Page 16 Timing Information
Configuration Devices for SRAM-Based LUT Devices January 2012 Altera Corporation
Timing Information
Figure 5 shows the timing waveform when using a configuration device.
Ta bl e 8 lists the timing parameters when using EPC2 devices at 3.3 V.
Figure 5. Timing Waveform Using a Configuration Device
Note to Figure 5:
(1) The EPC2 device drives DCLK low and DATA high after configuration. The EPC1 and EPC1441 devices drive DCLK low and tri-state DATA after
configuration.
DD
D
D
0
1
2
3
D
n
Tr i- St at e
User Mode
(1)
t
OEZX
t
POR
t
CH
t
CL
t
DSU
t
CO
t
DH
Tr i- St at e
OE/nSTATUS
nCS/CONF_DONE
DCLK
DATA
User I/O
INIT_DONE
nINIT_CONF or VCC/nCONFIG
Table 8. Timing Parameters when Using EPC2 devices at 3.3 V
Symbol Parameter Min Typ Max Units
t
POR
POR delay
(1)
——200ms
t
OEZX
OE
high to
DATA
output enabled 80 ns
t
CE
OE
high to first rising edge on
DCLK
——300ns
t
DSU
Data
setup time before rising edge on
DCLK
30 ns
t
DH
Data
hold time after rising edge on
DCLK
0—ns
t
CO
DCLK
to
DATA
out 30 ns
t
CDOE
DCLK
to
DATA
enable/disable 30 ns
f
CLK
DCLK
frequency 5 7.7 12.5 MHz
t
MCH
DCLK
high time for the first device in the configuration chain 40 65 100 ns
t
MCL
DCLK
low time for the first device in the configuration chain 40 65 100 ns
t
SCH
DCLK
high time for subsequent devices 40 ns
t
SCL
DCLK
low time for subsequent devices 40 ns
t
CASC
DCLK
rising edge to n
CASC
25 ns
t
CCA
n
CS
to
nCASC
cascade delay 15 ns
t
OEW
OE
low pulse width (reset) to guarantee counter reset 100 ns
t
OEC
OE
low (reset) to
DCLK
disable delay 30 ns
t
NRCAS
OE
low (reset) to n
CASC
delay 30 ns
Note to Tabl e 8:
(1) During initial power-up, a POR delay occurs to permit voltage levels to stabilize. Subsequent reconfigurations do not incur this delay.
Timing Information Page 17
Configuration Devices for SRAM-Based LUT DevicesJanuary 2012 Altera Corporation
Ta bl e 9 lists the timing parameters when using EPC1 and EPC1441 devices at 3.3 V.
Ta bl e 1 0 lists the timing parameters when using EPC1, EPC2, and EPC1441 devices at
5.0 V.
Table 9. Timing Parameters when Using EPC1 and EPC1441 Devices at 3.3 V
Symbol Parameter Min Typ Max Units
t
POR
POR delay
(1)
——200ms
t
OEZX
OE
high to
DATA
output enabled 80 ns
t
CE
OE
high to first rising edge on
DCLK
——300ns
t
DSU
Data
setup time before rising edge on
DCLK
30 ns
t
DH
Data
hold time after rising edge on
DCLK
0—ns
t
CO
DCLK
to
DATA
out 30 ns
t
CDOE
DCLK
to
DATA
enable/disable 30 ns
f
CLK
DCLK
frequency 2 4 10 MHz
t
MCH
DCLK
high time for the first device in the configuration chain 50 125 250 ns
t
MCL
DCLK
low time for the first device in the configuration chain 50 125 250 ns
t
SCH
DCLK
high time for subsequent devices 50 ns
t
SCL
DCLK
low time for subsequent devices 50 ns
t
CASC
DCLK
rising edge to n
CASC
25 ns
t
CCA
n
CS
to n
CASC
cascade delay 15 ns
t
OEW
OE
low pulse width (reset) to guarantee counter reset 100 ns
t
OEC
OE
low (reset) to
DCLK
disable delay 30 ns
t
NRCAS
OE
low (reset) to n
CASC
delay 30 ns
Note to Tabl e 9:
(1) During initial power-up, a POR delay occurs to permit voltage levels to stabilize. Subsequent reconfigurations do not incur this delay.
Table 10. Timing Parameters when Using EPC1, EPC2, and EPC1441 Devices at 5.0 V (Part 1 of 2)
Symbol Parameter Min Typ Max Units
t
POR
POR delay
(1)
——200ms
t
OEZX
OE
high to
DATA
output enabled 50 ns
t
CE
OE
high to first rising edge on
DCLK
——200ns
t
DSU
Data
setup time before rising edge on
DCLK
30 ns
t
DH
Data
hold time after rising edge on
DCLK
0—ns
t
CO
DCLK
to
DATA
out 20 ns
t
CDOE
DCLK
to
DATA
enable/disable 20 ns
f
CLK
DCLK
frequency 6.7 10 16.7 MHz
t
MCH
DCLK
high time for the first device in the configuration chain 30 50 75 ns
t
MCL
DCLK
low time for the first device in the configuration chain 30 50 75 ns
t
SCH
DCLK
high time for subsequent devices 30 ns
t
SCL
DCLK
low time for subsequent devices 30 ns
t
CASC
DCLK
rising edge to n
CASC
20 ns
t
CCA
nCS
to n
CASC
cascade delay 10 ns
Page 18 Timing Information
Configuration Devices for SRAM-Based LUT Devices January 2012 Altera Corporation
Ta bl e 11 lists the timing parameters when using EPC1, EPC1064, EPC1064V, EPC1213,
and EPC1441 devices when configuring the FLEX 8000 device.
t
OEW
OE
low pulse width (reset) to guarantee counter reset 100 ns
t
OEC
OE
low (reset) to
DCLK
disable delay 20 ns
t
NRCAS
OE
low (reset) to n
CASC
delay 25 ns
Note to Tabl e 10 :
(1) During initial power-up, a POR delay occurs to permit voltage levels to stabilize. Subsequent reconfigurations do not incur this delay.
Table 10. Timing Parameters when Using EPC1, EPC2, and EPC1441 Devices at 5.0 V (Part 2 of 2)
Symbol Parameter Min Typ Max Units
Table 11. FLEX 8000 Device Configuration Parameters Using EPC1, EPC1064, EPC1064V, EPC1213, and EPC1441
Devices
Symbol Parameter
EPC1064V
EPC1064 and
EPC1213
EPC1 and
EPC1441
Unit
Min Max Min Max Min Max
t
OEZX
OE
high to
DATA
output enabled 75 50 50 ns
t
CSZX
n
CS
low to
DATA
output enabled 75 50 50 ns
t
CSXZ
n
CS
high to
DATA
output disabled 75 50 50 ns
t
CSS
n
CS
low setup time to first
DCLK
rising edge 150 100 50 ns
t
CSH
n
CS
low hold time after
DCLK
rising edge 0—0—0—ns
t
DSU
Data
setup time before rising edge on
DCLK
75 50 50 ns
t
DH
Data
hold time after rising edge on
DCLK
0—0—0—ns
t
CO
DCLK
to
DATA
out delay 100 75 75 ns
t
CK
Clock period 240 160 100 ns
f
CK
Clock frequency 4 6 8 MHz
t
CL
DCLK
low time 120 80 50 ns
t
CH
DCLK
high time 120 80 50 ns
t
XZ
OE
low or n
CS
high to
DATA
output disabled 75 50 50 ns
t
OEW
OE
pulse width to guarantee counter reset 150 100 100 ns
t
CASC
Last
DCLK
+ 1 to n
CASC
low delay 90 60 50 ns
t
CKXZ
Last
DCLK
+ 1 to
DATA
tri-state delay 75 50 50 ns
t
CEOUT
n
CS
high to n
CASC
high delay 150 100 100 ns

EPC1PC8CC

Mfr. #:
Manufacturer:
Intel
Description:
IC CONFIG DEVICE
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union

Products related to this Datasheet