IS64C25616AL-12CTLA3-TR

Integrated Silicon Solution, Inc. — www.issi.com
1
Rev. C
03/21/2008
Copyright © 2006 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time without notice. ISSI assumes no liability
arising out of the application or use of any information, products or services described herein. Customers are advised to obtain the latest version of this device specification before relying on any
published information and before placing orders for products.
IS61C25616AL IS61C25616AS
IS64C25616AL IS64C25616AS
FEATURES
HIGH SPEED: (IS61/64C25616AL)
High-speed access time: 10ns, 12 ns
Low Active Power: 150 mW (typical)
Low Standby Power: 10 mW (typical)
CMOS standby
LOW POWER: (IS61/64C25616AS)
High-speed access time: 25 ns
Low Active Power: 75 mW (typical)
Low Standby Power: 1 mW (typical)
CMOS standby
TTL compatible interface levels
Single 5V ± 10% power supply
Fully static operation: no clock or refresh
required
Available in 44-pin SOJ package and
44-pin TSOP (Type II)
Commercial, Industrial and Automotive tempera-
ture ranges available
Lead-free available
DESCRIPTION
The ISSI IS61C25616AL/AS and IS64C25616AL/AS are
high-speed, 4,194,304-bit static RAMs organized as 262,144
words by 16 bits. They are fabricated using ISSI's high-
performance CMOS technology. This highly reliable process
coupled with innovative circuit design techniques, yields
access times as fast as 12 ns with low power consumption.
When CE is HIGH (deselected), the device assumes a
standby mode at which the power dissipation can be reduced
down with CMOS input levels.
Easy memory expansion is provided by using Chip Enable
and Output Enable inputs, CE and OE. The active LOW Write
Enable (WE) controls both writing and reading of the memory.
A data byte allows Upper Byte (UB) and Lower Byte (LB)
access.
The IS61C25616AL/AS and IS64C25616AL/AS are pack-
aged in the JEDEC standard 44-pin 400-mil SOJ and 44-pin
TSOP (Type II).
FUNCTIONAL BLOCK DIAGRAM
MARCH 2008
A0-A17
CE
OE
WE
256K x 16
MEMORY ARRAY
DECODER
COLUMN I/O
CONTROL
CIRCUIT
GND
VDD
I/O
DATA
CIRCUIT
I/O0-I/O7
Lower Byte
I/O8-I/O15
Upper Byte
UB
LB
256K x 16 HIGH-SPEED CMOS STATIC RAM
2
Integrated Silicon Solution, Inc. — www.issi.com
Rev. C
03/21/2008
IS61C25616AL IS61C25616AS
IS64C25616AL IS64C25616AS
PIN CONFIGURATIONS
44-Pin SOJ
PIN DESCRIPTIONS
A0-A17 Address Inputs
I/O0-I/O15 Data Inputs/Outputs
CE Chip Enable Input
OE Output Enable Input
WE Write Enable Input
44-Pin TSOP (Type II)
LB Lower-byte Control (I/O0-I/O7)
UB Upper-byte Control (I/O8-I/O15)
NC No Connection
VDD Power
GND Ground
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
A15
A14
A13
A12
A11
CE
I/O0
I/O1
I/O2
I/O3
VDD
GND
I/O4
I/O5
I/O6
I/O7
WE
A10
A9
A8
A7
A16
A0
A1
A2
OE
UB
LB
I/O15
I/O1
4
I/O1
3
I/O12
GND
VDD
I/O11
I/O1
0
I/O9
I/O8
NC
A3
A4
A5
A6
A17
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
A15
A14
A13
A12
A11
CE
I/O0
I/O1
I/O2
I/O3
VDD
GND
I/O4
I/O5
I/O6
I/O7
WE
A10
A9
A8
A7
A16
A0
A1
A2
OE
UB
LB
I/O15
I/O1
4
I/O1
3
I/O12
GND
VDD
I/O11
I/O1
0
I/O9
I/O8
NC
A3
A4
A5
A6
A17
Integrated Silicon Solution, Inc. — www.issi.com —
1-800-379-4774
3
Rev. C
03/21/2008
IS61C25616AL IS61C25616AS
IS64C25616AL IS64C25616AS
TRUTH TABLE
I/O PIN
Mode
WEWE
WEWE
WE
CECE
CECE
CE
OEOE
OEOE
OE
LBLB
LBLB
LB
UBUB
UBUB
UB I/O0-I/O7 I/O8-I/O15 VDD Current
Not Selected X H X X X High-Z High-Z ISB1, ISB2
Output Disabled H L H X X High-Z High-Z ICC1, ICC2
X L X H H High-Z High-Z
Read H L L L H DOUT High-Z ICC1, ICC2
H L L H L High-Z DOUT
HLLLL DOUT DOUT
Write L L X L H DIN High-Z ICC1, ICC2
L L X H L High-Z DIN
LLXLL DIN DIN
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol Parameter Value Unit
VTERM Terminal Voltage with Respect to GND –0.5 to +7.0 V
TSTG Storage Temperature –65 to +150 °C
PT Power Dissipation 1.5 W
IOUT DC Output Current (LOW) 20 mA
Notes:
1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the
device. This is a stress rating only and functional operation of the device at these or any other conditions above
those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect reliability.
DC ELECTRICAL CHARACTERISTICS (Over Operating Range)
Symbol Parameter Test Conditions Min. Max. Unit
VOH Output HIGH Voltage VDD = Min., IOH = –4.0 mA 2.4 V
VOL Output LOW Voltage VDD = Min., IOL = 8.0 mA 0.4 V
VIH Input HIGH Voltage 2.2 VDD + 0.5 V
VIL Input LOW Voltage
(1)
–0.3 0.8 V
ILI Input Leakage GND VIN VDD Com. 1 1 µA
Ind. 2 2
Auto. 5 5
ILO Output Leakage GND VOUT VDD Com. 1 1 µA
Outputs Disabled Ind. 2 2
Auto. 5 5
Note: 1. VIL = –3.0V for pulse width less than 10 ns.
CAPACITANCE
(1,2)
Symbol Parameter Conditions Max. Unit
CIN Input Capacitance VIN = 0V 5 pF
COUT Output Capacitance VOUT = 0V 7 pF
Notes:
1. Tested initially and after any design or process changes that may affect these parameters.
2. Test conditions: T
A = 25°C, f = 1 MHz, VDD = 5.0V.

IS64C25616AL-12CTLA3-TR

Mfr. #:
Manufacturer:
ISSI
Description:
SRAM 4M (256Kx16) 12ns Async SRAM 5v
Lifecycle:
New from this manufacturer.
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