4©2016 Integrated Device Technology, Inc June 30, 2016
843441 Data Sheet
Absolute Maximum Ratings
NOTE: Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device.
These ratings are stress specifications only. Functional operation of product at these conditions or any conditions beyond
those listed in the DC Characteristics or AC Characteristics is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect product reliability.
DC Electrical Characteristics
Table 4A. Power Supply DC Characteristics, V
CC
= 3.3V ± 5%, V
EE
= 0V, T
A
= 0°C to 70°C
Table 4B. LVCMOS/LVTTL DC Characteristics, V
CC
= 3.3V ± 5%, V
EE
= 0V, T
A
= 0°C to 70°C
Table 4C. LVPECL DC Characteristics, V
CC
= 3.3V ± 5%, V
EE
= 0V, T
A
= 0°C to 70°C
NOTE 1: Output termination with 50 to V
CC
– 2V.
Item Rating
Supply Voltage, V
CC
4.6V
Inputs, V
I
, (LVCMOS)
XTAL_IN
Other Inputs
0V to V
CC
-0.5V to V
CC
+ 0.5V
Outputs, I
O
Continuos Current
Surge Current
50mA
100mA
Package Thermal Impedance,
JA
16 Lead TSSOP
8 Lead SOIC
81.2°C/W (0 mps)
96.0°C/W (0 lfpm)
Storage Temperature, T
STG
-65C to 150C
Symbol Parameter Test Conditions Minimum Typical Maximum Units
V
CC
Power Supply Voltage 3.135 3.3 3.465 V
I
EE
Power Supply Current 66 mA
Symbol Parameter Test Conditions Minimum Typical Maximum Units
V
IH
Input High Voltage 2 V
DD
+ 0.3 V
V
IL
Input Low Voltage -0.3 0.8 V
I
IH
Input
High Current
F_SEL1 V
CC
= V
IN
= 3.465V 5 µA
SSC_SEL[0:1],
F_SEL0, nPLL_SEL
V
CC
= V
IN
= 3.465V 150 µA
I
IL
Input
Low Current
F_SEL1 V
CC
= 3.465V, V
IN
= 0V -150 µA
SSC_SEL[0:1],
F_SEL0, nPLL_SEL
V
CC
= 3.465V, V
IN
= 0V -5 µA
Symbol Parameter Test Conditions Minimum Typical Maximum Units
V
OH
Output High Voltage; NOTE 1 V
CC
– 1.4 V
CC
– 0.9 V
V
OL
Output Low Voltage; NOTE 1 V
CC
– 2.0 V
CC
– 1.7 V
V
SWING
Peak-to-Peak Output Voltage Swing 0.6 0.9 V
5©2016 Integrated Device Technology, Inc June 30, 2016
843441 Data Sheet
AC Electrical Characteristics
Table 5. AC Characteristics, V
CC
= 3.3V ± 5%, V
EE
= 0V, T
A
= 0°C to 70°C
NOTE: Using a 25MHz, 18pF quartz crystal.
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is
mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium
has been reached under these conditions.
NOTE 1: Please refer to the Phase Noise plots.
NOTE 2: Refer to Application Section for peak-to-peak jitter calculations.
NOTE 3: Tested per JEDEC 65B.
Symbol Parameter Test Conditions Minimum Typical Maximum Units
f
OUT
Output Frequency
F_SEL(1:0) = 00 75 MHz
F_SEL(1:0) = 01 100 MHz
F_SEL(1:0) = 10 150 MHz
F_SEL(1:0) = 11 300 MHz
tjit(Ø)
RMS Phase Jitter
(Random); NOTE 1
75MHz,
Integration Range: 12kHz – 20 MHz
1.33 ps
100MHz,
Integration Range: 12kHz – 20MHz
1.39 ps
150MHz,
Integration Range: 12kHz – 20MHz
1.36 ps
300MHz,
Integration Range: 12kHz – 20MHz
1.37 ps
tjit(per)
Period Jitter, RMS;
NOTE 2, 3
75MHz, SSC Off 4.15 ps
100MHz, SSC Off 4.05 ps
150MHz, SSC Off 4.15 ps
300MHz, SSC Off 4.25 ps
tjit(cc)
Cycle-to-Cycle Jitter:
NOTE 3
75MHz, SSC Off 31 ps
100MHz, SSC Off 31 ps
150MHz, SSC Off 31 ps
300MHz, SSC Off 31 ps
t
R
/ t
F
Output Rise/Fall Time 20% to 80% 200 700 ps
odc Output Duty Cycle 45 55 %
6©2016 Integrated Device Technology, Inc June 30, 2016
843441 Data Sheet
Typical Phase Noise at 100MHz
NOTE: Measured on Aeroflex PN9000
Noise Power dBc
Hz
Offset Frequency (Hz)
100MHz
RMS Phase Jitter (Random)
12kHz to 20MHz = 1.39ps (typical)

843441AM-150LFT

Mfr. #:
Manufacturer:
IDT
Description:
Clock Generators & Support Products FemtoClock SAS/SATA Clock Generator
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
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