DS2782
10 of 28
CURRENT ACCUMULATION
Current measurements are internally summed, or accumulated, at the completion of each conversion period with
the results displayed in the Accumulated Current Register (ACR). The accuracy of the ACR is dependent on both
the current measurement and the conversion time base. The ACR has a range of 0 to 409.6mVh with an LSb of
6.25Vh. Additional read-only registers (ACRL) hold fractional results of each accumulation to avoid truncation
errors. Accumulation of charge current above the maximum register value is reported at the maximum register
value (7FFFh); conversely, accumulation of discharge current below the minimum register value is reported at the
minimum value (8000h).
Charge currents (positive Current register values) less than 100V are not accumulated in order to mask the effect
of accumulating small positive offset errors over long periods. This limits the minimum charge current, for coulomb-
counting purposes, to 5mA for RSNS = 0.020 and 20mA for RSNS = 0.005.
Read and write access is allowed to the ACR. The ACR must be written MSByte first then LSByte. Whenever the
ACR is written, the fractional accumulation result bits are cleared. The write must be completed within 3.515s (one
ACR register update period). A write to the ACR forces the ADC to perform an offset correction conversion and
update the internal offset correction factor. Current measurement and accumulation begins with the second
conversion following a write to the ACR. Writing ACR clears the fractional values in ACRL. The Format of the ACR
register is shown in Figure 8, and the format of ACRL is shown in Figure 9.
In order to preserve the ACR value in case of power loss, the ACR value is backed up to EEPROM. The ACR
value is recovered from EEPROM on power-up. See the Memory Map in Table 2 for specific address location and
backup frequency.
Figure 8. Accumulated Current Register Format, ACR
ACR
R/W & EE
MSB—Address 10h LSB—Address 11h
2
15
2
14
2
13
2
12
2
11
2
10
2
9
2
8
2
7
2
6
2
5
2
4
2
3
2
2
2
1
2
0
MSb LSb MSb LSb
Units: 6.25Vh/Rsns
DS2782
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Figure 9. Fractional/Low Accumulated Current Register Format, ACRL
ACRL
Read Only
MSB—Address 12h LSB—Address 13h
2
11
2
10
2
9
2
8
2
7
2
6
2
5
2
4
2
3
2
2
2
1
2
0
X X X X
MSb LSb MSb LSb
“X”: reserved Units:1.526nVHr/R
SNS
ACR LSb
R
SNS
VSS
-
VSNS
20m 15m 10m 5m
6.25Vh 312.5Ah 416.7Ah 625Ah
1.250mAh
ACR RANGE
R
SNS
VSS
-
VSNS
20m 15m 10m 5m
409.6mVh 20.48Ah 27.30Ah 40.96Ah 81.92Ah
ACCUMULATION BIAS
The Accumulation Bias register (AB) allows an arbitrary bias to be introduced into the current-accumulation
process. The AB can be used to account for currents that do not flow through the sense resistor, estimate currents
too small to measure, estimate battery self-discharge or correct for static offset of the individual DS2782 device.
The AB register allows a user programmed constant positive or negative polarity bias to be included in the current
accumulation process. The user-programmed two’s complement value, with bit weighting the same as the current
register, is added to the ACR once per current conversion cycle. The AB value is loaded on power-up from
EEPROM memory. The format of the AB register is shown in Figure 10.
Figure 10. Accumulation Bias Register Formats
AB
EE
Address 61h
S 2
6
2
5
2
4
2
3
2
2
2
1
2
0
MSb LSb
“S”: sign bit Units: 1.5625V/Rsns
DS2782
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CAPACITY ESTIMATION ALGORITHM
Remaining capacity estimation uses real-time measured values and stored parameters describing the cell
characteristics and application operating limits. The following diagram describes the algorithm inputs and outputs.
Figure 11. Top-Level Algorithm Diagram

DS2782G+

Mfr. #:
Manufacturer:
Maxim Integrated
Description:
Battery Management Stand-Alone Fuel Gauge
Lifecycle:
New from this manufacturer.
Delivery:
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