
11
12
13
14
15
16
17
6 54321444342 41 40
39
38
37
36
35
34
33
32
31
30
29
18 19 20 21 22 23 24 25 26 27 28
PIN 1
IDENTIFIER
TOP VIEW
(Not to Scale)
NC = NO CONNECT
V
IN6A
AGND
EOC
NC
CONVST
CS
REF GND
NC
REF OUT/REF IN
V
DD
AGND
MODE
DB11/TEST
DB10/TEST
DB9/TFS
DB8/RFS
DB7/DATA IN
STANDBY
V
IN1A
DB6/SCLK
V
DD
DGND
DB5/A2/DATA OUT
DB3/A0
DB2/SWCON
DB1/SWSTBY
DB0/FORMAT
WR
RD
DB4/A1
AD7891
V
IN1B
V
IN2A
V
IN2B
V
IN3A
V
IN3B
V
IN4A
V
IN4B
V
IN5A
V
IN5B
V
IN6B
V
IN7A
V
IN7B
V
IN8A
V
IN8B
MQFP
V
IN6A
AGND
EOC
NC
CONVST
CS
REF GND
NC
REF OUT/REF IN
V
DD
AGND
MODE
DB11/TEST
DB10/TEST
DB9/TFS
DB8/RFS
DB7/DATA IN
STANDBY
V
IN1A
DB6/SCLK
V
DD
DGND
DB5/A2/DATA OUT
DB3/A0
DB2/SWCON
DB1/SWSTBY
DB0/FORMAT
WR
RD
DB4/A1
V
IN1B
V
IN2A
V
IN2B
V
IN3A
V
IN3B
V
IN4A
V
IN4B
V
IN5A
V
IN5B
V
IN6B
V
IN7A
V
IN7B
V
IN8A
V
IN8B
NC = NO CONNECT
44 43 42 41 40 39 38 37 36 35 34
1
2
3
4
5
6
7
8
9
10
11
12 13 14 15 16 17 18 19 20 21 22
33
32
31
30
29
28
27
26
25
24
23
PIN 1
IDENTIFIER
TOP VIEW
(Not to Scale)
AD7891
ORDERING GUIDE
Relative Temperature
Model Input Range Sample Rate Accuracy Range Package Option
1
AD7891ACHIPS-1 DIE
AD7891ACHIPS-2 DIE
AD7891AS-1 ± 5 V or ± 10 V 454 kSPS ± 1 LSB 40C to +85CS-44
AD7891ASZ-1
2
± 5 V or ± 10 V 454 kSPS ± 1 LSB 40C to +85CS-44
AD7891AP-1 ± 5 V or ± 10 V 454 kSPS ± 1 LSB 40C to +85C P-44A
AD7891AP-1REEL ± 5 V or ± 10 V 454 kSPS ± 1 LSB 40C to +85C P-44A
AD7891BS-1 ± 5 V or ± 10 V 454 kSPS ± 0.75 LSB 40C to +85CS-44
AD7891BP-1 ± 5 V or ± 10 V 454 kSPS ± 0.75 LSB 40C to +85C P-44A
AD7891BP-1REEL ± 5 V or ± 10 V 454 kSPS ± 0.75 LSB 40C to +85C P-44A
AD7891YS-1 ± 5 V or ± 10 V 454 kSPS ± 1 LSB 55C to +105CS-44
AD7891YS-1REEL ± 5 V or ± 10 V 454 kSPS ± 1 LSB 55C to +105CS-44
AD7891YP-1 ± 5 V or ± 10 V 454 kSPS ± 1 LSB 55C to +105C P-44A
AD7891YP-1REEL ± 5 V or ± 10 V 454 kSPS ± 1 LSB 55C to +105C P-44A
AD7891AS-2 0 V to +5 V, 0 V to +2.5 V, ± 2.5 V 500 kSPS ± 1 LSB 40C to +85CS-44
AD7891ASZ-2
2
0 V to +5 V, 0 V to +2.5 V, ± 2.5 V 500 kSPS ± 1 LSB 40C to +85CS-44
AD7891AP-2 0 V to +5 V, 0 V to +2.5 V, ± 2.5 V 500 kSPS ± 1 LSB 40C to +85C P-44A
AD7891AP-2REEL 0 V to +5 V, 0 V to +2.5 V, ± 2.5 V 500 kSPS ± 1 LSB 40C to +85C P-44A
AD7891BS-2 0 V to +5 V, 0 V to +2.5 V, ± 2.5 V 500 kSPS ± 0.75 LSB 40C to +85CS-44
AD7891BP-2 0 V to +5 V, 0 V to +2.5 V, ± 2.5 V 500 kSPS ± 0.75 LSB 40C to +85C P-44A
AD7891BP-2REEL 0 V to +5 V, 0 V to +2.5 V, ± 2.5 V 500 kSPS ± 0.75 LSB 40C to +85C P-44A
AD7891YS-2 0 V to +5 V, 0 V to +2.5 V, ± 2.5 V 500 kSPS ± 1 LSB 55C to +105CS-44
AD7891YS-2REEL 0 V to +5 V, 0 V to +2.5 V, ± 2.5 V 500 kSPS ± 1 LSB 55C to +105CS-44
EVAL-AD7891-1CB Evaluation Board
EVAL-AD7891-2CB Evaluation Board
NOTES
1
S = Plastic Quad Flatpack (MQFP); P = Plastic Leaded Chip Carrier (PLCC).
2
Z = Pb-free part.

AD7891ASZ-1

Mfr. #:
Manufacturer:
Analog Devices Inc.
Description:
Analog to Digital Converters - ADC Bipolar Inpt SGL-Sup Parallel 8CH 12B
Lifecycle:
New from this manufacturer.
Delivery:
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