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SCANPSC110F
Level 2 Protocol (Continued)
FIGURE 10. Local Scan Port Synchronization from Parked-RTI State
Register Descriptions
Instruction Register
The instruction shift register is an 8-bit register that is in
series with the scan chain whenever the TAP Controller of
the SCANPSC110F Bridge is in the Shift-IR state. Upon
exiting the Capture-IR state, the value XXXXXX01 is cap-
tured into the instruction register, where XXXXXX repre-
sents the value on the S
(05)
inputs.
When the SCANPSC110F controller is in the Wait-For-
Address state, the instruction register is used for
SCANPSC110F selection via address matching. In
addressing individual SCANPSC110Fs, the chips address-
ing logic performs a comparison between a statically-con-
figured (hard-wired) value on that SCANPSC110Fs slot
inputs, and an address which is scanned into the chips
instruction register. Binary address codes 000000
through 111010 (00 through 3A Hex) are reserved for
addressing individual SCANPSC110Fs. Address 3B Hex
is for Broadcast mode.
In doing multi-cast (group) addressing, a scanned-in
address is compared against the (previously scanned-in)
contents of a SCANPSC110F's Multi-Cast Group register.
Binary address codes 111110 through 111111 (3A
through 3F Hex) are reserved for multi-cast addressing,
and should not be assigned as SCANPSC110F slot-input
values.
Boundary-Scan Register
The boundary-scan register is a sample only shift register
containing cells from the S
(05)
and OE inputs. The register
allows testing of circuitry external to the SCANPSC110F. It
permits the signals flowing between the system pins to be
sampled and examined without interfering with the opera-
tion of the on-chip system logic.
The scan chain is arranged as follows:
TDI
B
OE S
5
S
4
S
3
S
2
S
1
S
0
LSPNTDO
B
Bypass Register
The bypass register is a 1-bit register that operates as
specified in IEEE Std. 1149.1 once the SCANPSC110F has
been selected. The register provides a minimum length
serial path for the movement of test data between TDI
B
and the LSPN. This path can be selected when no other
test data register needs to be accessed during a board-
level test operation. Use of the bypass register shortens
the serial access-path to test data registers located in other
components on a board-level test data path.
Multi-Cast Group Register
Multi-cast is a method of simultaneously communicating
with more than one selected SCANPSC110F.
The multi-cast group register (MCGR) is a 2-bit register
used to determine which multi-cast group a particular
SCANPSC110F is assigned to. Four addresses are
reserved for multi-cast addressing. When a
SCANPSC110F is in the Wait-For-Address state and
receives a multi-cast address, and if that SCANPSC110F's
MCGR contains a matching value for that multi-cast
address, the SCANPSC110F becomes selected and is
ready to receive Level 2 Protocol (i.e., further instructions).
The MCGR is initialized to 00 upon entering the Test-
Logic-Reset state.
The following actions are used to perform multi-cast
addressing:
1. Assign all target SCANPSC110Fs to a multi-cast group
by writing each individual target SCANPSC110F's
MCGR with the same multi-cast group code (see Table
6). This configuration step must be done by individually
addressing each target SCANPSC110F, using that
chip's assigned slot value.
2. Scan out the multi-cast group address through the
TDI
B
input of all SCANPSC110Fs. Note that this occurs
in parallel, resulting in the selection of only those
SCANPSC110Fs whose MCGR was previously pro-
grammed with the matching multi-cast group code.
TABLE 6. Multi-Cast Group Register Addressing
MCGR Hex Address Binary Address
Bits 1, 0
00 3C XX111100
01 3D XX111101
10 3E XX111110
11 3F XX111111
www.fairchildsemi.com 14
SCANPSC110F
Register Descriptions (Continued)
TABLE 7. Mode Register Control of LSPN
X = dont care
Register = SCANPSC110F instruction register or any of the SCANPSC110F test data registers
PAD = insertion of a 1-bit register for synchronization
Mode Register
The mode register is an 8-bit data register used primarily to
configure the Local Scan Port Network. The mode register
is initialized to 00000001 binary upon entering the Test-
Logic-Reset state.
Bits 0, 1, 2, and 4 are used for scan chain configuration as
described in Table 7. When the UNPARK instruction is exe-
cuted, the scan chain configuration will be as shown in
Table 7 above. When all LSPs are parked, the scan chain
configuration will be
TDI
B
SCANPSC110F registerTDO
B
. Bit 3 is used for
TCK
Ln
configuration, see Table 8.
TABLE 8. Test Clock Configuration
Bit 3 is normally set to logic 0 so that TCK
L
is free-running
when the local scan ports are parked. When the local ports
are parked, bit 3 can be programmed with logic 1, forcing
all of the LSP TCK
L
's to stop. This feature can be used in
power sensitive applications to reduce the power con-
sumed by the test circuitry in parts of the system that are
not under test. Bit 3 of the mode register must be reset
to logic “0” before the UNPARK instruction is exe-
cuted.
Bit 7 is a status bit for the TCK counter. When the counter
is on and has reached terminal count (Zero) Bit 7 of the
mode register will be high (logic 1). Bit 7 is read-only and
will be LOW in all other conditions.
Bits 5 and 6 are reserved for future use.
Device Identification Register
The device identification register (IDREG) is a 32-bit regis-
ter compliant with IEEE Std. 1149.1. When the IDCODE
instruction is active, the identification register is loaded with
the value 0FC0E01F Hex upon leaving the Capture-DR
state (on the rising edge of the TCK
B
).
TABLE 9. Detailed Device Identification (Binary)
Linear Feedback Shift Register
The SCANPSC110F contains a signature compactor
which supports test result evaluation in a multi-chain envi-
ronment. The signature compactor consists of a 16-bit lin-
ear-feedback shift register (LFSR) which can monitor local-
port scan data as it is shifted upstream from the
SCANPSC110F's local-port network. Once the LFSR is
enabled, the LFSR's state changes in a reproducible way
as each local-port data bit is shifted in from the local-port
network. When all local-port data has been scanned in, the
LFSR contains a 16-bit signature value which can be com-
pared against a signature computed for the expected
results vector.
The LFSR uses the following feedback polynomial:
F (x)
= X
16
+ X
12
+ X
3
+ X + 1
This signature compactor is used to compress serial data
shifted in from the local scan chain, into a 16-bit signature.
This signature can then be shifted out for comparison with
an expected value. This allows users to test long scan
chains in parallel, via Broadcast or Multi-Cast addressing
modes, and check only the 16-bit signatures from each
module.
The LFSR is initialized with a value of 0000 Hex upon
reset.
32-Bit TCK Counter Register:
The 32-bit TCK counter register enables BIST testing that
requires n TCK cycles, to be run on a parked LSP while
another SCANPSC110F port is being tested. The CNTR-
SEL instruction can be used to load a count-down value
into the counter register via the active scan chain. When
the counter is enabled (via the CNTRON instruction), and
the LSP is parked, the local TCKs will stop and be held
LOW when terminal count is reached.
The TCK counter is initialized with a value of 00000000
Hex upon reset.
Mode Register Scan Chain Configuration (If unparked)
XXX0X000 TDI
B
RegisterTDO
B
XXX0X001 TDI
B
RegisterLSP
1
PADTDO
B
XXX0X010 TDI
B
RegisterLSP
2
PADTDO
B
XXX0X011 TDI
B
RegisterLSP
1
PADLSP
2
PADTDO
B
XXX0X100 TDI
B
RegisterLSP
3
PADTDO
B
XXX0X101 TDI
B
RegisterLSP
1
PADLSP
3
PADTDO
B
XXX0X110 TDI
B
RegisterLSP
2
PADLSP
3
PADTDO
B
XXX0X111 TDI
B
RegisterLSP
1
PADLSP
2
PADLSP
3
PADTDO
B
XXX1XXXX TDI
B
RegisterTDO
B
(Loopback)
Bit 3 LSP
n
TCK
Ln
1 Parked Stop
0 Parked Run
1 Unparked Run
0 Unparked Run
Bits Bits Bits Bit
31–28 27–12 11–1 0
Version Part Number Manufacturer 1
Identity
0000 1111 1100 0000 1110 0000 0001 111 1
15 www.fairchildsemi.com
SCANPSC110F
Special Features
BIST SUPPORT
The sequence of instructions to run BIST testing on a
parked SCANPSC110F Bridge port is as follows:
1. Pre-load the Boundary register of the device under test
if needed.
2. Initialize the TCK counter to 00000000 Hex. Note that
the TCK counter is initialized to 00000000 Hex upon
Test-Logic-Reset, so this step may not be necessary.
3. Issue the CNTRON instruction to the SCANPSC110F,
to enable the TCK counter.
4. Shift the PARKRTI instruction into the SCANPSC110F
instruction register and BIST instruction into the
instruction register of the device under test.
5. Issue the CNTRSEL instruction to the SCANPSC110F.
6. Load the TCK counter (Shift the 32-bit value represent-
ing the number of TCK
L
cycles needed to execute the
BIST operation into the TCK counter register).
7. Bit 7 of the Mode register can be scanned to check the
status of the TCK counter, (MODESEL instruction fol-
lowed by a Shift-DR). Bit 7 logic 0 means the counter
has not reached terminal count, logic 1 means that
the counter has reached terminal count and the BIST
operation has completed.
8. Execute the CNTROFF instruction.
9. Unpark the LSP and scan out the result of the BIST
operation (the CNTROFF instruction must be executed
before unparking the LSP).
The Self test will begin on the rising edge of TCK
B
following
the Update-DRTAP controller state.
RESET
Reset operations can be performed at three levels. The
highest level resets all SCANPSC110F registers and all of
the local scan chains of selected and unselected
SCANPSC110Fs. This Level 1 reset is performed when-
ever the SCANPSC110F TAP Controller enters the Test-
Logic-Reset state. Test-Logic-Reset can be entered syn-
chronously by forcing TMS
B
high for at least five (5) TCK
B
pulses, or asynchronously by asserting the TRST pin. A
Level 1 reset forces all SCANPSC110Fs into the Wait-
For-Address state, parks all local scan chains in the Test-
Logic-Reset state, and initializes all SCANPSC110F regis-
ters.
TABLE 10. Reset Configurations for Registers
The SOFTRESET instruction is provided to perform a
Level 2 reset of all LSP's of selected SCANPSC110Fs.
SOFTRESET forces all TMS
L
signals HIGH, placing the
corresponding local TAP Controllers in the Test-Logic-
Reset state within five (5) TCK
B
cycles.
The third level of reset is the resetting of individual local
ports. An individual LSP can be reset by parking the port in
the Test-Logic-Reset state via the PARKTLR instruction. To
reset an individual LSP that is parked in one of the other
parked states, the LSP must first be unparked via the
UNPARK instruction.
PORT SYNCHRONIZATION
When a LSP is not being accessed, it is placed in one of
the four TAP Controller states: Test-Logic-Reset, Run-Test/
Idle, Pause-DR, or Pause-IR. The SCANPSC110F is able
to park a local chain by controlling the local Test Mode
Select outputs (TMS
L(13)
) (see Figure 4). TMS
Ln
is forced
high for parking in the Test-Logic-Reset state, and forced
LOW for parking in Run-Test/Idle, Pause-IR, or Pause-DR
states. Local chain access is achieved by issuing the
UNPARK instruction. The LSPs do not become unparked
until the SCANPSC110F TAP Controller is sequenced
through a specified synchronization state. Synchronization
occurs in the Run-Test/Idle state for LSPs parked in Test-
Logic-Reset or Run-Test/Idle; and in the Pause-DR or
Pause-IR state for ports parked in Pause-DR or Pause-IR,
respectively.
Figures 11, 12 show the waveforms for synchronization of
a local chain that was parked in the Test-Logic-Reset state.
Once the UNPARK instruction is received in the instruction
register, the LSPC forces TMS
L
LOW on the falling edge of
TCK
B
.
FIGURE 11. Local Scan Port Synchronization on Second Pass
Register Bit Width Initial Hex Value
MCGR 2 0
Instruction 8 AA (IDCODE Instruction)
Mode 8 01
LFSR 16 0000
32-Bit Counter 32 00000000

SCANPSC110FSC

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Description:
Specialty Function Logic SCAN JTAG Port
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