ADN2812 Data Sheet
Rev. E | Page 12 of 28
TERMINOLOGY
INPUT SENSITIVITY AND INPUT OVERDRIVE
Sensitivity and overdrive specifications for the quantizer involve
offset voltage, gain, and noise. The relationship between the
logic output of the quantizer and the analog voltage input is
shown in Figure 12. For sufficiently large positive input voltage,
the output is always at Logic Level 1 and, similarly for negative
inputs, the output is always at Logic Level 0. However, the
output transitions between Logic Level 1 and Logic Level 0
are not at precisely defined input voltage levels but occur over
a range of input voltages. Within this range of input voltages,
the output might be either 1 or 0, or it might even fail to attain
a valid logic state. The width of this zone is determined by the
input voltage noise of the quantizer. The center of the zone is
the quantizer input offset voltage. Input overdrive is the magni-
tude of signal required to guarantee the correct logic level with
1 × 10
−10
confidence level.
04228-012
NOISE
OUTPUT
INPUT (V p-p)
OFFSET
OVERDRIVE
SENSITIVITY
(2
OVERDRIVE)
1
0
Figure 12. Input Sensitivity and Input Overdrive
SINGLE-ENDED VS. DIFFERENTIAL
AC coupling is typically used to drive the inputs to the quan-
tizer. The inputs are internally dc biased to a common-mode
potential of ~2.5 V. Driving the ADN2812 single-ended and
observing the quantizer input with an oscilloscope probe at the
point indicated in Figure 13 show a binary signal with an average
value equal to the common-mode potential and instantaneous
values both above and below the average value. It is convenient
to measure the peak-to-peak amplitude of this signal and call
the minimum required value the quantizer sensitivity. Referring
to Figure 13, because both positive and negative offsets need to
be accommodated, the sensitivity is twice the overdrive. The
ADN2812 quantizer typically has 6 mV p-p sensitivity.
04228-013
SCOPE
PROBE
PIN
50Ω
3kΩ
2.5V
50Ω
VREF
ADN2812
QUANTIZER
+
10mV p-p
VREF
Figure 13. Single-Ended Sensitivity Measurement
While driving the ADN2812 differentially (see Figure 14), sen-
sitivity seems to improve from observing the quantizer input
with an oscilloscope probe. This is an illusion caused by the use
of a single-ended probe. A 5 mV p-p signal appears to drive the
ADN2812 quantizer. However, the single-ended probe measures
only half the signal. The true quantizer input signal is twice
this value because the other quantizer input is a complementary
signal to the signal being observed.
04228-014
SCOPE
PROBE
PIN
50Ω
3kΩ
2.5V
50Ω
VREF
QUANTIZER
+
NIN
5mV p-p
VREF
5mV p-p
VREF
Figure 14. Differential Sensitivity Measurement
LOS RESPONSE TIME
Loss of signal (LOS) response time is the delay between
removal of the input signal and indication of LOS at the LOS
output, Pin 22. When the inputs are dc-coupled, the LOS assert
time of the AD2812 is 500 ns typically and the deassert time is
400 ns typically. In practice, the time constant produced by the
ac coupling at the quantizer input and the 50 Ω on-chip input
termination determines the LOS response time.
Data Sheet ADN2812
Rev. E | Page 13 of 28
JITTER SPECIFICATIONS
The ADN2812 CDR is designed to achieve the best bit-error-
rate (BER) performance and exceeds the jitter transfer, generation,
and tolerance specifications proposed for SONET/SDH equip-
ment defined in the Telcordia Technologies GR-253-CORE
document.
Jitter is the dynamic displacement of digital signal edges from
their long-term average positions, measured in unit intervals
(UI), where 1 UI = 1 bit period. Jitter on the input data can
cause dynamic phase errors on the recovered clock sampling
edge. Jitter on the recovered clock causes jitter on the
retimed data.
The following sections briefly summarize the specifications
of jitter generation, jitter transfer, and jitter tolerance in
accordance with the GR-253-CORE from Telcordia for the
optical interface at the equipment level and the ADN2812
performance with respect to those specifications.
JITTER GENERATION
The jitter generation specification limits the amount of jitter
that can be generated by the device with no jitter and wander
applied at the input. For OC-48 devices, the band-pass filter
has a 12 kHz high-pass cutoff frequency with a roll-off of
20 dB/decade and a low-pass cutoff frequency of at least 20 MHz.
The jitter generated must be less than 0.01 UI rms and must be
less than 0.1 UI p-p.
JITTER TRANSFER
The jitter transfer function is the ratio of the jitter on the output
signal to the jitter applied on the input signal vs. the frequency.
This parameter measures the limited amount of the jitter on an
input signal that can be transferred to the output signal (see
Figure 15).
04228-015
0.1
ACCEPTABLE
RANGE
f
C
JITTER FREQUENCY (kHz)
SLOPE = –20dB/DECADE
JITTER GAIN (dB)
Figure 15. Jitter Transfer Curve
JITTER TOLERANCE
The jitter tolerance is defined as the peak-to-peak amplitude of
the sinusoidal jitter applied on the input signal, which causes a
1 dB power penalty. This is a stress test to ensure that no addi-
tional penalty is incurred under the operating conditions (see
Figure 16).
04228-016
15.00
1.50
0.15
f
0
f
1
f
2
f
3
f
4
JITTER FREQUENCY (kHz)
SLOPE = –20dB/DECADE
INPUT JITTERAMPLITUDE (UI p-p)
Figure 16. SONET Jitter Tolerance Mask
ADN2812 Data Sheet
Rev. E | Page 14 of 28
THEORY OF OPERATION
The ADN2812 is a delay- and phase-locked loop circuit for
clock recovery and data retiming from an NRZ encoded data
stream. The phase of the input data signal is tracked by two
separate feedback loops that share a common control voltage.
A high speed delay-locked loop path uses a voltage controlled
phase shifter to track the high frequency components of input
jitter. A separate phase control loop, comprised of the VCO,
tracks the low frequency components of input jitter. The initial
frequency of the VCO is set by yet a third loop, which compares
the VCO frequency with the input data frequency and sets the
coarse tuning voltage. The jitter tracking phase-locked loop
controls the VCO by the fine-tuning control.
The delay- and phase-loops together track the phase of the
input data signal. For example, when the clock lags input data,
the phase detector drives the VCO to a higher frequency and
also increases the delay through the phase shifter; both these
actions serve to reduce the phase error between the clock and
data. The faster clock picks up phase, while the delayed data
loses phase. Because the loop filter is an integrator, the static
phase error is driven to zero.
Another view of the circuit is that the phase shifter implements
the zero required for frequency compensation of a second-order,
phase-locked loop. This zero is placed in the feedback path and,
thus, does not appear in the closed-loop transfer function. Jitter
peaking in a conventional second-order phase-locked loop is
caused by the presence of this zero in the closed-loop transfer
function. Because this circuit has no zero in the closed-loop
transfer, jitter peaking is minimized.
The delay- and phase-loops together simultaneously provide
wide-band jitter accommodation and narrow-band jitter filter-
ing. The linearized block diagram in Figure 17 shows that the
jitter transfer function, Z(s)/X(s), is a second-order low-pass
providing excellent filtering. Note that the jitter transfer has no
zero, unlike an ordinary second-order phase-locked loop. This
means that the main PLL loop has virtually zero jitter peaking
(see Figure 18), making this circuit ideal for signal regenerator
applications, where jitter peaking in a cascade of regenerators
can contribute to hazardous jitter accumulation.
The error transfer, e(s)/X(s), has the same high-pass form as an
ordinary phase-locked loop. This transfer function is free to be
optimized to give excellent wide-band jitter accommodation
because the jitter transfer function, Z(s)/X(s), provides the
narrow-band jitter filtering.
04228-017
X(s)
Z(s)
RECOVERED
CLOCK
e(s)
INPUT
DATA
d/sc
psh
o/s
1/n
d = PHASE DETECTOR GAIN
o = VCO GAIN
c = LOOP INTEGRATOR
psh = PHASE SHIFTER GAIN
n = DIVIDE RATIO
=
1
cn
do
s
2
+
n psh
o
s + 1
Z(s)
X(s)
JITTER TRANSFER FUNCTION
=
s
2
s
2
d psh
c
s+ +
do
cn
e(s)
X(s)
TRACKING ERROR TRANSFER FUNCTION
Figure 17. PLL/DLL Architecture
ADN2812
Z(s)
X(s)
04228-018
FREQUENCY (kHz)
JITTER PEAKING
IN ORDINARY PLL
JITTER GAIN (dB)
o
n psh
d psh
c
Figure 18. Jitter Response vs. Conventional PLL
The delay- and phase-loops contribute to overall jitter accom-
modation. At low frequencies of input jitter on the data signal,
the integrator in the loop filter provides high gain to track large
jitter amplitudes with small phase error. In this case, the VCO
is frequency modulated and jitter is tracked as in an ordinary
phase-locked loop. The amount of low frequency jitter that
can be tracked is a function of the VCO tuning range. A wider
tuning range gives larger accommodation of low frequency
jitter. The internal loop control voltage remains small for small
phase errors, so the phase shifter remains close to the center of
its range and thus contributes little to the low frequency jitter
accommodation.

ADN2812ACPZ

Mfr. #:
Manufacturer:
Analog Devices Inc.
Description:
Timers & Support Products Continuous Rate 12.3Mbs-2.7Gbs
Lifecycle:
New from this manufacturer.
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