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AFBR-57J5APZ

P1-P3P4-P6P7-P9P10-P12P13-P15P16-P18
10
Table 9. Transceiver SOFT DIAGNOSTIC Timing Characteristics (TC = -40°C to 85°C, VccT, VccR = 3.3V ± 10%)
Parameter Symbol Minimum Maximum Unit Notes
Hardware TX_DISABLE Assert Time t_o 10 µs Note 1
Hardware TX_DISABLE Negate Time t_on 1 ms Note 2
Time to initialize, including reset of TX_FAULT t_init 300 ms Note 3
Hardware TX_FAULT Assert Time t_fault 100 µs Note 4
Hardware TX_DISABLE to Reset t_reset 10 µs Note 5
Hardware RX_LOS DeAssert Time t_loss_on 100 µs Note 6
Hardware RX_LOS Assert Time t_loss_o 100 µs Note 7
Software TX_DISABLE Assert Time t_o_soft 100 ms Note 9
Software TX_DISABLE Negate Time t_on_soft 100 ms Note 10
Software Tx_FAULT Assert Time t_fault_soft 100 ms Note 11
Software Rx_LOS Assert Time t_loss_on_soft 100 ms Note 12
Software Rx_LOS De-Assert Time t_loss_o_soft 100 ms Note 13
Analog parameter data ready t_data 1000 ms Note 15
Serial bus hardware ready t_serial 300 ms Note 16
Write Cycle Time t_write 10 ms Note 17
Serial ID Clock Rate f_serial_clock 100 kHz
Notes
1. Time from rising edge of TX_DISABLE to when the optical output falls below 10% of nominal.
2. Time from falling edge of TX_DISABLE to when the modulated optical output rises above 90% of nominal.
3. Time from power on or falling edge of Tx_Disable to when the modulated optical output rises above 90% of nominal.
4. From power on or negation of TX_FAULT using TX_DISABLE.
5. Time TX_DISABLE must be held high to reset the laser fault shutdown circuitry.
6. Time from loss of optical signal to Rx_LOS Assertion.
7. Time from valid optical signal to Rx_LOS De-Assertion.
8. Time from two-wire interface assertion of TX_DISABLE (A2h, byte 110, bit 6) to when the optical output falls below 10% of nominal. Measured
from falling clock edge after stop bit of write transaction.
9. Time from two-wire interface de-assertion of TX_DISABLE (A2h, byte 110, bit 6) to when the modulated optical output rises above 90% of
nominal.
10. Time from fault to two-wire interface TX_FAULT (A2h, byte 110, bit 2) asserted.
11. Time for two-wire interface assertion of Rx_LOS (A2h, byte 110, bit 1) from loss of optical signal.
12. Time for two-wire interface de-assertion of Rx_LOS (A2h, byte 110, bit 1) from presence of valid optical signal.
13. From power on to data ready bit asserted (A2h, byte 110, bit 0). Data ready indicates analog monitoring circuitry is functional.
14. Time from power on until module is ready for data transmission over the serial bus (reads or writes over A0h and A2h).
15. Time from stop bit to completion of a 1-8 byte write command.
11
Table 10. Transceiver Digital Diagnostic Monitor (Real Time Sense) Characteristics (TC = -40°C to 85°C, VccT, VccR = 3.3V ± 10%)
Parameter Symbol Min Units Notes
Transceiver Internal
Temperature Accuracy
T
INT
+/- 3.0 °C Temperature is measured internal to the transceiver.
Valid from = -40°C to 85 °C case temperature.
Transceiver Internal Supply
Voltage Accuracy
V
INT
+/- 0.1 V Supply voltage is measured internal to the transceiver and
can, with less accuracy, be correlated to voltage at the SFP Vcc
pin. Valid over 3.3 V ± 10%.
Transmitter Laser DC Bias
Current Accuracy
I
INT
+/- 10 % I
INT
is better than +/-10% of the nominal value.
Transmitted Average Optical
Output Power Accuracy
P
T
+/- 3.0 dB Coupled into 50/125um multi-mode ber.
Valid from 100 uW to 500 uW, avg.
Received Average Optical
Input Power Accuracy
P
R
+/- 3.0 dB Coupled from 50/125um multi-mode ber.
Valid from 61 uW to 500 uW, avg.
Description of the Digital Diagnostic Data
Transceiver Internal Temperature
Temperature is measured on the AFBR-57J5APZ using
sensing circuitry mounted on the internal PCB. The
measured temperature will generally be cooler than laser
junction and warmer than SFP case and can be indirect-
ly correlated to SFP case or laser junction temperature
using thermal resistance and capacitance modeling. This
measurement can be used to observe drifts in thermal
operating point or to detect extreme temperature uctu-
ations such as a failure in the system thermal control. For
more information on correlating internal temperature to
case or laser junction contact Avago Technologies.
Transceiver Internal Supply Voltage
Supply voltage is measured on the AFBR-57J5APZ using
sensing circuitry mounted on the internal PCB. Transmit
supply voltage (VccT) is monitored for this readback. The
resultant value can be indirectly correlated to SFP VccT
or VccR pin supply voltages using resistance modeling,
but not with the required accuracy of SFF-8472. Supply
voltage as measured will be generally lower than SFP Vcc
pins due to use of internal transient suppression circuitry.
As such, measured values can be used to observe drifts in
supply voltage operating point, be empirically correlated
to SFP pins in a given host application or used to detect
supply voltage uctuations due to failure or fault in the
system power supply environment. For more information
on correlating internal supply voltage to SFP pins contact
Avago Technologies.
Transmitter Laser DC Bias Current
Laser bias current is measured using sensing circuitry
located on the transmitter laser driver IC. Normal varia-
tions in laser bias current are expected to accommo-
date the impact of changing transceiver temperature
and supply voltage operating points. The AFBR-57J5APZ
uses a closed loop laser bias feedback circuit to maintain
constant optical power. This circuit compensates for
normal VCSEL parametric variations in quantum ecien-
cy, forward voltage and lasing threshold due to changing
transceiver operating points. Consistent increases in laser
bias current observed at equilibrium temperature and
supply voltage could be an indication of laser degrada-
tion. For more information on using laser bias current for
predicting laser lifetime, contact Avago Technologies.
Transmitted Average Optical Output Power
Transmitted average optical power is measured using
sensing circuitry located on the transmitter laser driver
IC and laser optical subassembly. Variations in average
optical power are not expected under normal operation
because the AFBR-57J5APZ uses a closed loop laser bias
feedback circuit to maintain constant optical power.
This circuit compensates for normal VCSEL parametric
variations due to changing transceiver operating points.
Only under extreme laser bias conditions will signicant
drifting in transmitted average optical power be observ-
able. Therefore it is recommended Tx average optical
power be used for fault isolation, rather than predictive
failure purposes.
Received Average Optical Input Power
Received average optical power is measured using
detecting circuitry located on the receiver preamp and
quantizer ICs. Accuracy is +/- 3.0 dB, but typical accuracy
is +/- 2.0 dB. This measurement can be used to observe
magnitude and drifts in incoming optical signal level for
detecting cable plant or remote transmitter problems.
12
TX_FAULT
OCCURANCE OF FAULT
t_fault
TX_DISABLE
TRANSMITTED SIGNAL
TX_FAULT
OCCURANCE OF FAULT
TX_DISABLE
TRANSMITTED SIGNAL
t-fault: TX FAULT ASSERTED, TX SIGNAL NOT RECOVERED t-reset: TX DISABLE ASSERTED THEN NEGATED, TX SIGNAL RECOVERED
t_reset
t_init*
* SFP SHALL CLEAR TX_FAULT IN
< t_init IF THE FAILURE IS TRANSIENT
TX_FAULT
OCCURANCE OF FAULT
t_fault
TX_DISABLE
TRANSMITTED SIGNAL
OPTICAL SIGNAL
LOS
t-fault: TX DISABLE ASSERTED THEN NEGATED, TX SIGNAL NOT RECOVERED t-loss-on & t-loss-o
t_loss_on
t_init*
t_reset
* SFP SHALL CLEAR TX_FAULT IN
< t_init IF THE FAILURE IS TRANSIENT
t_loss_o
OCCURANCE
OF LOSS
TX_FAULT
V
CC
> 3.15V
V
CC
> 3.15V
V
CC
> 3.15V
t_init
TX_DISABLE
TRANSMITTED SIGNAL
t_init
TX_FAULT
TX_DISABLE
TRANSMITTED SIGNAL
t-init: TX DISABLE NEGATED t-init: TX DISABLE ASSERTED
TX_FAULT
t_init
TX_DISABLE
TRANSMITTED SIGNAL
t_o
TX_FAULT
TX_DISABLE
TRANSMITTED SIGNAL
INSERTION
t_on
Figure 4. Transceiver Timing Diagrams (Module Installed Except Where Noted)
P1-P3P4-P6P7-P9P10-P12P13-P15P16-P18

AFBR-57J5APZ

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Fiber Optic Transmitters, Receivers, Transceivers MM BTS SFP Ind-Temp RoHS
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