ADN2804 Data Sheet
Rev. D | Page 12 of 24
TERMINOLOGY
Input Sensitivity and Input Overdrive
Sensitivity and overdrive specifications for the quantizer involve
offset voltage, gain, and noise. The relationship between the
logic output of the quantizer and the analog voltage input is
shown in Figure 12. For sufficiently large positive input voltage,
the output is always Logic 1; similarly, for negative inputs, the
output is always Logic 0. However, the transitions between
output Logic Level 1 and output Logic Level 0 are not at
precisely defined input voltage levels, but occur over a range of
input voltages. Within this range of input voltages, the output
may be either 1 or 0, or it may even fail to attain a valid logic
state. The width of this zone is determined by the input voltage
noise of the quantizer. The center of the zone is the quantizer
input offset voltage. Input overdrive is the magnitude of signal
required to guarantee the correct logic level with 1 × 10
−10
confidence level.
NOISE
OUTPUT
INPUT (V p-p)
OFFSET
OVERDRIVE
SENSITIVITY
(2 × OVERDRIVE)
1
0
05801-012
Figure 12. Input Sensitivity and Input Overdrive
Single-Ended vs. Differential
AC coupling is typically used to drive the inputs to the
quantizer. The inputs are internally dc biased to a common-
mode potential of ~2.5 V. Driving the ADN2804 in a single-
ended fashion and observing the quantizer input with an
oscilloscope probe at the point indicated in Figure 13 shows a
binary signal with an average value equal to the common-mode
potential and instantaneous values both above and below the
average value. It is convenient to measure the peak-to-peak
amplitude of this signal and call the minimum required value
the quantizer sensitivity. Referring to Figure 13, the sensitivity is
twice the overdrive because both positive and negative offsets
need to be accommodated. The ADN2804 quantizer typically
has 3.3 mV p-p sensitivity.
SCOPE
PROBE
PIN
2.5V
VREF
ADN2804
QUANTIZER
+
10mV p-p
VREF
05801-013
50
3k
50
Figure 13. Single-Ended Sensitivity Measurement
When the ADN2804 is driven differentially (see Figure 14),
sensitivity seems to improve if observing the quantizer input
with an oscilloscope probe. This is an illusion caused by the use
of a single-ended probe. A 5 mV p-p signal appears to drive the
ADN2804 quantizer; however, the single-ended probe measures
only half the signal. The true quantizer input signal is twice this
value, because the other quantizer input is a complementary
signal to the signal being observed.
SCOPE
PROBE
PIN
50
3k
2.5V
50
VREF
QUANTIZER
+
NIN
5mV p-p
V
REF
5mV p-p
V
REF
0
5801-014
Figure 14. Differential Sensitivity Measurement
LOS Response Time
LOS response time is the delay between removal of the input
signal and indication of loss of signal (LOS) at the LOS output,
Pin 22. When the inputs are dc-coupled, the LOS assert time of
the AD2804 is 500 ns typical and the deassert time is 400 ns
typical. In practice, the time constant produced by the ac
coupling at the quantizer input and the 50 Ω on-chip input
termination determines the LOS response time.
Data Sheet ADN2804
Rev. D | Page 13 of 24
JITTER SPECIFICATIONS
The ADN2804 CDR is designed to achieve the best bit-
error-rate (BER) performance and to exceed the jitter
transfer, generation, and tolerance specifications proposed
for SONET/SDH equipment defined in the Telcordia
Technologies specification.
Jitter is the dynamic displacement of digital signal edges from
their long-term average positions, measured in unit intervals
(UI), where 1 UI = 1 bit period. Jitter on the input data can
cause dynamic phase errors on the recovered clock sampling
edge. Jitter on the recovered clock causes jitter on the
retimed data.
The following sections briefly summarize the specifications of
jitter generation, transfer, and tolerance in accordance with the
Telcordia document (GR-253-CORE, Issue 3, September 2000)
for the optical interface at the equipment level and the
ADN2804 performance with respect to those specifications.
Jitter Generation
The jitter generation specification limits the amount of jitter
that can be generated by the device with no jitter and wander
applied at the input. For SONET devices, the jitter generated
must be less than 0.01 UI rms and less than 0.1 UI p-p.
Jitter Transfer
The jitter transfer function is the ratio of the jitter on the output
signal to the jitter applied on the input signal vs. the frequency.
This parameter measures the amount of jitter on an input signal
that can be transferred to the output signal (see Figure 15). This
amount is limited.
0.1
ACCEPT
ABLE
RANGE
f
C
JITTER FREQUENC
Y
(kHz)
SLOPE = –20dB/DECADE
JITTER GAIN (dB)
05801-015
Figure 15. Jitter Transfer Curve
Jitter Tolerance
The jitter tolerance is defined as the peak-to-peak amplitude of
the sinusoidal jitter applied on the input signal, which causes a
1 dB power penalty. This is a stress test intended to ensure that
no additional penalty is incurred under the operating
conditions (see Figure 16).
15.00
1.50
0.15
f
0
f
1
f
2
f
3
f
4
JITTER FREQUENCY (kHz)
SLOPE = –20dB/DECADE
INPUT JITTERAMPLITUDE (UI p-p)
05801-016
Figure 16. SONET Jitter Tolerance Mask
ADN2804 Data Sheet
Rev. D | Page 14 of 24
THEORY OF OPERATION
The ADN2804 is a delay- and phase-locked loop circuit for
clock recovery and data retiming from an NRZ encoded data
stream. The phase of the input data signal is tracked by two
separate feedback loops, which share a common control voltage.
A high speed delay-locked loop path uses a voltage controlled
phase shifter to track the high frequency components of input
jitter. A separate phase control loop, composed of the VCO,
tracks the low frequency components of input jitter. The initial
frequency of the VCO is set by yet a third loop that compares
the VCO frequency with the input data frequency and sets the
coarse tuning voltage. The jitter tracking phase-locked loop
controls the VCO by the fine-tuning control.
The delay and phase loops together track the phase of the input
data signal. For example, when the clock lags the input data, the
phase detector drives the VCO to a higher frequency and
increases the delay through the phase shifter; both of these
actions serve to reduce the phase error between the clock and
the data. The faster clock picks up phase, whereas the delayed
data loses phase. Because the loop filter is an integrator, the
static phase error is driven to 0°.
Another view of the circuit is that the phase shifter implements
the zero required for frequency compensation of a second-order
phase-locked loop, and this zero is placed in the feedback path;
therefore, it does not appear in the closed-loop transfer
function. Jitter peaking in a conventional second-order phase-
locked loop is caused by the presence of this zero in the closed-
loop transfer function. Because this circuit has no zero in the
closed-loop transfer, jitter peaking is minimized.
The delay and phase loops together simultaneously provide
wideband jitter accommodation and narrow-band jitter
filtering. The linearized block diagram in Figure 17 shows that
the jitter transfer function, Z(s)/X(s), provides excellent second-
order low-pass filtering. Note that the jitter transfer has no zero,
unlike an ordinary second-order phase-locked loop. This means
that the main PLL loop has virtually no jitter peaking (see
Figure 18), making this circuit ideal for signal regenerator
applications, where jitter peaking in a cascade of regenerators
can contribute to hazardous jitter accumulation.
The error transfer, e(s)/X(s), has the same high-pass form as an
ordinary phase-locked loop. This transfer function can be
optimized to accommodate a significant amount of wideband
jitter, because the jitter transfer function, Z(s)/X(s), provides the
narrow-band jitter filtering.
X(s)
Z(s)
RECOVERED
CLOCK
e(s)
INPUT
DATA
d/sc
psh
o/s
1/n
d = PHASE DETE
C
TOR GAIN
o = VCO GAIN
c = LOOP INTEGRATOR
psh = PHASE SHIFTER GAIN
n = DIVIDE
R
ATIO
=
1
cn
do
s
2
+
n psh
o
s+ 1
Z(s)
X(s)
JITTER TRANSFER FUNCTION
=
s
2
s
2
d psh
c
s++
do
cn
e(s)
X(s)
TRACKING ERROR TRANSFER FUNCTION
0
5801-017
Figure 17. PLL/DLL Architecture
ADN2804
Z(s)
X(s)
FREQUENCY (kHz)
JITTER PEAKING
IN ORDINARY PLL
JITTER GAIN (dB)
o
n psh
d psh
c
0
5801-018
Figure 18. Jitter Response vs. Conventional PLL
The delay and phase loops contribute to overall jitter accom-
modation. At low frequencies of input jitter on the data signal,
the integrator in the loop filter provides high gain to track large
jitter amplitudes with small phase error. In this case, the VCO is
frequency modulated, and jitter is tracked as in an ordinary
phase-locked loop. The amount of low frequency jitter that can
be tracked is a function of the VCO tuning range. A wider
tuning range gives larger accommodation of low frequency
jitter. The internal loop control voltage remains small for small
phase errors; therefore, the phase shifter remains close to the
center of its range and thus contributes little to the low
frequency jitter accommodation.

ADN2804ACPZ-RL7

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Manufacturer:
Analog Devices Inc.
Description:
Timers & Support Products Anyrate 10 Mbps to 2.7Gbps PA/CDR
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