Table 11: DDR2 I
DD
Specifications and Conditions – 512MB
Values shown for MT47H32M16 DDR2 SDRAM only and are computed from values specified in the 512Mb (32 Meg x 16)
component data sheet
Parameter Symbol
-80E/-
800 -667 -53E -40E Units
Operating one bank active-precharge current:
t
CK =
t
CK (I
DD
),
t
RC =
t
RC (I
DD
),
t
RAS =
t
RAS MIN (I
DD
); CKE is HIGH, S# is HIGH between valid
commands; Address bus inputs are switching; Data bus inputs are switching
I
DD0
1
560 500 460 440 mA
Operating one bank active-read-precharge current: I
OUT
= 0mA; BL =
4, CL = CL (I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RC =
t
RC (I
DD
),
t
RAS =
t
RAS MIN
(I
DD
),
t
RCD =
t
RCD (I
DD
); CKE is HIGH, S# is HIGH between valid commands;
Address bus inputs are switching; Data pattern is same as I
DD4W
I
DD1
1
680 620 560 520 mA
Precharge power-down current: All device banks idle;
t
CK =
t
CK (I
DD
);
CKE is LOW; Other control and address bus inputs are stable; Data bus in-
puts are floating
I
DD2P
2
56 56 56 56 mA
Precharge quiet standby current: All device banks idle;
t
CK =
t
CK (I
DD
);
CKE is HIGH, S# is HIGH; Other control and address bus inputs are stable;
Data bus inputs are floating
I
DD2Q
2
520 440 360 320 mA
Precharge standby current: All device banks idle;
t
CK =
t
CK (I
DD
); CKE is
HIGH, S# is HIGH; Other control and address bus inputs are switching; Da-
ta bus inputs are switching
I
DD2N
2
560 480 400 360 mA
Active power-down current: All device banks open;
t
CK
=
t
CK (I
DD
); CKE is LOW; Other control and address bus in-
puts are stable; Data bus inputs are floating
Fast PDN exit
MR[12] = 0
I
DD3P
2
320 280 240 200 mA
Slow PDN exit
MR[12] = 1
96 96 96 96
Active standby current: All device banks open;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS MAX (I
DD
),
t
RP =
t
RP (I
DD
); CKE is HIGH, S# is HIGH between valid com-
mands; Other control and address bus inputs are switching; Data bus
inputs are switching
I
DD3N
2
600 560 480 400 mA
Operating burst write current: All device banks open; Continuous
burst writes; BL = 4, CL = CL (I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS MAX
(I
DD
),
t
RP =
t
RP (I
DD
); CKE is HIGH, S# is HIGH between valid commands;
Address bus inputs are switching; Data bus inputs are switching
I
DD4W
1
1200 1020 840 640 mA
Operating burst read current: All device banks open; Continuous burst
read, I
OUT
= 0mA; BL = 4, CL = CL (I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS
MAX (I
DD
),
t
RP =
t
RP (I
DD
); CKE is HIGH, S# is HIGH between valid com-
mands; Address bus inputs are switching; Data bus inputs are switching
I
DD4R
1
1120 960 800 620 mA
Burst refresh current:
t
CK =
t
CK (I
DD
); REFRESH command at every
t
RFC
(I
DD
) interval; CKE is HIGH, S# is HIGH between valid commands; Other con-
trol and address bus inputs are switching; Data bus inputs are switching
I
DD5
2
1840 1480 1400 1360 mA
Self refresh current: CK and CK# at 0V; CKE 0.2V; Other control and
address bus inputs are floating; Data bus inputs are floating
I
DD6
2
56 56 56 56 mA
256MB, 512MB, 1GB (x64, DR) 200-Pin DDR2 SODIMM
I
DD
Specifications
PDF: 09005aef80ebed66
htf8c32_64_128x64hd.pdf - Rev. E 3/10 EN
13
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2006 Micron Technology, Inc. All rights reserved.
Table 11: DDR2 I
DD
Specifications and Conditions – 512MB (Continued)
Values shown for MT47H32M16 DDR2 SDRAM only and are computed from values specified in the 512Mb (32 Meg x 16)
component data sheet
Parameter Symbol
-80E/-
800 -667 -53E -40E Units
Operating bank interleave read current: All device banks interleaving
reads; I
OUT
= 0mA; BL = 4, CL = CL (I
DD
), AL =
t
RCD (I
DD
) - 1 ×
t
CK (I
DD
);
t
CK
=
t
CK (I
DD
),
t
RC =
t
RC (I
DD
),
t
RRD =
t
RRD (I
DD
),
t
RCD =
t
RCD (I
DD
); CKE is
HIGH, S# is HIGH between valid commands; Address bus inputs are stable
during deselects; Data bus inputs are switching
I
DD7
1
1500 1420 1380 1360 mA
256MB, 512MB, 1GB (x64, DR) 200-Pin DDR2 SODIMM
I
DD
Specifications
PDF: 09005aef80ebed66
htf8c32_64_128x64hd.pdf - Rev. E 3/10 EN
14
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2006 Micron Technology, Inc. All rights reserved.
Table 12: DDR2 I
DD
Specifications and Conditions – 1GB (Die Revision A)
Values shown for MT47H64M16 DDR2 SDRAM only and are computed from values specified in the 1Gb (64 Meg x 16) com-
ponent data sheet
Parameter Symbol -667 -53E -40E Units
Operating one bank active-precharge current:
t
CK =
t
CK (I
DD
),
t
RC =
t
RC
(I
DD
),
t
RAS =
t
RAS MIN (I
DD
); CKE is HIGH, S# is HIGH between valid commands;
Address bus inputs are switching; Data bus inputs are switching
I
DD0
1
560 460 440 mA
Operating one bank active-read-precharge current: I
OUT
= 0mA; BL = 4, CL
= CL (I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RC =
t
RC (I
DD
),
t
RAS =
t
RAS MIN (I
DD
),
t
RCD =
t
RCD (I
DD
); CKE is HIGH, S# is HIGH between valid commands; Address bus in-
puts are switching; Data pattern is same as I
DD4W
I
DD1
1
540 500 460 mA
Precharge power-down current: All device banks idle;
t
CK =
t
CK (I
DD
); CKE is
LOW; Other control and address bus inputs are stable; Data bus inputs are float-
ing
I
DD2P
2
56 56 56 mA
Precharge quiet standby current: All device banks idle;
t
CK =
t
CK (I
DD
); CKE
is HIGH, S# is HIGH; Other control and address bus inputs are stable; Data bus
inputs are floating
I
DD2Q
2
520 360 320 mA
Precharge standby current: All device banks idle;
t
CK =
t
CK (I
DD
); CKE is
HIGH, S# is HIGH; Other control and address bus inputs are switching; Data bus
inputs are switching
I
DD2N
2
560 400 320 mA
Active power-down current: All device banks open;
t
CK =
t
CK (I
DD
); CKE is LOW; Other control and address bus inputs are
stable; Data bus inputs are floating
Fast PDN exit
MR[12] = 0
I
DD3P
2
320 280 280 mA
Slow PDN exit
MR[12] = 1
112 112 112
Active standby current: All device banks open;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS
MAX (I
DD
),
t
RP =
t
RP (I
DD
); CKE is HIGH, S# is HIGH between valid commands;
Other control and address bus inputs are switching; Data bus inputs are switching
I
DD3N
2
600 480 440 mA
Operating burst write current: All device banks open; Continuous burst
writes; BL = 4, CL = CL (I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS MAX (I
DD
),
t
RP =
t
RP (I
DD
); CKE is HIGH, S# is HIGH between valid commands; Address bus inputs
are switching; Data bus inputs are switching
I
DD4W
1
820 740 640 mA
Operating burst read current: All device banks open; Continuous burst read,
I
OUT
= 0mA; BL = 4, CL = CL (I
DD
), AL = 0;
t
CK =
t
CK (I
DD
),
t
RAS =
t
RAS MAX (I
DD
),
t
RP =
t
RP (I
DD
); CKE is HIGH, S# is HIGH between valid commands; Address bus
inputs are switching; Data bus inputs are switching
I
DD4R
1
900 740 640 mA
Burst refresh current:
t
CK =
t
CK (I
DD
); REFRESH command at every
t
RFC (I
DD
)
interval; CKE is HIGH, S# is HIGH between valid commands; Other control and
address bus inputs are switching; Data bus inputs are switching
I
DD5
2
2160 2000 1920 mA
Self refresh current: CK and CK# at 0V; CKE 0.2V; Other control and ad-
dress bus inputs are floating; Data bus inputs are floating
I
DD6
2
24 24 24 mA
Operating bank interleave read current: All device banks interleaving
reads; I
OUT
= 0mA; BL = 4, CL = CL (I
DD
), AL =
t
RCD (I
DD
) - 1 ×
t
CK (I
DD
);
t
CK =
t
CK
(I
DD
),
t
RC =
t
RC (I
DD
),
t
RRD =
t
RRD (I
DD
),
t
RCD =
t
RCD (I
DD
); CKE is HIGH, S# is
HIGH between valid commands; Address bus inputs are stable during deselects;
Data bus inputs are switching
I
DD7
1
1420 1380 1320 mA
256MB, 512MB, 1GB (x64, DR) 200-Pin DDR2 SODIMM
I
DD
Specifications
PDF: 09005aef80ebed66
htf8c32_64_128x64hd.pdf - Rev. E 3/10 EN
15
Micron Technology, Inc. reserves the right to change products or specifications without notice.
© 2006 Micron Technology, Inc. All rights reserved.

MT8HTF6464HDY-40EB4

Mfr. #:
Manufacturer:
Micron
Description:
MOD DDR2 SDRAM 512MB 200SODIMM
Lifecycle:
New from this manufacturer.
Delivery:
DHL FedEx Ups TNT EMS
Payment:
T/T Paypal Visa MoneyGram Western Union