W311
.......................Document #: 38-07703 Rev. ** Page 16 of 18
PCI Clock Outputs (Lump Capacitance Test Load = 30 pF)
Parameter Description Test Condition/Comments Min. Typ. Max. Unit
t
P
Period Measured on rising edge at 1.5V 30 ns
t
H
High Time Duration of clock cycle above 2.4V 12 ns
t
L
Low Time Duration of clock cycle below 0.4V 12 ns
t
R
Output Rise Edge Rate Measured from 0.4V to 2.4V 1 4 V/ns
t
F
Output Fall Edge Rate Measured from 2.4V to 0.4V 1 4 V/ns
t
D
Duty Cycle Measured on rising and falling edge at 1.5V 45 55 %
t
JC
Jitter, Cycle-to-Cycle Measured on rising edge at 1.5V. Maximum
difference of cycle time between two adjacent cycles.
––500ps
t
SK
Output Skew Measured on rising edge at 1.5V 500 ps
t
O
CPU to PCI Clock Skew Covers all CPU/PCI outputs. Measured on rising
edge at 1.5V. CPU leads PCI output.
1.5 4 ns
f
ST
Frequency Stabilization
from Power-up (cold
start)
Assumes full supply voltage reached within 1 ms
from power-up. Short cycles exist prior to frequency
stabilization.
––3ms
Z
o
AC Output Impedance Average value during switching transition. Used for
determining series termination value.
–30–
AGP Clock Outputs (Lump Capacitance Test Load = 30 pF)
Parameter Description Test Condition/Comments Min. Typ. Max. Unit
t
P
Period Measured on rising edge at 1.5V 15 ns
t
H
High Time Duration of clock cycle above 2.4V 5.25 ns
t
L
Low Time Duration of clock cycle below 0.4V 5.05 ns
t
R
Output Rise Edge Rate Measured from 0.4V to 2.4V 1 4 V/ns
t
F
Output Fall Edge Rate Measured from 2.4V to 0.4V 1 4 V/ns
t
D
Duty Cycle Measured on rising and falling edge at 1.5V 45 55 %
t
JC
Jitter, Cycle-to-Cycle Measured on rising edge at 1.5V. Maximum
difference of cycle time between two adjacent
cycles.
500 ps
t
SK
Output Skew Measured on rising edge at 1.5V 250 ps
f
ST
Frequency Stabilization from
Power-up (cold start)
Assumes full supply voltage reached within
1 ms from power-up. Short cycles exist prior to
frequency stabilization.
––3ms
Z
o
AC Output Impedance Average value during switching transition. Used
for determining series termination value.
–30
APIC Clock Output (Lump Capacitance Test Load = 20 pF)
Parameter Description Test Condition/Comments Min. Typ. Max. Unit
f Frequency, Actual Frequency generated from PCI divided by 2 PCI/2 MHz
t
R
Output Rise Edge Rate Measured from 0.4V to 2.4V 0.5 2 V/ns
t
F
Output Fall Edge Rate Measured from 2.4V to 0.4V 0.5 2 V/ns
t
D
Duty Cycle Measured on rising and falling edge at 1.5V 45 55 %
f
ST
Frequency Stabilization
from Power-up (cold start)
Assumes full supply voltage reached within 1 ms
from power-up. Short cycles exist prior to
frequency stabilization.
3ms
Z
o
AC Output Impedance Average value during switching transition. Used
for determining series termination value.
40
W311
.......................Document #: 38-07703 Rev. ** Page 17 of 18
REF Clock Output (Lump Capacitance Test Load = 20 pF)
Parameter Description Test Condition/Comments Min. Typ. Max. Unit
f Frequency, Actual Frequency generated by crystal oscillator 14.318 MHz
t
R
Output Rise Edge Rate Measured from 0.4V to 2.4V 0.5 2 V/ns
t
F
Output Fall Edge Rate Measured from 2.4V to 0.4V 0.5 2 V/ns
t
D
Duty Cycle Measured on rising and falling edge at 1.5V 45 55 %
f
ST
Frequency Stabilization
from Power-up (cold start)
Assumes full supply voltage reached within 1 ms
from power-up. Short cycles exist prior to
frequency stabilization.
––3ms
Z
o
AC Output Impedance Average value during switching transition. Used
for determining series termination value.
–40
48-MHz Clock Output (Lump Capacitance Test Load = 20 pF)
Parameter Description Test Condition/Comments Min. Typ. Max. Unit
f Frequency, Actual Determined by PLL divider ratio (see m/n below) 48.008 MHz
f
D
Deviation from 48 MHz (48.008 – 48)/48 +167 ppm
m/n PLL Ratio (14.31818 MHz x 57/17 = 48.008 MHz) 57/17
t
R
Output Rise Edge Rate Measured from 0.4V to 2.4V 0.5 2 V/ns
t
F
Output Fall Edge Rate Measured from 2.4V to 0.4V 0.5 2 V/ns
t
D
Duty Cycle Measured on rising and falling edge at 1.5V 45 55 %
f
ST
Frequency Stabilization
from Power-up (cold start)
Assumes full supply voltage reached within 1 ms
from power-up. Short cycles exist prior to
frequency stabilization.
––3ms
Z
o
AC Output Impedance Average value during switching transition. Used
for determining series termination value.
–40
24-MHz Clock Output (Lump Capacitance Test Load = 20 pF)
Parameter Description Test Condition/Comments Min. Typ. Max. Unit
f Frequency, Actual Determined by PLL divider ratio (see m/n below) 24.004 MHz
f
D
Deviation from 24 MHz (24.004 – 24)/24 +167 ppm
m/n PLL Ratio (14.31818 MHz x 57/34 = 24.004 MHz) 57/34
t
R
Output Rise Edge Rate Measured from 0.4V to 2.4V 0.5 2 V/ns
t
F
Output Fall Edge Rate Measured from 2.4V to 0.4V 0.5 2 V/ns
t
D
Duty Cycle Measured on rising and falling edge at 1.5V 45 55 %
f
ST
Frequency Stabilization
from Power-up (cold start)
Assumes full supply voltage reached within 1 ms
from power-up. Short cycles exist prior to
frequency stabilization.
––3ms
Z
o
AC Output Impedance Average value during switching transition. Used
for determining series termination value.
–40a
W311
.......................Document #: 38-07703 Rev. ** Page 18 of 18
Package Drawing and Dimension
Ordering Information
Ordering Code Package Type Product Flow
W311H 48-pin SSOP Commercial, 0°C to 70°C
W311HT 48-pin SSOP - Tape and Reel Commercial, 0°C to 70°C
Lead-free
CYW311OXC 48-pin SSOP Commercial, 0°C to 70°C
CYW311OXCT 48-pin SSOP - Tape and Reel Commercial, 0°C to 70°C

CYW311OXC

Mfr. #:
Manufacturer:
Silicon Labs
Description:
Clock Generators & Support Products System Clock for VIATM Pro-266 DDR Chipset, W311 datasheet
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union

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